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2017 Third International Conference on Sensing, Signal Processing and Security (ICSSS) Sensing, Signal Processing and Security (ICSSS), 2017 Third International Conference on. :166-170 May, 2017
Academic Journal
Journal of Namibian Studies; 2023 Supplement, Vol. 33, p3667-3680, 14p
Academic Journal
Heier, J.S.Khanani, A.M.Quezada Ruiz, C.Brittain, C.Lin, H.Basu, K.Ferrone, P.J.Figueroa, M.S.Holz, F.G.Patel, V.Silverman, D.Lai, T.Y.Y.Regillo, C.Swaminathan, B.Viola, F.Cheung, C.M.G.Wong, T.Y.Abbey, A.Abdulaeva, E.Abraham, P.Adan Civera, A.Agostini, H.Alezzandrini, A.Alfaro, V.Almony, A.Altay, L.Amini, P.Antoszyk, A.Aradi, E.Arias, L.Arnold, J.Asaria, R.Astakhov, S.Astakhov, Y.Awh, C.C.Balaratnasingam, C.Banerjee, S.Baumal, C.Becker, M.Belfort, R.Bratko, G.Bridges, W.Z.Brown, J.Brown, D.M.Budzinskaya, M.Buffet, S.Burgess, S.Byon, I.Cagini, C.Calzada, J.Cameron, S.Campochiaro, P.Carlson, J.Carneiro, A.Chan, C.Chang, E.Chang, A.Chao, D.Chaudhry, N.Chee, C.Cheek, A.Chen, S.-J.Chen, S.-N.Cheung, G.Chexal, S.Chittum, M.Chow, D.Cole, A.Connolly, B.Cornut, P.L.Couvillion, S.Danzig, C.Daskalov, V.Dessouki, A.Devin, F.Dollin, M.Dolz, R.Downey, L.Dreyer, R.Dugel, P.Eichenbaum, D.Eldem, B.Engstrom, R.Escobar, J.J.Eter, N.Faber, D.W.Falk, N.Feiner, L.Fernandez Vega, A.Ferrone, P.Figueroa, M.Fine, H.Fineman, M.Fox, G.M.Francais, C.Franco, P.Fraser-Bell, S.Fung, N.Furno Sola, F.Gale, R.Garcia-Layana, A.Gasperini, J.Gawecki, M.Ghanchi, F.Gill, M.Giunta, M.Glaser, D.Goldstein, M.Gomez Ulla, F.Gomi, F.Gonzalez, V.Graff, J.Gupta, S.Guthoff, R.Guymer, R.Haas, A.Hampton, R.Hatz, K.Hayashi, K.Heier, J.Herba, E.Hershberger, V.Higgins, P.Holekamp, N.Honda, S.Howard, J.Hu, A.Huddleston, S.Iida, T.Imaizumi, H.Ito, Y.Ito, Y.Itty, S.Javey, G.Javid, C.Kaga, T.Kaluzny, J.Kang, S.W.Kapoor, K.Karabas, L.Kawasaki, T.Kelty, P.Kerenyi, A.Khanani, A.Khoramnia, R.Khurana, R.Kimura, K.Klein-Mascia, K.Kobayashi, N.Kodjikian, L.Koizumi, H.Kokame, G.Kulikov, A.Kwong, H.Kwun, R.Lai, T.Lai, C.-C.Lalonde, L.Lanzetta, P.Larsen, M.Lavina, A.Lee, W.K.Lee, J.E.Lee, S.Levy, J.Lindsell, L.Liu, M.London, N.Lotery, A.Lozano Rechy, D.Luckie, A.Maberley, D.Maeno, T.Mahmood, S.Makkouk, F.Marcus, D.Margherio, A.Masse, H.Matsubara, H.Maturi, R.Mehta, S.Menon, G.Mentes, J.Michels, M.Mitamura, Y.Mitchell, P.Mohamed, Q.Mones, J.Montemayor Lobo, R.Montero, J.Moore, J.Mori, R.Morori-Katz, H.Mukherjee, R.Murata, T.Muzyka-Wozniak, M.Nardi, M.Narendran, N.Nicolo, M.Nielsen, J.Nishimura, T.Noda, K.Nowinska, A.Oh, H.Ohr, M.Okada, A.Oleksy, P.Ono, S.Ozdek, S.Ozturk, B.Pablo, L.Park, K.H.Parke, D.W.Parravano, M.C.Patel, P.Patel, A.Patel, S.Patel, S.Pauleikhoff, D.Pearce, I.Pearlman, J.Petkova, I.Pieramici, D.Pozdeyeva, N.Qureshi, J.Raczynska, D.Ramirez Estudillo, J.Rathod, R.Razavi, H.Reilly, G.Ricci, F.Rich, R.Romanowska-Dixon, B.Rosenblatt, I.Ruiz Moreno, J.M.Sacu, S.Saedon, H.Saeed, U.Sagong, M.Sakamoto, T.Sandhu, S.Sararols, L.Saravia, M.Schadlu, R.Schlottmann, P.Sekiryu, T.Seres, A.Sermet, F.Shah, S.Shah, R.Shah, A.Sheidow, T.Sheth, V.Shiragami, C.Sikorski, B.Silva, R.Singerman, L.Sisk, R.Sørensen, T.L.Souied, E.Spinak, D.-J.Staurenghi, G.Steinmetz, R.Stoller, G.Stoltz, R.Suan, E.Suner, I.Suzanne, Y.Tadayoni, R.Takahashi, K.Takayama, K.Taleb, A.Talks, J.Terasaki, H.Thompson, J.Toth-Molnar, E.Tran, K.Tuli, R.Uchiyama, E.Vajas, A.Van Lith-Verhoeven, J.Varsanyi, B.Virgili, G.Vogt, G.Völker, M.Warrow, D.Weber, P.Wells, J.A.Wickremasinghe, S.Wieland, M.Williams, G.Williams, T.Wong, D.Wong, K.Wong, J.Wong, I.Wong, R.Wowra, B.Wykoff, C.C.Yamashita, A.Yasuda, K.Yilmaz, G.Yiu, G.Yoneda, A.Yoon, Y.H.Yoreh, B.Yu, H.Yu, S.Y.Yurieva, T.Zambrano, A.Zatorska, B.Zeolite, C.
In: The Lancet. (The Lancet, 19 February 2022, 399(10326):729-740)
Conference
In: IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024, IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024. (IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024, 2024)
Academic Journal
In: Applied Artificial Intelligence. (Applied Artificial Intelligence, 2022, 36(1))
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[AR] Swaminathan, B.
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