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Marcuzzi, A.; Avramenko, M.; De Santi, C.; Geenen, F.; Moens, P.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
In Materials Science in Semiconductor Processing July 2024 177
Academic Journal
Medjdoub, F.; Shinohara, K.; Thome, F.; Moon, J.; Chumbes, E.; Guidry, M.T.; Mishra, U.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Pomeroy, J.W.; Thingujam, T.; Kuball, M.
IEEE Microwave Magazine IEEE Microwave Microwave Magazine, IEEE. 25(10):18-37 Oct, 2024
Academic Journal
In Microelectronics Reliability November 2023 150
Academic Journal
Caria, A.; Fraccaroli, R.; Pierobon, G.; Castellaro, T.; Mura, G.; Ricci, P.C.; De Santi, C.; Buffolo, M.; Trivellin, N.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
In Microelectronics Reliability November 2023 150
Academic Journal
In Microelectronics Reliability November 2023 150
Academic Journal
Pilati, M.; Buffolo, M.; Rampazzo, F.; Lambert, B.; Sommer, D.; Grünenpütt, J.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
In Microelectronics Reliability November 2023 150
Academic Journal
In Microelectronics Reliability November 2023 150
Academic Journal
Favero, D.; De Santi, C.; Stockman, A.; Nardo, A.; Vanmeerbeek, P.; Tack, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
In Microelectronics Reliability November 2023 150
Academic Journal
Graff, A.; Simon-Najasek, M.; Hübner, S.; Lejoyeux, M.; Altmann, F.; Gao, V. Zhan; Rampazzo, F.; Meneghini, M.; Zanoni, E.; Lambert, B.
In Microelectronics Reliability November 2023 150
Academic Journal
Roccato, N.; Piva, F.; Buffolo, M.; Trivellin, N.; De Santi, C.; Narduzzi, C.; Fraccaroli, R.; Caria, A.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3753-3760 Jun, 2024
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[AR] Zanoni, E.
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