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Matthew P. Aldred; Panos VlachosZLX Techno Ltd; 3 Trinity Lane; Beverley; UK HU17 0DY.; Adam E. A. Contoret; Simon R. Farrar; W. Chung-Tsoi; Bassam Mansoor; Kai L. Woon; Robert Hudson; Stephen M. Kelly; Mary O'Neill
Journal of Materials Chemistry; Aug2005, Vol. 15 Issue 31, p3208-3213, 6p
Academic Journal
Attrill, David C.; Farrar, Simon R.; Blinkhorn, A.S.; Davies, R.M.; Dickinson, Mark R.; King, Terence A.
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 1996, 2922:220-227)
Academic Journal
Farrar, Simon R.; Attrill, David C.; Dickinson, Mark R.; King, Terence A.; Blinkhorn, A.S.; Davies, R.M.
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 1996, 2922:209-219)
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[AR] Simon R. Farrar
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