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Electrochemical Impedance Spectroscopy for Ion Sensors with Interdigitated Electrodes: Capacitance Calculations, Equivalent Circuit Models and Design Optimizations

Academic Journal

Eva-Maria Korek; Reva Teotia; David Herbig; Ralf Brederlow

Biosensors, Vol 14, Iss 5, p 241 (2024)

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Towards Easy-to-Use Bacteria Sensing: Modeling and Simulation of a New Environmental Impedimetric Biosensor in Fluids

Academic Journal

Christian Pfeffer; Yue Liang; Helmut Grothe; Bernhard Wolf; Ralf Brederlow

Sensors, Vol 21, Iss 4, p 1487 (2021)

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Channel length dependence of hot-carrier degradation of LATID-n-MOSFETs under analog operation

Conference

Thewes, Roland; Walter, Georg H.; Brederlow, Ralf; Schluender, Christian; Schwerin, Andreas V.; Jurk, Reinhard; Linnenbank, Carsten G.; Lengauer, Gunter; Schmitt-Landsiedel, Doris; Weber, Werner

In: Annual Proceedings - Reliability Physics (Symposium). (Annual Proceedings - Reliability Physics (Symposium), 1999, :233-238)

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Hot carrier degradation of the low frequency noise of MOS transistors under analog operating conditions

Conference

Brederlow, Ralf; Weber, Werner; Schmitt-Landsiedel, Doris; Thewes, Roland

In: Annual Proceedings - Reliability Physics (Symposium). (Annual Proceedings - Reliability Physics (Symposium), 1999, :239-242)

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On the matching behavior of MOSFET small signal parameters

Conference

Thewes, Roland; Linnenbank, Carsten; Kollmer, Ute; Burges, Stefan; DiLeo, Michelle; Clincy, Miriam; Schaper, Ulrich; Brederlow, Ralf; Seibert, Rudolf; Weber, Werner

In: IEEE International Conference on Microelectronic Test Structures. (IEEE International Conference on Microelectronic Test Structures, 2000, :137-141)

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Device reliability in analog CMOS applications

Conference

Thewes, Roland; Brederlow, Ralf; Schluender, Christian; Wieczorek, Peter; Hesener, Alfred; Ankele, Benno; Klein, Peter; Kessel, Sylvia; Weber, Werner

In: Technical Digest - International Electron Devices Meeting. (Technical Digest - International Electron Devices Meeting, 1999, :81-84)

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Fluctuations of the low frequency noise of MOS transistors and their modeling in analog and RF-circuits

Conference

Brederlow, Ralf; Weber, Werner; Schmitt-Landsiedel, Doris; Thewes, Roland

In: Technical Digest - International Electron Devices Meeting. (Technical Digest - International Electron Devices Meeting, 1999, :159-162)

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Explanation and quantitative model for the matching behavior of poly-silicon resistors

Conference

Thewes, Roland; Brederlow, Ralf; Dahl, Claus; Kollmer, Ute; Linnenbank, Carsten G.; Holzapfl, Birgit; Becker, Jan; Kissing, Jens; Kessel, Sylvia; Weber, Werner

In: Technical Digest - International Electron Devices Meeting. (Technical Digest - International Electron Devices Meeting, 1998, :771-774)

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Physically based model for low-frequency noise of poly-silicon resistors

Conference

Brederlow, Ralf; Weber, Werner; Dahl, Claus; Schmitt-Landsiedel, Doris; Thewes, Roland

In: Technical Digest - International Electron Devices Meeting. (Technical Digest - International Electron Devices Meeting, 1998, :89-92)

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