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Academic Journal
Post, A.R.; Ho, N.; Rasmussen, E.; Post, I.; Cho, A.; Hofer, J.; Maness, A.T.; Parnell, T.; Nix, D.A.
In: JAMIA Open . (JAMIA Open, 1 December 2023, 6(4))
Conference
Grover, R.; Acosta, T.; AnDyke, C.; Armagan, E.; Auth, C.; Chugh, S.; Downes, K.; Hattendorf, M.; Jack, N.; Joshi, S.; Kasim, R.; Leatherman, G.; Lee, S.-H.; Lin, C.-Y.; Madhavan, A.; Mao, H.; Lowrie, A.; Martin, G.; McPherson, G.; Nayak, P.; Neale, A.; Nminibapiel, D.; Orr, B.; Palmer, J.; Pelto, C.; Poon, S. S.; Post, I.; Pramanik, T.; Rahman, A.; Ramey, S.; Seifert, N.; Sethi, K.; Schmitz, A.; Wu, H.; Yeoh, A.
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020
Conference
Yeoh, A.; Madhavan, A.; Kybert, N.; Anand, S.; Shin, J.; Asoro, M.; Samarajeewa, S.; Steigerwald, J.; Ganpule, C.; Buehler, M.; Tripathi, A.; Souw, V.; Haran, M.; Nigam, S.; Chikarmane, V.; Yashar, P.; Mule, T.; Wu, Y-H.; Lee, K-S.; Aykol, M.; Marla, K.; Sinha, P.; Kirby, S.; Hiramatsu, H.; Han, W.; Mori, M.; Sharma, M.; Jeedigunta, H.; Sprinkle, M.; Pelto, C.; Tanniru, M.; Leatherman, G.; Fischer, K.; Post, I.; Auth, C.
2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :144-147 Jun, 2018
Academic Journal
In: Molecular Therapy Methods and Clinical Development . (Molecular Therapy Methods and Clinical Development, 9 June 2022, 25:236-249)
Conference
Prasad, C.; Bai, P.; Gannavaram, S.; Hafez, W.; Hicks, J.; Jan, C.-H.; Lin, J.; Jones, M.; Komeyli, K.; Kotlyar, R.; Mistry, K.; Post, I.; Tsai, C.
2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :293-298 May, 2010
Conference
Auth, C.; Aliyarukunju, A.; Asoro, M.; Bergstrom, D.; Bhagwat, V.; Birdsall, J.; Bisnik, N.; Buehler, M.; Chikarmane, V.; Ding, G.; Fu, Q.; Gomez, H.; Han, W.; Hanken, D.; Haran, M.; Hattendorf, M.; Heussner, R.; Hiramatsu, H.; Ho, B.; Jaloviar, S.; Jin, I.; Joshi, S.; Kirby, S.; Kosaraju, S.; Kothari, H.; Leatherman, G.; Lee, K.; Leib, J.; Madhavan, A.; Marla, K.; Meyer, H.; Mule, T.; Parker, C.; Parthasarathy, S.; Pelto, C.; Pipes, L.; Post, I.; Prince, M.; Rahman, A.; Rajamani, S.; Saha, A.; Santos, J. Dacuna; Sharma, M.; Sharma, V.; Shin, J.; Sinha, P.; Smith, P.; Sprinkle, M.; Amour, A. St.; Staus, C.; Suri, R.; Towner, D.; Tripathi, A.; Tura, A.; Ward, C.; Yeoh, A.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.1.1-29.1.4 Dec, 2017
Conference
Jan, C.-H.; Bai, P.; Choi, J.; Curello, G.; Jacobs, S.; Jeong, J.; Johnson, K.; Jones, D.; Klopcic, S.; Lin, J.; Lindert, N.; Lio, A.; Natarajan, S.; Neirynck, J.; Packan, P.; Park, J.; Post, I.; Patel, M.; Ramey, S.; Reese, P.; Rockford, L.; Roskowski, A.; Sacks, G.; Turkot, B.; Wang, Y.; Wei, L.; Yip, J.; Young, I.; Zhang, K.; Zhang, Y.; Bohr, M.; Holt, B.
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :60-63 2005
Conference
Kuhn, K.; Agostinelli, M.; Ahmed, S.; Chambers, S.; Cea, S.; Christensen, S.; Fischer, P.; Gong, J.; Kardas, C.; Letson, T.; Henning, L.; Murthy, A.; Muthali, H.; Obradovic, B.; Packan, P.; Pae, S.W.; Post, I.; Putna, S.; Raol, K.; Roskowski, A.; Soman, R.; Thomas, T.; Vandervoorn, P.; Weiss, M.; Young, I.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :73-76 2002
Conference
2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203) Semiconductor manufacturing Semiconductor Manufacturing Symposium, 2001 IEEE International. :187-190 2001
Conference
Yang, S.; Ahmed, S.; Arcot, B.; Arghavani, R.; Bai, P.; Chambers, S.; Charvat, P.; Cotner, R.; Gasser, R.; Ghani, T.; Hussein, M.; Jan, C.; Kardas, C.; Maiz, J.; McGregor, P.; McIntyre, B.; Nguyen, P.; Packan, P.; Post, I.; Sivakumar, S.; Steigerwald, J.; Taylor, M.; Tufts, B.; Tyagi, S.; Bohr, M.
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :197-200 1998
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[AR] Post, I.
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