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Academic Journal
In Automation in Construction 2004 13(5):679-687
Academic Journal
Alberts, R; de Vries, EMG; Goode, EC; Jiang, XJ; Sampaziotis, F; Rombouts, K; Bottcher, K; Folseraas, T; Weismuller, TJ; Mason, AL; Wang, WW; Alexander, G; Alvaro, D; Bergquist, A; Bjorkstrom, NK; Beuers, U; Bjornsson, E; Boberg, KM; Bowlus, CL; Bragazzi, MC; Carbone, M; Chazouilleres, O; Cheung, A; Dalekos, G; Eaton, J; Eksteen, B; Ellinghaus, D; Farkkila, M; Festen, EAM; Floreani, A; Franceschet, I; Gotthardt, DN; Hirschfield, GM; van Hoek, B; Holm, K; Hohenester, S; Hov, JR; Imhann, F; Invernizzi, P; Juran, BD; Lenzen, H; Lieb, W; Liu, JZ; Marschall, HU; Marzioni, M; Melum, E; Milkiewicz, P; Muller, T; Pares, A; Rupp, C; Rust, C; Sandford, RN; Schramm, C; Schreiber, S; Schrumpf, E; Silverberg, MS; Srivastava, B; Sterneck, M; Teufel, A; Vallier, L; Verheij, J; Vila, AV; de Vries, B; Zachou, K; Chapman, RW; Manns, MP; Pinzani, M; Rushbrook, SM; Lazaridis, KN; Franke, A; Anderson, CA; Karlsen, TH; Ponsioen, CY; Weersma, RK
Gut. 67(8):1517-1524
Academic Journal
In Materials Science & Engineering B 2003 105(1):132-140
Academic Journal
In Materials Science & Engineering B 2003 105(1):106-110
Academic Journal
Louter, MA; Fernandez-Morales, J; de Vries, B; Winsvold, B; Anttila, V; Fernandez-Cadenas, I; Vila-Pueyo, M; Sintas, C; van Duijn, CM; Cormand, B; Álvarez-Sabin, J; Montaner, J; Ferrari, MD; van den Maagdenberg, AMJM; Palotie, A; Zwart, JA; Macaya, A; Terwindt, GM; Pozo-Rosich, P
Electronic Resource
Bonali, F; Russo, E; Vitello, F; Antoniou, V; Marchese, F; Fallati, L; Bracchi, V; Corti, N; Savini, A; Whitworth, M; Drymoni, K; Mariotto, F; Nomikou, P; Sciacca, E; Bressan, S; Falsaperla, S; Reitano, D; de Vries, B; Krokos, M; Panieri, G; Stiller-Reeve, M; Vizzari, G; Becciani, U; Tibaldi, A; Bonali F. L.; Russo E.; Vitello F.; Antoniou V.; Marchese F.; Fallati L.; Bracchi V.; Corti N.; Savini A.; Whitworth M.; Drymoni K.; Mariotto F. P.; Nomikou P.; Sciacca E.; Bressan S.; Falsaperla S.; Reitano D.; de Vries B. W.; Krokos M.; Panieri G.; Stiller-Reeve M. A.; Vizzari G.; Becciani U.; Tibaldi A.
Electronic Resource
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