e-Article
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searched 1,073results | List
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Academic Journal
Lu, W. J.; Qiu, Y. R.; Wu, Y. W.; Li, J.; Chen, R.; Chen, S. N.; Lin, Y. Y.; OuYang, L. Y.; Chen, J. Y.; Chen, F.; Qiu, S. D.
Report
Hashimoto, T.; Nam, T.; Muramatsu, N.; Ahn, J. K.; Chang, W. C.; Chen, J. Y.; Chu, M. L.; Date, S.; Gogami, T.; Goto, H.; Hamano, H.; He, Q. H.; Hicks, K.; Hiraiwa, T.; Honda, Y.; Hotta, T.; Ikuno, H.; Inoue, Y.; Ishikawa, T.; Jaegle, I.; Jo, J. M.; Kasamatsu, Y.; Katsuragawa, H.; Kido, S.; Kon, Y.; Matsumoto, S.; Matsumura, Y.; Miyabe, M.; Mizutani, K.; Nakamura, T.; Nakano, T.; Niiyama, M.; Nozawa, Y.; Ohashi, Y.; Ohnishi, H.; Ohta, T.; Ozawa, K.; Rangacharyulu, C.; Ryu, S. Y.; Sada, Y.; Shibukawa, T.; Shimizu, H.; Shirai, R.; Shiraishi, K.; Strokovsky, E. A.; Sugaya, Y.; Sumihama, M.; Suzuki, S.; Tanaka, S.; Taniguchi, Y.; Tokiyasu, A.; Tomida, N.; Tsuchikawa, Y.; Ueda, T.; Yamazaki, H.; Yamazaki, R.; Yanai, Y.; Yorita, T.; Yoshida, C.; Yosoi, M.
Academic Journal
Conference
Li, Jay; Tsai, Mike; Chiu, Ryan; He, Eric; Hsieh, Alex; Tsai, Ming-fan; Chu, Frank; Chen, J. Y.; Jian, Shunyu; Chen, Simon; Wang, Yu-Po
2020 IEEE 70th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2020 IEEE 70th. :931-937 Jun, 2020
Conference
Tsai, Mike; Chiu, Ryan; He, Eric; Chen, J. Y.; Chu, Frank; Tsai, Jensen; Wang, Yu-Po; Jian, Shunyu; Chen, Simon
2019 IEEE 21st Electronics Packaging Technology Conference (EPTC) Electronics Packaging Technology Conference (EPTC), 2019 IEEE 21st. :601-607 Dec, 2019
Conference
2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2019 14th International. :42-45 Oct, 2019
Conference
Tsai, Mike; Chiu, Ryan; He, Eric; Chen, J. Y.; Chu, Frank; Tsai, Jensen; Wang, Yu-Po; Jian, Shunyu; Chen, Simon
2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC) European Microelectronics and Packaging Conference & Exhibition (EMPC), 2019 22nd. :1-6 Sep, 2019
Report
Muramatsu, N.; Yosoi, M.; Yorita, T.; Ohashi, Y.; Ahn, J. K.; Ajimura, S.; Asano, Y.; Chang, W. C.; Chen, J. Y.; Date, S.; Gogami, T.; Hamano, H.; Hashimoto, T.; Hiraiwa, T.; Hotta, T.; Ishikawa, T.; Kasamatsu, Y.; Katsuragawa, H.; Kobayakawa, R.; Kohri, H.; Masumoto, S.; Matsumura, Y.; Miyabe, M.; Mizutani, K.; Morino, Y.; Nakano, T.; Nam, T.; Niiyama, M.; Nozawa, Y.; Ohkuma, H.; Ohnishi, H.; Ohta, T.; Oishi, M.; Ozawa, K.; Ryu, S. Y.; Sada, Y.; Saito, H.; Shibukawa, T.; Shimizu, H.; Shirai, R.; Shoji, M.; Sumihama, M.; Suzuki, S.; Tanaka, S.; Taniuchi, Y.; Tokiyasu, A. O.; Tomida, N.; Tsuchikawa, Y.; Watanabe, K.; Yoon, C. J.; Yoshida, C.
Academic Journal
Yang, F.; Chen, J. Y.; Hou, M. Z.; Cao, Y. F.; Zhang, Y.; Li, X. F.; Zhang, X. Q.; Hu, Y. C.; Shang, J.; Yin, S. Q.; Wang, X. W.
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[AR] Chen, J. Y.
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