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2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024
Academic Journal
Chakraborty, S.; Frank, D.J.; Tien, K.; Rosno, P.; Yeck, M.; Glick, J.A.; Robertazzi, R.; Richetta, R.; Bulzacchelli, J.F.; Underwood, D.; Ramirez, D.; Yilma, D.; Davies, A.; Joshi, R.V.; Chambers, S.D.; Lekuch, S.; Inoue, K.; Wisnieff, D.; Baks, C.W.; Bethune, D.S.; Timmerwilke, J.; Fox, T.; Song, P.; Johnson, B.R.; Gaucher, B.P.; Friedman, D.J.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(11):3258-3273 Nov, 2022
Academic Journal
Underwood, D.; Glick, J.A.; Inoue, K.; Frank, D.J.; Timmerwilke, J.; Pritchett, E.; Chakraborty, S.; Tien, K.; Yeck, M.; Bulzacchelli, J.F.; Baks, C.; Robertazzi, R.; Beck, M.; Joshi, R.V.; Wisnieff, D.; Lekuch, S.; Gaucher, B.P.; Friedman, D.J.; Rosno, P.; Ramirez, D.; Ruedinger, J.
In: PRX Quantum . (PRX Quantum, January 2024, 5(1))
Conference
Scheuermann, M.; Tian, S.; Robertazzi, R.; Wordeman, M.; Bergeron, C.; Jacobson, H.; Restle, P.; Silberman, J.; Tyberg, C.
2016 IEEE International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2016 IEEE International. :1-4 Nov, 2016
Academic Journal
Fluhr, E. J.; Baumgartner, S.; Boerstler, D.; Bulzacchelli, J. F.; Diemoz, T.; Dreps, D.; English, G.; Friedrich, J.; Gattiker, A.; Gloekler, T.; Gonzalez, C.; Hibbeler, J. D.; Jenkins, K. A.; Kim, Y.; Muench, P.; Nett, R.; Paredes, J.; Pille, J.; Plass, D.; Restle, P.; Robertazzi, R.; Shan, D.; Siljenberg, D.; Sperling, M.; Stawiasz, K.; Still, G.; Toprak-Deniz, Z.; Warnock, J.; Wiedemeier, G.; Zyuban, V.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 50(1):10-23 Jan, 2015
Conference
Frolov, D.; Chakraborty, S.; Underwood, D.; Glick, J.; Timmerwilke, J.; Robertazzi, R.; Inoue, K.; Yeck, M.; Rosno, P.; Snell, B.; Moertl, D.; Lekuch, S.; Desantis, C.; Tien, K.; Plouchart, J.-O.; Frank, D.; Wisnieff, D.; Bulzacchelli, J.; Baks, C.; Friedman, D.; Gaucher, B.
In: IEEE MTT-S International Microwave Symposium Digest , 2024 IEEE/MTT-S International Microwave Symposium, IMS 2024. (IEEE MTT-S International Microwave Symposium Digest, 2024, :706-709)
Conference
Bette, A.; DeBrosse, J.; Gogl, D.; Hoenigschmid, H.; Robertazzi, R.; Arndt, C.; Braun, D.; Casarotto, D.; Havreluk, R.; Lammers, S.; Obermaier, W.; Reohr, W.; Viehmann, H.; Gallagher, W.J.; Muller, G.
2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408) VLSI circuits VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on. :217-220 2003
Conference
2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) SOI conference SOI Conference, 2004. Proceedings. 2004 IEEE International. :165-167 2004
Academic Journal
DeBrosse, J.; Gogl, D.; Bette, A.; Hoenigschmid, H.; Robertazzi, R.; Arndt, C.; Braun, D.; Casarotto, D.; Havreluk, R.; Lammers, S.; Obermaier, W.; Reohr, W.R.; Viehmann, H.; Gallagher, W.J.; Muller, G.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 39(4):678-683 Apr, 2004
Academic Journal
Reohr, W.; Honigschmid, H.; Robertazzi, R.; Gogl, D.; Pesavento, F.; Lammers, S.; Lewis, K.; Arndt, C.; Yu Lu; Viehmann, H.; Scheuerlein, R.; Li-Kong Wang; Trouilloud, P.; Parkin, S.; Gallagher, W.; Muller, G.
IEEE Circuits and Devices Magazine IEEE Circuits Devices Mag. Circuits and Devices Magazine, IEEE. 18(5):17-27 Sep, 2002
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[AR] Robertazzi, R.
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