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Electronic properties of Fe impurities in SnS van der Waals crystals – Revealing high-mobility holes
Academic Journal
Navrátil, J.; Caha, O.; Kopeček, J.; Čermák, P.; Prokleška, J.; Holý, V.; Sechovský, V.; Beneš, L.; Carva, K.; Honolka, J.; Drašar, Č.
In Materials Science & Engineering B March 2024 301
Academic Journal
Kratochvílová, M.; Uhlířová, K.; Míšek, M.; Holý, V.; Zázvorka, J.; Veis, M.; Pospíšil, J.; Son, S.; Park, J.-G.; Sechovský, V.
In Materials Chemistry and Physics 15 February 2022 278
Academic Journal
Wu, Z.; Weinberger, T.I.; Chen, J.; Hickey, A.J.; Lonzarich, G.G.; Grosche, F.M.; Eaton, A.G.; Cabala, A.; Pospíšil, J.; Prokleška, J.; Haidamak, T.; Bastien, G.; Sechovský, V.; Vališka, M.; Chichinadze, D.V.; Benjamin, S.; Graf, D.E.; Shaffer, D.; Mancera-Ugarte, M.J.; Skourski, Y.
In: Proceedings of the National Academy of Sciences of the United States of America . (Proceedings of the National Academy of Sciences of the United States of America, 10 September 2024, 121(37))
Academic Journal
Nakano, T.; Takahashi, E.; Yamaguchi, S.; Takeda, N.; Uhlířová, K.; Prokleška, J.; Pospíšil, J.; Sechovský, V.; Matusbayashi, K.; Ma, H.; Uwatoko, Y.
In: Physica Scripta . (Physica Scripta, 1 August 2024, 99(8))
Academic Journal
Klicpera, M.; Michal, O.; Hovančík, D.; Carva, K.; Sechovský, V.; Pospíšil, J.; Rosa, O.R.F.; Orlita, M.
In: Journal of Alloys and Compounds . (Journal of Alloys and Compounds, 15 December 2024, 1008)
Academic Journal
Eaton, A.G.; Weinberger, T.I.; Popiel, N.J.M.; Wu, Z.; Hickey, A.J.; Lonzarich, G.G.; Grosche, F.M.; Cabala, A.; Pospíšil, J.; Prokleška, J.; Haidamak, T.; Bastien, G.; Sechovský, V.; Vališka, M.; Opletal, P.; Sakai, H.; Haga, Y.; Nowell, R.; Benjamin, S.M.
In: Nature Communications . (Nature Communications, December 2024, 15(1))
Academic Journal
Tkáč, V.; Tarasenko, R.; Tóthová, E.; Bujňáková, Z.; Tibenská, K.; Orendáčová, A.; Sechovský, V.; Orendáč, M.
In Journal of Alloys and Compounds 5 November 2019 808
Academic Journal
Weinberger, T.I.; Wu, Z.; Lonzarich, G.G.; Grosche, F.M.; Eaton, A.G.; Graf, D.E.; Skourski, Y.; Cabala, A.; Pospíšil, J.; Prokleška, J.; Haidamak, T.; Bastien, G.; Sechovský, V.; Vališka, M.
In: Physical Review Letters . (Physical Review Letters, 28 June 2024, 132(26))
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[AR] Sechovský, V.
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