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Vega-Gonzalez, V.; Radisic, D.; Choudhury, S.; Tierno, D.; Thiam, A.; Batuk, D.; Martinez, G.T.; Seidel, F.; Decoster, S.; Kundu, S.; Tsvetanova, D.; Peter, A.; De Coster, H.; Sepulveda-Marquez, A.; Altamirano-Sanchez, E.; Chan, Bt; Drissi, Y.; Sherazi, Y.; Uk-Lee, J.; Ciofi, I.; Murdoch, G.; Nagesh, N.; Hellings, G.; Ryckaert, J.; Biesemans, S.; Litta, E. Dentoni; Horiguchi, N.; Park, S.; Tokei, Zs.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :23.2.1-23.2.4 Dec, 2022
Conference
Schuddinck, P.; Zografos, O.; Weckx, P.; Matagne, P.; Sarkar, S.; Sherazi, Y.; Baert, R.; Jang, D.; Yakimets, D.; Gupta, A.; Parvais, B.; Ryckaert, J.; Verkest, D.; Mocuta, A.
2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T204-T205 Jun, 2019
Conference
Ryckaert, J.; Schuddinck, P.; Weckx, P.; Bouche, G.; Vincent, B.; Smith, J.; Sherazi, Y.; Mallik, A.; Mertens, H.; Demuynck, S.; Bao, T. Huynh; Veloso, A.; Horiguchi, N.; Mocuta, A.; Mocuta, D.; Boemmels, J.
2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :141-142 Jun, 2018
Conference
Bardon, M. Garcia; Sherazi, Y.; Jang, D.; Yakimets, D.; Schuddinck, P.; Baert, R.; Mertens, H.; Mattii, L.; Parvais, B.; Mocuta, A.; Verkest, D.
2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :143-144 Jun, 2018
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , DTCO and Computational Patterning III. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12954)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical and EUV Nanolithography XXXVII. (Proceedings of SPIE - The International Society for Optical Engineering, 2024, 12953)
Conference
Yakimets, D.; Bardon, M. Garcia; Jang, D.; Schuddinck, P.; Sherazi, Y.; Weckx, P.; Miyaguchi, K.; Parvais, B.; Raghavan, P.; Spessot, A.; Verkest, D.; Mocuta, A.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :20.4.1-20.4.4 Dec, 2017
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Mallik, A.; Vandooren, A.; Witters, L.; Walke, A.; Franco, J.; Sherazi, Y.; Weckx, P.; Yakimets, D.; Bardon, M.; Parvais, B.; Debacker, P.; Ku, B. W.; Lim, S. K.; Mocuta, A.; Mocuta, D.; Ryckaert, J.; Collaert, N.; Raghavan, P.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :32.1.1-31.1.4 Dec, 2017
Conference
Gupta, M. K.; Weckx, P.; Cosemans, S.; Schuddinck, P.; Baert, R.; Jang, D.; Sherazi, Y.; Raghavan, P.; Kaczer, B.; Spessot, A.; Mocuta, A.; Dehaene, W.
2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :CR-4.1-CR-4.6 Apr, 2017
Conference
Bardon, M. Garcia; Sherazi, Y.; Schuddinck, P.; Jang, D.; Yakimets, D.; Debacker, P.; Baert, R.; Mertens, H.; Badaroglu, M.; Mocuta, A.; Horiguchi, N.; Mocuta, D.; Raghavan, P.; Ryckaert, J.; Spessot, A.; Verkest, D.; Steegen, A.
2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :28.2.1-28.2.4 Dec, 2016
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[AR] Sherazi, Y.
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