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Hughes, M.J.; Kelbaugh, M.T.; Reilly, E.P.; Campbell, V.J.; Agarwala, S.; Wilt, M.L.; Badger, A.R.; Ponzo, D.; Fuller, E.; Arevalo, X.C.; Fiallos, A.; Fiume, D.; Fozo, L.; Jones, J.; Kashyap, P.
In: Johns Hopkins APL Technical Digest (Applied Physics Laboratory) . (Johns Hopkins APL Technical Digest (Applied Physics Laboratory), 2021, 35(4):461-465)
Academic Journal
In: Johns Hopkins APL Technical Digest (Applied Physics Laboratory) . (Johns Hopkins APL Technical Digest (Applied Physics Laboratory), 2020, 35(3):179-184)
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In: Proceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020 , Proceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020. (Proceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020, 15 December 2020)
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[AR] Wilt, M.L.
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