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Giménez-Pérez, M.; Hernández, S.; Padullés, A.; Boix-Palop, L.; Calbo, E.; Grau, S.; Badia, J.M.; Ferrer, R.; Limón, E.; Pujol, M.; Horcajada, J.P.; Blanco, N.V.; Vidal, R.P.; Fernández, F.J.V.-M.; de Gracia García Ramírez, M.; Castro, I.J.; Serra, N.J.; Satorra, R.M.M.; Martorell, S.O.; Huerta, E.S.; Carrascosa, M.; Soriano, L.I.; Smithson, A.; Miserachs, N.; Blancas, D.; Alonso-Tarrés, C.; Ayuso, E.F.; González, M.P.; de Ciriza Villacampa, C.P.; Fernández, M.D.G.; Martins, M.À.; del Río Pérez, O.; Riera, E.S.; Bertomeu, M.P.; Flores, A.G.; González, L.L.; Pujol, E.C.I.; Matias, G.V.; Adell, C.M.; Marcual, J.L.; Sibat, A.M.; Flotats, E.; Roldan, F.R.; Martinez, L.G.; de Gamarra Martínez, E.F.; Solchaga, V.P.; Luque, M.F.S.; Barque, M.P.B.; Nicolas, E.M.; Fidalgo, A.M.; Bertran, N.T.; Gomila-Grange, A.; Blasi, O.G.; Badia, E.D.; Santamaria, M.A.; Pérez-Moreno, M.O.; Pallares, N.B.; González, L.M.; Fernández, M.M.; Padilla, E.; Zorrilla, S.G.; Enguidanos, M.R.L.; Jofre, C.S.; Arango, M.V.; Pascua, P.M.; Chippiraz, E.L.; Sureda, T.F.; González, M.B.; Saballs, M.; Taha, M.S.A.-D.; Guitart, S.S.; Larrainzar-Coghen, T.; Toboso, S.H.; Rodriguez, I.S.; Fraile, M.J.; Torras, S.G.; Guitard-Quer, A.; Castellana-Perelló, D.; Sáenz, A.J.; Ramírez-Hidalgo, M.; Pardo, G.G.; Garriga, I.G.; Palau, D.B.; Moral, A.; Vilamala, A.; Montal, C.V.; Navarro, M.; Valls, M.X.; Anaya, G.C.; Ochoa, I.S.; Matellanes, J.M.; Trevisanello, L.; Segarra, G.G.; Prieto, N.R.; Azcona, A.F.L.; Iftimie, S.M.; Jaime, L.C.; Margall, N.Q.; Laporte, J.; González, C.G.; Sanmartí, M.; Diaz-Brito, V.; Belda, A.S.; Sanz, M.M.
In: International Journal of Antimicrobial Agents . (International Journal of Antimicrobial Agents, August 2024, 64(2))
Academic Journal
Meneghini, M.; Podda, S.; Morelli, A.; Pintus, R.; Trevisanello, L.; Meneghesso, G.; Vanzi, M.; Zanoni, E.
In Microelectronics Reliability 2006 46(9):1720-1724
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 8(2):304-311 Jun, 2008
Conference
2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :98-103 Apr, 2009
Academic Journal
Meneghini, M.; Trivellin, N.; Meneghesso, G.; Trevisanello, L.; Zanoni, E.; Orita, K.; Yuri, M.; Ueda, D.
In: Physica Status Solidi (C) Current Topics in Solid State Physics . (Physica Status Solidi (C) Current Topics in Solid State Physics, July 2009, 6(SUPPL. 2):S844-S847)
Conference
Meneghini, M.; Trivellin, N.; Trevisanello, L.; Lunev, A.; Jinwei Yang; Bilenko, Y.; Wenhong Sun; Shatalov, M.; Gaska, R.; Zanoni, E.; Meneghesso, G.
2008 IEEE International Reliability Physics Symposium; 2008, p441-445, 5p
Conference
2008 IEEE International Reliability Physics Symposium; 2008, p424-428, 5p
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, August 2007, 47 9-11 SPEC. ISS.:1625-1629)
Academic Journal
Meneghini, M.; Trevisanello, L.; Meneghesso, G.; Zanoni, E.; Rossi, F.; Pavesi, M.; Zehnder, U.; Strauss, U.
In: Superlattices and Microstructures . (Superlattices and Microstructures, October 2006, 40 4-6 SPEC. ISS.:405-411)
Academic Journal
Physica Status Solidi (C); May2008, Vol. 5 Issue 6, p2250-2253, 4p
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[AR] Trevisanello, L.
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