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Highly reliable high- k gate dielectrics with gradual Hf-profile in the HfO 2/SiO 2 interface region
Academic Journal
Iwamoto, Kunihiko; Mizubayashi, Wataru; Ogawa, Arito; Nabatame, Toshihide; Satake, Hideki; Toriumi, Akira
In Solid State Electronics 2006 50(6):999-1003
Academic Journal
In Surface Science 2005 588(1):108-116
Academic Journal
Mizubayashi, Wataru; Yasuda, Naoki; Okada, Kenji; Ota, Hiroyuki; Hisamatsu, Hirokazu; Iwamoto, Kunihiko; Tominaga, Koji; Yamamoto, Katsuhiko; Horikawa, Tsuyoshi; Nabatame, Toshihide; Satake, Hideki; Toriumi, Akira
In Microelectronics Reliability 2005 45(7):1041-1050
Conference
Liu, Yongxun; Nabatame, Toshihide; Matsukawa, Takashi; Endo, Kazuhiko; O'uchi, Sinichi; Tsukada, Junichi; Yamauchi, Hiromi; Ishikawa, Yuki; Mizubayashi, Wataru; Morita, Yukinori; Migita, Shinji; Ota, Hiroyuki; Chikyow, Toyohiro; Masahara, Meishoku
2014 IEEE International Nanoelectronics Conference (INEC) Nanoelectronics Conference (INEC), 2014 IEEE International. :1-4 Jul, 2014
Academic Journal
ECS Journal of Solid State Science & Technology; Aug2022, Vol. 11 Issue 8, p374-381, 8p
Academic Journal
Hiratani, Masahiko; Kadoshima, Masaru; Hirano, Tatsumi; Shimamoto, Yasuhiro; Matsui, Yuichi; Nabatame, Toshihide; Torii, Kazuyoshi; Kimura, Shinichiro
In Applied Surface Science 2003 207(1):13-19
Academic Journal
Kadoshima, Masaru ; Hiratani, Masahiko; Shimamoto, Yasuhiro; Torii, Kazuyoshi; Miki, Hiroshi; Kimura, Shinichiro; Nabatame, Toshihide
In Thin Solid Films 2003 424(2):224-228
Academic Journal
Uedono, Akira; Nabatame, Toshihide; Egger, Werner; Koschine, Tönjes; Hugenschmidt, Christoph; Dickmann, Marcel; Sumiya, Masatomo; Ishibashi, Shoji
Academic Journal
APL Materials; May2022, Vol. 10 Issue 5, p1-7, 7p
Academic Journal
In Thin Solid Films 2002 410(1):200-204
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[AR] Nabatame, Toshihide
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