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Cacho, F.; Cathelin, P.; Hai, J.; Bouvot, S.; Nowakowski, J.; Martinez, M.; Debroucke, R.; Jean, S.; Paulin, R.; Antonijevic, J.; Federspiel, X.; Planes, N.; Papotto, G.; Parisi, A.; Finocchiaro, A.; Cavarra, A.; Castorina, A.; Nocera, C.; Palmisano, G.
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :4B.3-1-4B.3-6 Apr, 2024
Academic Journal
In Solid State Electronics September 2019 159:77-82
Academic Journal
In Solid State Electronics February 2017 128:67-71
Academic Journal
In Microelectronic Engineering 15 June 2016 159:9-16
Academic Journal
In Solid State Electronics April 2016 118:4-11
Academic Journal
In Solid State Electronics March 2016 117:130-137
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In Solid State Electronics January 2016 115 Part B:219-224
Academic Journal
Makovejev, S.; Kazemi Esfeh, B.; Barral, V.; Planes, N.; Haond, M.; Flandre, D.; Raskin, J.-P.; Kilchytska, V.
In Solid State Electronics June 2015 108:47-52
Academic Journal
Fenouillet-Beranger, C.; Perreau, P.; Benoist, T.; Richier, C.; Haendler, S.; Pradelle, J.; Bustos, J.; Brun, P.; Tosti, L.; Weber, O.; Andrieu, F.; Orlando, B.; Pellissier-Tanon, D.; Abbate, F.; Richard, C.; Beneyton, R.; Gregoire, M.; Ducote, J.; Gouraud, P.; Margain, A.; Borowiak, C.; Bianchini, R.; Planes, N.; Gourvest, E.; Bourdelle, K.K.; Nguyen, B.Y.; Poiroux, T.; Skotnicki, T.; Faynot, O.; Boeuf, F.
In Solid State Electronics October 2013 88:15-20
Academic Journal
Nyssens, L.; Halder, A.; Esfeh, B.K.; Planes, N.; Haond, M.; Flandre, D.; Raskin, J.; Kilchytska, V.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:789-796 2020
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[AR] Planes, N.
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