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Adams, C. B.Aggarwal, N.Agrawal, A.Balafendiev, R.Bartram, C.Baryakhtar, M.Bekker, H.Belov, P.Berggren, K. K.Berlin, A.Boutan, C.Bowring, D.Budker, D.Caldwell, A.Carenza, P.Carosi, G.Cervantes, R.Chakrabarty, S. S.Chaudhuri, S.Chen, T. Y.Cheong, S.Chou, A.Co, R. T.Conrad, J.Croon, D.D'Agnolo, R. T.Demarteau, M.DePorzio, N.Descalle, M.Desch, K.Di Luzio, L.Diaz-Morcillo, A.Dona, K.Drachnev, I. S.Droster, A.Du, N.Dunne, K.Döbrich, B.Ellis, S. A. R.Essig, R.Fan, J.Foster, J. W.Fry, J. T.Rosso, A. GalloBarceló, J. M. GarcíaIrastorza, I. G.Gardner, S.Geraci, A. A.Ghosh, S.Giaccone, B.Giannotti, M.Gimeno, B.Grin, D.Grote, H.Guzzetti, M.Awida, M. H.Henning, R.Hoof, S.Hoshino, G.Irsic, V.Irwin, K. D.Jackson, H.Kimball, D. F. JacksonJaeckel, J.Jakovcic, K.Jewell, M. J.Kagan, M.Kahn, Y.Khatiwada, R.Knirck, S.Kovachy, T.Krueger, P.Kuenstner, S. E.Kurinsky, N. A.Leane, R. K.Leder, A. F.Lee, C.Lehnert, K. W.Lentz, E. W.Lewis, S. M.Liu, J.Lynn, M.Majorovits, B.Marsh, D. J. E.Maruyama, R. H.McAllister, B. T.Millar, A. J.Miller, D. W.Mitchell, J.Morampudi, S.Mueller, G.Nagaitsev, S.Nardi, E.Noroozian, O.O'Hare, C. A. J.Oblath, N. S.Ouellet, J. L.Pappas, K. M. W.Peiris, H. V.Perez, K.Phipps, A.Pivovaroff, M. J.Quílez, P.Rapidis, N. M.Robles, V. H.Rogers, K. K.Rudolph, J.Ruz, J.Rybka, G.Safdari, M.Safdi, B. R.Safronova, M. S.Salemi, C. P.Schuster, P.Schwartzman, A.Shu, J.Simanovskaia, M.Singh, J.Singh, S.Sinha, K.Sinnis, J. T.Siodlaczek, M.Smith, M. S.Snow, W. M.Sokolov, A. V.Sonnenschein, A.Speller, D. H.Stadnik, Y. V.Sun, C.Sushkov, A. O.Tait, T. M. P.Takhistov, V.Tanner, D. B.Tavecchio, F.Temples, D. J.Thomas, J. H.Tobar, M. E.Toro, N.Tsai, Y. -D.van Assendelft, E. C.van Bibber, K.Vandegar, M.Visinelli, L.Vitagliano, E.Vogel, J. K.Wang, Z.Wickenbrock, A.Winslow, L.Withington, S.Wooten, M.Yang, J.Young, B. A.Yu, F.Zhou, K.Zhou, T.
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IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(11):9119-9123 Nov, 2020
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Antypas, D.Banerjee, A.Bartram, C.Baryakhtar, M.Betz, J.Bollinger, J. J.Boutan, C.Bowring, D.Budker, D.Carney, D.Carosi, G.Chaudhuri, S.Cheong, S.Chou, A.Chowdhury, M. D.Co, R. T.López-Urrutia, J. R. CrespoDemarteau, M.DePorzio, N.Derbin, A. V.Deshpande, T.Di Luzio, L.Diaz-Morcillo, A.Doyle, J. M.Drlica-Wagner, A.Droster, A.Du, N.Döbrich, B.Eby, J.Essig, R.Farren, G. S.Figueroa, N. L.Fry, J. T.Gardner, S.Geraci, A. A.Ghalsasi, A.Ghosh, S.Giannotti, M.Gimeno, B.Griffin, S. M.Grin, D.Grote, H.Gundlach, J. H.Guzzetti, M.Hanneke, D.Harnik, R.Henning, R.Irsic, V.Jackson, H.Kimball, D. F. JacksonJaeckel, J.Kagan, M.Kedar, D.Khatiwada, R.Knirck, S.Kolkowitz, S.Kovachy, T.Kuenstner, S. E.Lasner, Z.Leder, A. F.Lehnert, R.Leibrandt, D. R.Lentz, E.Lewis, S. M.Liu, Z.Manley, J.Maruyama, R. H.Millar, A. J.Muratova, V. N.Musoke, N.Nagaitsev, S.Noroozian, O.O'Hare, C. A. J.Ouellet, J. L.Pappas, K. M. W.Peik, E.Perez, G.Phipps, A.Rapidis, N. M.Robinson, J. M.Robles, V. H.Rogers, K. K.Rudolph, J.Rybka, G.Safdari, M.Safronova, M. S.Salemi, C. P.Schmidt, P. O.Schumm, T.Schwartzman, A.Shu, J.Simanovskaia, M.Singh, J.Singh, S.Smith, M. S.Snow, W. M.Stadnik, Y. V.Sun, C.Sushkov, A. O.Tait, T. M. P.Takhistov, V.Tanner, D. B.Temples, D. J.Thirolf, P. G.Thomas, J. H.Tobar, M. E.Tretiak, O.Tsai, Y. -D.Tyson, J. A.Vandegar, M.Vermeulen, S.Visinelli, L.Vitagliano, E.Wang, Z.Wilson, D. J.Winslow, L.Withington, S.Wooten, M.Yang, J.Ye, J.Young, B. A.Yu, F.Zaheer, M. H.Zelevinsky, T.Zhao, Y.Zhou, K.
Academic Journal
IEEE Transactions on Neural Systems and Rehabilitation Engineering IEEE Trans. Neural Syst. Rehabil. Eng. Neural Systems and Rehabilitation Engineering, IEEE Transactions on. 31:4449-4458 2023
Academic Journal
IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 17(2):222-235 Apr, 2020
Academic Journal
IEEE Transactions on Knowledge and Data Engineering IEEE Trans. Knowl. Data Eng. Knowledge and Data Engineering, IEEE Transactions on. 31(11):2151-2163 Nov, 2019
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