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Johnson, R.A.; Zierak, M.J.; Outama, K.B.; Bahn, T.C.; Joseph, A.J.; Cordero, C.N.; Malinowski, J.; Bard, K.A.; Weeks, T.W.; Milliken, R.A.; Medve, T.J.; May, G.A.; Chong, W.; Walter, K.M.; Tempest, S.L.; Chau, B.B.; Boenke, M.; Nelson, M.W.; Harame, D.L.
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :217-220 1998
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Dunn, J.S.; Ahlgren, D.C.; Coolbaugh, D.D.; Feilchenfeld, N.B.; Freeman, G.; Greenberg, D.R.; Groves, R. A.; Guarin, F.J.; Hammad, Y.; Joseph, A.J.; Lanzerotti, L. D.; St. Onge, S.A.; Orner, B.A.; Rieh, J.-S.; Stein, K.J.; Voldman, S.H.; Wang, P.-C.; Zierak, M.J.; Subbanna, D.L.; Harame, D.L.; Herman, D.A., Jr.; Meyerson, B.S.
IBM Journal of Research and Development. March-May, 2003, p101, 38 p.
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[AR] Zierak, M.J.
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