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Academic Journal
Feng, Y.; Vaghefi, P. Mirzadeh; Vranjkovic, S.; Penedo, M.; Kappenberger, P.; Schwenk, J.; Zhao, X.; Mandru, A.-O.; Hug, H.J.
In Journal of Magnetism and Magnetic Materials 1 June 2022 551
Academic Journal
Liu, X.; Erbas, B.; Conde-Rubio, A.; Boero, G.; Brugger, J.; Rivano, N.; Marzari, N.; Wang, Z.; Kis, A.; Jiang, J.; Banerjee, M.; Bienz, S.; Kumar, N.; Zenobi, R.; Sohier, T.; Penedo, M.; Fantner, G.
In: Nature Communications . (Nature Communications, December 2024, 15(1))
Combining thermal scanning probe lithography and dry etching for grayscale nanopattern amplification
Academic Journal
Erbas, B.; Conde-Rubio, A.; Liu, X.; Bertsch, A.; Boero, G.; Brugger, J.; Pernollet, J.; Wang, Z.; Kis, A.; Penedo, M.; Fantner, G.; Banerjee, M.
In: Microsystems and Nanoengineering . (Microsystems and Nanoengineering, December 2024, 10(1))
Academic Journal
Hosseini, N.; Neuenschwander, M.; Adams, J.D.; Andany, S.H.; Peric, O.; Penedo, M.; Fantner, G.E.; Winhold, M.; Giordano, M.C.; Bhat, V.S.; Grundler, D.
In: Nature Electronics . (Nature Electronics, July 2024, 7(7):567-575)
Academic Journal
Sproncken, C.C.M.; Liu, P.; Monney, J.; Pierucci, C.; Scholten, P.B.V.; Van Bueren, B.; Steiner, U.; Weder, C.; Mayer, M.; Ianiro, A.; Bruns, N.; Fall, W.S.; Wensink, H.H.; Penedo, M.; Fantner, G.E.
In: Nature . (Nature, 27 June 2024, 630(8018):866-871)
Academic Journal
Cencen, V.; Ghadiani, B.; Andany, S.H.; Kangül, M.; Penedo, M.; Fantner, G.E.; Tekin, C.; Bastings, M.
In: Journal of Visualized Experiments . (Journal of Visualized Experiments, March 2024, 2024(205))
Academic Journal
In: Small Methods . (Small Methods, 2024)
Academic Journal
In: Beilstein Journal of Nanotechnology . (Beilstein Journal of Nanotechnology, 2024, 15:134-143)
Academic Journal
Ichikawa, T.; Miyazawa, K.; Furusho, H.; Miyata, K.; Fukuma, T.; Alam, M.S.; Penedo, M.; Matsumoto, K.; Fujita, S.; Nakamura, C.
In: STAR Protocols . (STAR Protocols, 15 September 2023, 4(3))
Academic Journal
Miyazawa, K.; Furusho, H.; Ichikawa, T.; Alam, M.S.; Miyata, K.; Fukuma, T.; Penedo, M.; Nakamura, C.
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . (Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22 July 2023, 29(1):782)
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[AR] Penedo, M.
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