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Paliwoda, P.; Toledano-Luque, M.; Nigam, T.; Guarin, F.; Nour, M.; Cimino, S.; Pantisano, L.; Gupta, A.; Gonzalez, O. H.; Hauser, M.; Liu, W.; Vayshenker, A.; Ioannou, D.; Lee, D.; Jiang, L.; Yee, P.; Rauch, S.; Min, B.
2020 IEEE 29th North Atlantic Test Workshop (NATW) North Atlantic Test Workshop (NATW), 2020 IEEE 29th. :1-7 Jun, 2020
Academic Journal
In Microelectronics Reliability 2003 43(8):1175-1184
Impact of charge trapping on the voltage acceleration of TDDB in metal gate/high-k n-channel MOSFETs
Conference
2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :369-372 May, 2010
Conference
Steegen, A.; Mo, R.; Mann, R.; Sun, M.-C.; Eller, M.; Leake, G.; Vietzke, D.; Tilke, A.; Guarin, F.; Fischer, A.; Pompl, T.; Massey, G.; Vayshenker, A.; Tan, W.L.; Ebert, A.; Lin, W.; Gao, W.; Lian, J.; Kim, J.-P.; Wrschka, P.; Yang, J.-H.; Ajmera, A.; Knoefler, R.; Teh, Y.-W.; Jamin, F.; Park, J.E.; Hooper, K.; Griffin, C.; Nguyen, P.; Klee, V.; Ku, V.; Baiocco, C.; Johnson, G.; Tai, L.; Benedict, J.; Scheer, S.; Zhuang, H.; Ramanchandran, V.; Matusiewicz, G.; Lin, Y.-H.; Siew, Y.K.; Zhang, F.; Leong, L.S.; Liew, S.L.; park, K.C; Lee, K.-W.; Hong, D.H.; Choi, S.-M.; Kaltalioglu, E.; Kim, S.O.; Naujok, M.; Sherony, M.; Cowley, A.; Thomas, A.; Sudijohno, J.; Schiml, T.; Ku, J.-H.; Yang, I.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :64-67 2005
Conference
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :396-399 2005
Conference
Luo, Z.; Steegen, A.; Eller, M.; Mann, R.; Baiocco, C.; Nguyen, P.; Kim, L.; Hoinkis, M.; Ku, V.; Klee, V.; Jamin, F.; Wrschka, P.; Shafer, P.; Lin, W.; Fang, S.; Ajmera, A.; Tan, W.; Park, D.; Mo, R.; Lian, J.; Vietzke, D.; Coppock, C.; Vayshenker, A.; Hook, T.; Chan, V.; Kim, K.; Cowley, A.; Kim, S.; Kaltalioglu, E.; Zhang, B.; Marokkey, S.; Lin, Y.; Lee, K.; Zhu, H.; Weybright, M.; Rengarajan, R.; Ku, J.; Schiml, T.; Sudijono, J.; Yang, I.; Wann, C.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :661-664 2004
Conference
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :402-405 2003
Conference
Khare, M.; Ku, S.H.; Donaton, R.A.; Greco, S.; Brodsky, C.; Chen, X.; Chou, A.; DellaGuardia, R.; Deshpande, S.; Doris, B.; Fung, S.K.H.; Gabor, A.; Gribelyuk, M.; Holmes, S.; Jamin, F.F.; Lai, W.L.; Lee, W.H.; Li, Y.; McFarland, P.; Mo, R.; Mittl, S.; Narasimha, S.; Nielsen, D.; Purtell, R.; Rausch, W.; Sankaran, S.; Snare, J.; Tsou, L.; Vayshenker, A.; Wagner, T.; Wehella-Gamage, D.; Wu, E.; Wu, S.; Yan, W.; Barth, E.; Ferguson, R.; Gilbert, P.; Schepis, D.; Sekiguchi, A.; Goldblatt, R.; Welser, J.; Muller, K.P.; Agnello, P.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :407-410 2002
Conference
Wu, E.Y.; Aitken, J.; Nowak, E.; Vayshenker, A.; Varekamp, P.; Hueckel, G.; McKenna, J.; Harmon, D.; Han, L.-K.; Montrose, C.; Dufresne, R.
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :541-544 2000
Conference
Ahlgren, D.C.; Hueckel, G.; Freeman, G.; Walter, K.; Groves, R.; Ting, T.H.; Vayshenker, A.; Hostetter, E.
28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :452-455 1998
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[AR] Vayshenker, A.
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