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Vente, C.d.; Boulogne, L.H.; Venkadesh, K.V.; Sital, C.; Lessmann, N.; Jacobs, C.; Sanchez, C.I.; Ginneken, B.v.
IEEE Transactions on Artificial Intelligence IEEE Trans. Artif. Intell. Artificial Intelligence, IEEE Transactions on. 3(2):129-138 Apr, 2022
Academic Journal
Lessmann, N.; Sánchez, C.I.; Boulogne, L.H.; Brink, M.; Calli, E.; van Everdingen, W.M.; Gerke, P.K.; Geurts, B.; Groeneveld, M.; Hendrix, N.; Hendrix, W.; Huisman, H.J.; Jacobs, C.; Kluge, R.; Kok, M.; van Leeuwen, K.; Meakin, J.; Overkamp, M.; Samperna, R.; Schaefer-Prokop, C.; Schalekamp, S.; Scholten, E.T.; Sital, C.; Teuwen, J.; Venkadesh, K.V.; de Vente, C.; Xie, W.; de Wilde, B.; Prokop, M.; van Ginneken, B.; Beenen, L.; Charbonnier, J.-P.; van Rikxoort, E.M.; Dofferhoff, T.; Vermaat, M.; Gietema, H.A.; van Harten, L.; Išgum, I.; Krdzalic, J.; Lassen-Schmidt, B.; van Rees Vellinga, T.; Stöger, J.L.
In: Radiology . (Radiology, 2021, 298(1):E18-E28)
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[AR] Sital, C.
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