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Academic Journal
Oguri, K.; Arai, Y.; Watanabe, S.; Hagura, N.; Matsuura, H.; Yamaguchi, A.; Okumura, M.; Tsunashima, Y.; Aoki, K.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms . (Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, November 2024, 556)
Academic Journal
Doyama, K.; KeikoYamaji; Tamura, K.; Jiang, Q.; Yasutaka, T.; Toshikatsu haruma; Ichihara, Y.; Tsunashima, Y.; Fukuyama, K.
In: Journal of Environmental Management . (Journal of Environmental Management, June 2024, 362)
Academic Journal
Ohmori, H.; Mizutani, M.; Kaneeda, T.; Abe, N.; Okada, Y.; Moriyama, S.; Hisamori, N.; Nishimura, N.; Tsunashima, Y.; Tanaka, J.; Kuramoto, K.; Ezura, A.
In CIRP Annals - Manufacturing Technology 2013 62(1):579-582
Academic Journal
Aoki, Y.; Higemoto, W.; Tsunashima, Y.; Yonezawa, Y.; Satoh, K.H.; Koda, A.; Ito, T.U.; Ohishi, K.; Heffner, R.H.; Kikuchi, D.; Sato, H.
In Physica B: Physics of Condensed Matter 2009 404(5):757-760
Conference
Okano, K.; Izumida, T.; Kawasaki, H.; Kaneko, A.; Yagishita, A.; Kanemura, T.; Kondo, M.; Ito, S.; Aoki, N.; Miyano, K.; Ono, T.; Yahashi, K.; Iwade, K.; Kubota, T.; Matsushita, T.; Mizushima, I.; Inaba, S.; Ishimaru, K.; Suguro, K.; Eguchi, K.; Tsunashima, Y.; Ishiuchi, H.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :721-724 2005
Conference
Kaneko, A.; Yagishita, A.; Yahashi, K.; Kubota, T.; Omura, M.; Matsuo, K.; Mizushima, I.; Okano, K.; Kawasaki, H.; Inaba, S.; Izumida, T.; Kanemura, T.; Aoki, N.; Ishimaru, K.; Ishiuchi, H.; Suguro, K.; Eguchi, K.; Tsunashima, Y.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :844-847 2005
Conference
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :13-17 2004
Conference
Takayanagi, M.; Watanabe, T.; Iijima, R.; Kaneko, A.; Inumiya, S.; Hirano, I.; Sekine, K.; Nishiyama, A.; Eguchi, K.; Tsunashima, Y.
Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765) Gate insulator Gate Insulator, 2003. IWGI 2003. Extended Abstracts of International Workshop on. :128-132 2003
Conference
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :237-240 2002
Conference
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :445-448 2002
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[AR] Tsunashima, Y.
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