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Academic Journal
Leblanc, A.; Tangchingchai, C.; Kiyooka, E.; Scherübl, Z.; Brun, B.; Schmitt, V.; Zihlmann, S.; Maurand, R.; Dumur, É.; De Franceschi, S.; Lefloch, F.; Momtaz, Z.S.; Hartmann, J.-M.; Fernandez-Bada, G.T.
In: Physical Review Research . (Physical Review Research, July 2024, 6(3))
Report
Phys. Rev. B 107, L041303 (2023)
Report
Piot, N.; Brun, B.; Schmitt, V.; Zihlmann, S.; Michal, V. P.; Apra, A.; Abadillo-Uriel, J. C.; Jehl, X.; Bertrand, B.; Niebojewski, H.; Hutin, L.; Vinet, M.; Urdampilleta, M.; Meunier, T.; Niquet, Y. -M.; Maurand, R.; De Franceschi, S.
Nature Nanotechnology 17, 1072-1077 (2022)
Academic Journal
Yu, C.X.; Zihlmann, S.; Dumur, É.; De Franceschi, S.; Maurand, R.; Abadillo-Uriel, J.C.; Michal, V.P.; Filippone, M.; Niquet, Y.-M.; Rambal, N.; Niebojewski, H.; Bedecarrats, T.; Vinet, M.; Bertrand, B.
In: Nature Nanotechnology . (Nature Nanotechnology, July 2023, 18(7):741-746)
Conference
Apra, A.; Ezzouch, R.; Bertrand, B.; Rambal, N.; Catapano, E.; Niebojcwski, H.; Bedecarrats, T.; Hutin, L.; Chanrion, E.; Urdampilleta, M.; Mizokuchi, R.; Bassi, M.; Piot, N.; Vincent, E.; Brun-Barrierc, B.; Zihlmann, S.; Schmitt, V.; Dumur, E.; Jehl, X.; Maurand, R.; Vinet, M.; Meunier, T.; De Franceschi, S.
2021 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2021. :1-2 Jun, 2021
Academic Journal
In: Physical Review B . (Physical Review B, 15 January 2023, 107(4))
Conference
Niquet, Y. M.; Hutin, L.; Diaz, B. Martinez; Venitucci, B.; Li, J.; Michal, V.; Fernandez-Bada, G. Troncoso; Jacquinot, H.; Amisse, A.; Apra, A.; Ezzouch, R.; Piot, N.; Vincent, E.; Yu, C.; Zihlmann, S.; Brun-Barriere, B.; Schmitt, V.; Dumur, E.; Maurand, R.; Jehl, X.; Sanquer, M.; Bertrand, B.; Rambal, N.; Niebojewski, H.; Bedecarrats, T.; Casse, M.; Catapano, E.; Mortemousque, P. A.; Thomas, C.; Thonnart, Y.; Billiot, G.; Morel, A.; Charbonnier, J.; Pallegoix, L.; Niegemann, D.; Klemt, B.; Urdampilleta, M.; El Homsy, V.; Nurizzo, M.; Chanrion, E.; Jadot, B.; Spence, C.; Thiney, V.; Paz, B.; de Franceschi, S.; Vinet, M.; Meunier, T.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :30.1.1-30.1.4 Dec, 2020
Academic Journal
In: Journal of Radiological Protection . (Journal of Radiological Protection, June 2022, 42(2))
Report
Phys. Rev. Applied 10, 044053 (2018)
Report
Phys. Rev. Applied 7, 054015 (2017)
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[AR] Zihlmann, S.
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