e-Article
'e-Article'
searched 78results | List
1~10
Academic Journal
Augur, R.; Child, C.; Ahn, J.H.; Tang, T.J.; Clevenger, L.; Kioussis, D.; Masuda, H.; Srivastava, R.; Oda, Y.; Oguma, H.; Quon, R.; Kim, B.; Sheng, H.; Hirooka, S.; Gupta, R.; Thomas, A.; Singh, S.M.; Fang, Q.; Schiwon, R.; Hamieh, B.; Wornyo, E.; Allen, S.; Kaltalioglu, E.; Ribes, G.; Zhang, G.; Fryxell, T.; Ogino, A.; Shimada, E.; Aizawa, H.; Minda, H.; Kim, S.O.; Oki, T.; Fujii, K.; Pallachalil, M.; Takewaki, T.; Hu, C.K.; Sundlof, B.; Permana, D.; Bolom, T.; Engel, B.; Labelle, C.; Sapp, B.; Nogami, T.; Simon, A.; Shobha, H.; Gates, S.; Ryan, E.T.; Bonilla, G.; Daubenspeck, T.; Shaw, T.; Osborne, G.; Grill, A.; Edelstein, D.; Restaino, D.; Molis, S.; Spooner, T.; Ferreira, P.; Biery, G.; Sampson, R.
In Microelectronic Engineering April 2012 92:42-44
Academic Journal
Hu, C.-K.; Canaperi, D.; Chen, S.T.; Gignac, L.M.; Kaldor, S.; Krishnan, M.; Malhotra, S.G.; Liniger, E.; Lloyd, J.R.; Rath, D.L.; Restaino, D.; Rosenberg, R.; Rubino, J.; Seo, S.-C.; Simon, A.; Smith, S.; Tseng, W.-T.
In Thin Solid Films 2006 504(1):274-278
Academic Journal
In: Journal of Cleaner Production . (Journal of Cleaner Production, 20 September 2021, 316)
Conference
Hu, C.-K.; Canaperi, D.; Chen, S.T.; Gignac, L.M.; Herbst, B.; Kaldor, S.; Krishnan, M.; Liniger, E.; Rath, D.L.; Restaino, D.; Rosenberg, R.; Rubino, J.; Seo, S.-C.; Simon, A.; Smith, S.; Tseng, W.-T.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :222-228 2004
Conference
Edelstein, D.; Rathore, H.; Davis, C.; Clevenger, L.; Cowley, A.; Nogami, T.; Agarwala, B.; Arai, S.; Carbone, A.; Chanda, K.; Chen, F.; Cohen, S.; Cote, W.; Cullinan, M.; Dalton, T.; Das, S.; Davis, P.; Demarest, J.; Dunn, D.; Dziobkowski, C.; Filippi, R.; Fitzsimmons, J.; Flaitz, P.; Gates, S.; Gill, J.; Grill, A.; Hawken, D.; Ida, K.; Klaus, D.; Klymko, N.; Lane, M.; Lane, S.; Lee, J.; Landers, W.; Li, W.-K.; Lin, Y.-H.; Liniger, E.; Liu, X.-H.; Madan, A.; Malhotra, S.; Martin, J.; Molis, S.; Muzzy, C.; Nguyen, D.; Nguyen, S.; Ono, M.; Parks, C.; Questad, D.; Restaino, D.; Sakamoto, A.; Shaw, T.; Shimooka, Y.; Simon, A.; Simonyi, E.; Swift, A.; Van Kleeck, T.; Vogt, S.; Wang, Y.-Y.; Wille, W.; Wright, J.; Yang, C.-C.; Yoon, M.; Ivers, T.
2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :316-319 2004
Conference
Kioussis, D.; Ryan, E.T.; Madan, A.; Klymko, N.; Molis, S.; Sun, Z.; Masuda, H.; Liang, S.; Lee, T.; Restaino, D.; Clevenger, L.; Quon, R.; Augur, R.; Child, C.; Gates, S.M.; Grill, A.; Shobha, H.; Sundlof, B.; Shaw, T.; Bonilla, G.; Daubenspeck, T.; Osborne, G.; Cohen, S.; Virwani, K.
2011 IEEE International Interconnect Technology Conference Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International. :1-3 May, 2011
Conference
McGahay, V.; Bonilla, G.; Chen, F.; Christiansen, C.; Cohen, S.; Cullinan-Scholl, M.; Demarest, J.; Dunn, D.; Engel, B.; Fitzsimmons, J.; Gill, J.; Grunow, S.; Herbst, B.; Hichri, H.; Ida, K.; Klymko, N.; Kiene, M.; Labelle, C.; Lee, T.; Liniger, E.; Liu, X.H.; Madan, A.; Malone, K.; Martin, J.; McLaughlin, P.V.; Minami, M.; Molis, S.; Muzzy, C.; Nguyen, S.; Patel, J.C.; Restaino, D.; Sakamoto, A.; Shaw, T.M.; Shimooka, Y.; Shobha, H.; Simonyi, E.; Widodo, J.; Grill, A.; Hannon, R.; Lane, M.; Nye, H.; Spooner, T.; Wisnieff, R.; Ivers, T.
2006 International Interconnect Technology Conference Interconnect Technology Conference, 2006 International. :9-11 2006
Conference
Grill, A.; Edelstein, D.; Restaino, D.; Lane, M.; Gates, S.; Liniger, E.; Shaw, T.; Liu, X.H.; Klaus, D.; Patel, V.; Cohen, S.; Simonyi, E.; Klymko, N.; Lane, S.; Ida, K.; Vogt, S.; Van Kleeck, T.; Davis, C.; Ono, M.; Nogami, T.; Ivers, T.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :54-56 2004
Conference
Liu, X.H.; Shaw, T.M.; Lane, M.W.; Rosenberg, R.R.; Lane, S.L.; Doyle, J.P.; Restaino, D.; Vogt, S.F.; Edelstaeing, D.C.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :93-95 2004
Conference
Edelstein, D.; Davis, C.; Clevenger, L.; Yoon, M.; Cowley, A.; Nogami, T.; Rathore, H.; Agarwala, B.; Arai, S.; Carbone, A.; Chanda, K.; Cohen, S.; Cote, W.; Cullinan, M.; Dalton, T.; Das, S.; Davis, P.; Demarest, J.; Dunn, D.; Dziobkowski, C.; Filippi, R.; Fitzsimmons, J.; Flaitz, P.; Gates, S.; Gill, J.; Grill, A.; Hawken, D.; Ida, K.; Klaus, D.; Klymko, N.; Lane, M.; Lane, S.; Lee, J.; Landers, W.; Li, W.-K.; Lin, Y.-H.; Liniger, E.; Liu, X.-H.; Madan, A.; Malhotra, S.; Martin, J.; Molis, S.; Muzzy, C.; Nguyen, D.; Nguyen, S.; Ono, M.; Parks, C.; Questad, D.; Restaino, D.; Sakamoto, A.; Shaw, T.; Shimooka, Y.; Simon, A.; Simonyi, E.; Tempest, S.; Van Kleeck, T.; Vogt, S.; Wang, Y.-Y.; Wille, W.; Wright, J.; Yang, C.-C.; Ivers, T.
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Interconnect technology Interconnect Technology Conference, 2004. Proceedings of the IEEE 2004 International. :214-216 2004
Refining the search results
Facets
[AR] Restaino, D.
Publication year
-
Database provider
Title
Publisher
자료유형(Source Type)
Subject
Language