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LaBauve, A.E.; Techel, J.; Sasaki, D.; Saada, E.A.; Jones, I.K.A.; Mosesso, R.; Schoeniger, J.S.; Negrete, O.A.; Noureddine, A.; Brinker, C.J.; Gomez, A.; Sherman, M.B.; Serda, R.E.; Butler, K.S.; Collette, N.
In: Scientific Reports . (Scientific Reports, December 2023, 13(1))
Conference
In: European Wireless Conference, EW 2022 , European Wireless Conference, EW 2022. (European Wireless Conference, EW 2022, 2022, :1-6)
Conference
In: 2019 16th IEEE Annual Consumer Communications and Networking Conference, CCNC 2019 , 2019 16th IEEE Annual Consumer Communications and Networking Conference, CCNC 2019. (2019 16th IEEE Annual Consumer Communications and Networking Conference, CCNC 2019, 25 February 2019)
Conference
Wood, O.; Okoroanyanwu, U.; Koay, C.-S.; Petrillo, K.; Raghunathan, S.; Arnold, J.; Horak, D.; Mcintyre, G.; Standaert, T.; Waskiewicz, C.; Chen, J.H.-C.; Colburn, M.; Haran, B.; Fan, S.S.-C.; Yin, Y.; Mizuno, H.; Kawasaki, H.; Burkhardt, M.; Burns, S.; Deng, Y.; La Fontaine, B.; Wallow, T.; Landie, G.; Holfeld, C.; Techel, J.; Peters, J.-H.; Bouten, S.; Lee, B.; Pierson, B.; Kessels, B.; Routh, R.; Cummings, K.
In: Proceedings of SPIE - The International Society for Optical Engineering , Extreme Ultraviolet (EUV) Lithography. (Proceedings of SPIE - The International Society for Optical Engineering, 2010, 7636)
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[AR] Techel, J.
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