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Dorow, C. J.; Schram, T.; Smets, Q.; O'Brien, K. P.; Maxey, K.; Lin, C.-C.; Panarella, L.; Kaczer, B.; Arefin, N.; Roy, A.; Jordan, R.; Oni, A.; Penumatcha, A.; Naylor, C. H.; Kavrik, M.; Cott, D.; Graven, B.; Afanasiev, V.; Morin, P.; Asselberghs, I.; Lockhart de La Rosa, C. J.; Sankar Kar, G.; Metz, M.; Avci, U.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Panarella, L.; Kaczer, B.; Smets, Q.; Verreck, D.; Schram, T.; Cott, D.; Lin, D.; Tyaginov, S.; Asselberghs, I.; de la Rosa, C. Lockhart; Kar, G. S.; Afanas'ev, V.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Academic Journal
In Solid State Electronics June 2020 168
Academic Journal
Veloso, A.; Jourdain, A.; Radisic, D.; Chen, R.; Arutchelvan, G.; O'Sullivan, B.; Arimura, H.; Stucchi, M.; De Keersgieter, A.; Hosseini, M.; Hopf, T.; D'have, K.; Wang, S.; Dupuy, E.; Mannaert, G.; Vandersmissen, K.; Iacovo, S.; Marien, P.; Choudhury, S.; Schleicher, F.; Sebaai, F.; Oniki, Y.; Zhou, X.; Gupta, A.; Schram, T.; Briggs, B.; Lorant, C.; Rosseel, E.; Hikavyy, A.; Loo, R.; Geypen, J.; Batuk, D.; Martinez, G.T.; Soulie, J.P.; Devriendt, K.; Chan, B.T.; Demuynck, S.; Hiblot, G.; Van der Plas, G.; Ryckaert, J.; Beyer, G.; Litta, E.D.; Beyne, E.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7173-7179 Dec, 2022
Conference
Ghosh, S.; Smets, Q.; Banerjee, S.; Schram, T.; Kennes, K.; Verheyen, R.; Kumar, P.; Boulon, M.-E.; Groven, B.; Silva, H. M.; Kundu, S.; Cott, D.; Lin, D.; Favia, P.; Nuytten, T.; Phommahaxay, A.; Asselberghs, I.; De La Rosa, C.; Kar, G. S.; Brems, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Kundu, S.; Van Dorp, D.H.; Schram, T.; Smets, Q.; Banerjee, S.; Groven, B.; Cott, D.; Decoster, S.; Bezard, P.; Lazzarino, F.; Banerjee, K.; Ghosh, S.; De Marneffe, J.F.; Morin, P.; De La Rosa, C.J.L.; Asselberghs, I.; Kar, G.S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Academic Journal
Illarionov, Yu. Yu.; Karl, A.; Smets, Q.; Kaczer, B.; Knobloch, T.; Panarella, L.; Schram, T.; Brems, S.; Cott, D.; Asselberghs, I.; Grasser, T.
NPJ 2D Materials & Applications; 2/2/2024, Vol. 8, p1-7, 7p
Academic Journal
Newcomer, M.E.; Ulrich, C.; Peña, J.; Siirila-Woodburn, E.R.; Underwood, J.; Murphy, S.F.; Schram, T.; Maples, S.R.; Trotta, M.; Jasperse, J.; Seymour, D.; Hubbard, S.S.
In: Water Resources Research . (Water Resources Research, August 2023, 59(8))
Conference
2022 Device Research Conference (DRC) Device Research Conference (DRC), 2022. :1-2 Jun, 2022
Conference
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2020 4th IEEE. :1-4 Apr, 2020
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