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Conference
Kirihata, T.; Mueller, G.; Clinton, M.; Loeffler, S.; Ji, B.; Terletzki, H.; Hanson, D.; Chorng-Lil Hwang; Lehmann, G.; Storaska, D.; Daniel, G.; Hsu, L.; Weinfurtner, O.; Boehler, T.; Schnell, J.; Frankowsky, G.; Netis, D.; Ross, J.; Reith, A.; Kiehl, O.; Wordeman, M.
2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) Solid-state circuits conference Solid-State Circuits Conference, 2001. Digest of Technical Papers. ISSCC. 2001 IEEE International. :382-383 2001
Academic Journal
Hoenigschmid, H.; Frey, A.; DeBrosse, J.K.; Kirihata, T.; Mueller, G.; Storaska, D.W.; Daniel, G.; Frankowsky, G.; Guay, K.P.; Hanson, D.R.; Hsu, L.L.-C.; Ji, B.; Netis, D.G.; Panaroni, S.; Radens, C.; Reith, A.M.; Terletzki, H.; Weinfurtner, O.; Alsmeier, J.; Weber, W.; Wordeman, M.R.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 35(5):713-718 May, 2000
Academic Journal
Kirihata, T.; Mueller, G.; Ji, B.; Frankowsky, G.; Ross, J.M.; Terletzki, H.; Netis, D.G.; Weinfurtner, O.; Hanson, D.R.; Daniel, G.; Hsu, L.L.-C.; Sotraska, D.W.; Reith, A.M.; Hug, M.A.; Guay, K.P.; Selz, M.; Poechmueller, P.; Hoenigschmid, H.; Wordeman, M.R.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 34(11):1580-1588 Nov, 1999
Conference
Kirihata, T.; Gall, M.; Hosokawa, K.; Dortu, J.-M.; Wong, H.; Pfefferl, K.-P.; Ji, B.; Weinfurtner, O.; DeBrosse, J.; Terletzki, H.; Selz, M.; Ellis, W.; Wordeman, M.; Kiehl, O.
1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156) Solid-state circuits Solid-State Circuits Conference, 1998. Digest of Technical Papers. 1998 IEEE International. :78-79 1998
Academic Journal
Kirihata, T.; Gall, M.; Hosokawa, K.; Dortu, J.-M.; Hing Wong; Pfefferi, P.; Ji, B.L.; Weinfurtner, O.; DeBrosse, J.K.; Terletzki, H.; Selz, M.; Ellis, W.; Wordeman, M.R.; Kiehl, O.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 33(11):1711-1719 Nov, 1998
Conference
2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) Integrated reliability workshop Integrated Reliability Workshop Final Report, 2000 IEEE International. :153-154 2000
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 40(11):2081-2083 Nov, 1993
Conference
Hoenigschmid, H.; Frey, A.; DeBrosse, J.; Kirihata, T.; Mueller, G.; Daniel, G.; Frankowsky, G.; Guay, K.; Hanson, D.; Hsu, L.; Ji, B.; Netis, D.; Panaroni, S.; Radens, C.; Reith, A.; Storaska, D.; Terletzki, H.; Weinfurtner, O.; Alsmeier, J.; Weber, W.; Wordeman, M.
1999 Symposium on VLSI Circuits. Digest of Papers (IEEE Cat. No.99CH36326) VLSI circuits VLSI Circuits, 1999. Digest of Technical Papers. 1999 Symposium on. :125-126 1999
Conference
Proceedings of the 1989 International Conference on Microelectronic Test Structures Microelectronic Test Structures, 1989. ICMTS 1989. Proceedings of the 1989 International Conference on. :255-260 1989
Academic Journal
Kirihata, T.; Ji, B.; Ross, J.M.; Netis, D.G.; Hanson, D.R.; Hsu, L.L.-C.; Storaska, D.W.; Guay, K.P.; Wordeman, M.R.; Mueller, G.; Frankowsky, G.; Terletzki, H.; Weinfurtner, O.; Daniel, G.; Reith, A.M.; Hug, M.A.; Selz, M.; Poechmueller, P.; Hoenigschmid, H.
In: IEEE Journal of Solid-State Circuits . (IEEE Journal of Solid-State Circuits, November 1999, 34(11):1580-1588)
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[AR] Terletzki, H.
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