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Proceedings EURO-DAC '96. European Design Automation Conference with EURO-VHDL '96 and Exhibition European design automation. EURO-VHDL Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European. :450-455 1996
Conference
Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on. :96-104 1996
Academic Journal
Albuquerque, E.; Bento, P.; Leong, C.; Goncalves, F.; Nobre, J.; Rego, J.; Relvas, P.; Lousa, P.; Rodrigues, P.; Teixeira, I.C.; Teixeira, J.P.; Silva, L.; Silva, M.M.; Trindade, A.; Varela, J.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 53(5):2704-2711 Oct, 2006
Academic Journal
Bento, P.; Goncalves, F.; Leong, C.; Lousa, P.; Nobre, J.; Rego, J.; Relvas, P.; Rodrigues, P.; Silva, J.C.; Silva, L.; Teixeira, I.C.; Teixeira, J.P.; Trindade, A.; Varela, J.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 53(4):2102-2111 Aug, 2006
Academic Journal
Leong, C.; Bento, P.; Lousa, P.; Joao Nobre; Rego, J.; Rodrigues, P.; Silva, J.C.; Teixeira, I.C.; Teixeira, J.P.; Trindade, A.; Varela, J.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 53(3):761-769 Jun, 2006
Academic Journal
Abreu, M.C.; Aguiar, J.D.; Almeida, F.G.; Almeida, P.; Bento, P.; Carrico, B.; Ferreira, M.; Ferreira, N.C.; Goncalves, F.; Leong, C.; Lopes, F.; Lousa, P.; Martins, M.V.; Matela, N.; Mendes, P.R.; Moura, R.; Nobre, J.; Oliveira, N.; Ortigao, C.; Peralta, L.; Pereira, R.; Rego, J.; Ribeiro, R.; Rodrigues, P.; Sampaio, J.; Santos, A.I.; Silva, L.; Silva, J.C.; Sousa, P.; Teixeira, I.C.; Teixeira, J.P.; Trindade, A.; Varela, J.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 53(1):71-77 Feb, 2006
Conference
Proceedings 13th IEEE VLSI Test Symposium VLSI test symposium VLSI Test Symposium, 1995. Proceedings., 13th IEEE. :330-335 1995
Conference
Proceedings the European Design and Test Conference. ED&TC 1995 European design and test conference European Design and Test Conference, 1995. ED&TC 1995, Proceedings.. :464-468 1995
Academic Journal
Alemany, R.; Almeida, C.B.; Almeida, N.; Bercher, M.; Benetta, R.; Bexiga, V.; Bourotte, J.; Busson, Ph.; Cardoso, N.; Cerrutti, M.; Dejardin, M.; Faure, J.-L.; Gachelin, O.; Gastal, M.; Geerebaert, Y.; Gilly, J.; Gras, Ph.; Hansen, M.; Husejko, M.; Jain, A.; Karar, A.; Kloukinas, K.; Ljuslin, C.; Machado, P.; Mandjavidze, I.; Mur, M.; Paganini, P.; Regnault, N.; Santos, M.; Da Silva, J.C.; Teixeira, I.; Teixeira, J.P.; Varela, J.; Verrecchia, P.; Zlatevski, L.
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 52(5):1918-1924 Oct, 2005
Academic Journal
Jakovljevic, M.; Reshetnikov, V.; Timofeyev, Y.; Ranabhat, C.L.; Fernandes, P.O.; Teixeira, J.P.; Rancic, N.
In: Globalization and Health . (Globalization and Health, 16 July 2020, 16(1))
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[AR] Teixeira, J.P.
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