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Conference
Vinet, M.; Bedecarrats, T.; Paz, B. Cardoso; Martinez, B.; Chanrion, E.; Catapano, E.; Contamin, L.; Pallegoix, L.; Venitucci, B.; Mazzocchi, V.; Niebojewski, H.; Bertrand, B.; Rambal, N.; Thomas, C.; Charbonnier, J.; Mortemousque, P.-A.; Hartmann, J.-M.; Nowak, E.; Thonnart, Y.; Billiot, G.; Casse, M.; Urdampilleta, M.; Niquet, Y.-M.; Perruchot, F.; De Franceschi, S.; Meunier, T.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :14.2.1-14.2.4 Dec, 2021
Academic Journal
Ansaloni, F.; Bohuslavskyi, H.; Fedele, F.; Rasmussen, T.; Brovang, B.; Berritta, F.; Heskes, A.; Chatterjee, A.; Kuemmeth, F.; Li, J.; Venitucci, B.; Niquet, Y.-M.; Hutin, L.; Bertrand, B.; Vinet, M.
In: New Journal of Physics . (New Journal of Physics, 1 March 2023, 25(3))
Report
Vinet, M.; Hutin, L.; Bertrand, B.; Barraud, S.; Hartmann, J. -M.; Kim, Y. -J.; Mazzocchi, V.; Amisse, A.; Bohuslavskyi, H.; Bourdet, L.; Crippa, A.; Jehl, X.; Maurand, R.; Niquet, Y. -M.; Sanquer, M.; Venitucci, B.; Jadot, B.; Chanrion, E.; Mortemousque, P. -A.; Spence, C.; Urdampilleta, M.; De Franceschi, S.; Meunier, T.
2018 IEEE International Electron Devices Meeting (IEDM)
Conference
Niquet, Y. M.; Hutin, L.; Diaz, B. Martinez; Venitucci, B.; Li, J.; Michal, V.; Fernandez-Bada, G. Troncoso; Jacquinot, H.; Amisse, A.; Apra, A.; Ezzouch, R.; Piot, N.; Vincent, E.; Yu, C.; Zihlmann, S.; Brun-Barriere, B.; Schmitt, V.; Dumur, E.; Maurand, R.; Jehl, X.; Sanquer, M.; Bertrand, B.; Rambal, N.; Niebojewski, H.; Bedecarrats, T.; Casse, M.; Catapano, E.; Mortemousque, P. A.; Thomas, C.; Thonnart, Y.; Billiot, G.; Morel, A.; Charbonnier, J.; Pallegoix, L.; Niegemann, D.; Klemt, B.; Urdampilleta, M.; El Homsy, V.; Nurizzo, M.; Chanrion, E.; Jadot, B.; Spence, C.; Thiney, V.; Paz, B.; de Franceschi, S.; Vinet, M.; Meunier, T.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :30.1.1-30.1.4 Dec, 2020
Conference
Meunier, T.; Urdampilleta, M.; Niegemann, D.; Jadot, B.; Charion, E.; Mortemousque, P.-A.; Spence, C.; Bertrand, B.; Billiot, G.; Casse, M.; Hutin, L.; Jacquinot, H.; Pillonet, G.; Rambal, N.; Thonnart, Y.; Amisse, A.; Apra, A.; Bourdet, L.; Crippa, A.; Ezzouch, R.; Jehl, X.; Maurand, R.; Niquet, Y.-M.; Sanquer, M.; Venitucci, B.; De Franceschi, S.; Vinet, M.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :31.6.1-31.6.4 Dec, 2019
Conference
Meunier, T.; Hutin, L.; Bertrand, B.; Thonnart, Y.; Pillonnet, G.; Billiot, G.; Jacquinot, H.; Casse, M.; Barraud, S.; Kim, Y.-J.; Mazzocchi, V.; Amisse, A.; Bohuslavskyi, H.; Bourdet, L.; Crippa, A.; Jehl, X.; Maurand, R.; Niquet, Y.-M.; Sanquer, M.; Venitucci, B.; Jadot, B.; Chanrion, E.; Mortemousque, P.-A.; Spence, C.; Urdampilleta, M.; De Franceschi, S.; Vinet, M.
2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T30-T31 Jun, 2019
Conference
Vinet, M.; Hutin, L.; Bertrand, B.; Barraud, S.; Hartmann, J.-M.; Kim, Y.-J.; Mazzocchi, V.; Amisse, A.; Bohuslavskyi, H.; Bourdet, L.; Crippa, A.; Jehl, X.; Maurand, R.; Niquet, Y.-M.; Sanquer, M.; Venitucci, B.; Jadot, B.; Chanrion, E.; Mortemousque, P.-A.; Spence, C.; Urdampilleta, M.; De Franceschi, S.; Meunier, T.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :6.5.1-6.5.4 Dec, 2018
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Novel Patterning Technologies 2024. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12956)
Academic Journal
In: Physical Review B . (Physical Review B, 19 January 2021, 103(4))
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