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2024 12th International Workshop on Biometrics and Forensics (IWBF) Biometrics and Forensics (IWBF), 2024 12th International Workshop on. :1-6 Apr, 2024
Conference
Emersic, Z.; Ohki, T.; Akasaka, M.; Arakawa, T.; Maeda, S.; Okano, M.; Sato, Y.; George, A.; Marcel, S.; Ganapathi, I.I.; Ali, S.S.; Javed, S.; Werghi, N.; Isik, S.G.; Saritas, E.; Ekenel, H.K.; Hudovernik, V.; Kolf, J.N.; Boutros, F.; Damer, N.; Sharma, G.; Kamboj, A.; Nigam, A.; Jain, D.K.; Camara-Chavez, G.; Peer, P.; Struc, V.
2023 IEEE International Joint Conference on Biometrics (IJCB) Biometrics (IJCB), 2023 IEEE International Joint Conference on. :1-10 Sep, 2023
Academic Journal
In: Engineering Applications of Artificial Intelligence . (Engineering Applications of Artificial Intelligence, July 2024, 133)
Academic Journal
IEEE Access Access, IEEE. 11:49971-49991 2023
Academic Journal
Vitek, M.; Das, A.; Lucio, D.R.; Zanlorensi, L.A.; Menotti, D.; Khiarak, J.N.; Shahpar, M.A.; Asgari-Chenaghlu, M.; Jaryani, F.; Tapia, J.E.; Valenzuela, A.; Wang, C.; Wang, Y.; He, Z.; Sun, Z.; Boutros, F.; Damer, N.; Grebe, J.H.; Kuijper, A.; Raja, K.; Gupta, G.; Zampoukis, G.; Tsochatzidis, L.; Pratikakis, I.; Kumar, S.V.A.; Harish, B.S.; Pal, U.; Peer, P.; Struc, V.
IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 18:190-205 2023
Academic Journal
In: IEEE Transactions on Biometrics, Behavior, and Identity Science . (IEEE Transactions on Biometrics, Behavior, and Identity Science, 2024, :1-1)
Conference
2020 43rd International Convention on Information, Communication and Electronic Technology (MIPRO) Information, Communication and Electronic Technology (MIPRO), 2020 43rd International Convention on. :1758-1763 Sep, 2020
Conference
Vitek, M.; Das, A.; Pourcenoux, Y.; Missler, A.; Paumier, C.; Das, S.; De Ghosh, I.; Lucio, D. R.; Zanlorensi, L. A.; Menotti, D.; Boutros, F.; Damer, N.; Grebe, J. H.; Kuijper, A.; Hu, J.; He, Y.; Wang, C.; Liu, H.; Wang, Y.; Sun, Z.; Osorio-Roig, D.; Rathgeb, C.; Busch, C.; Tapia, J.; Valenzuela, A.; Zampoukis, G.; Tsochatzidis, L.; Pratikakis, I.; Nathan, S.; Suganya, R.; Mehta, V.; Dhall, A.; Raja, K.; Gupta, G.; Khiarak, J. N.; Akbari-Shahper, M.; Jaryani, F.; Asgari-Chenaghlu, M.; Vyas, R.; Dakshit, S.; Peer, P.; Pal, U.; Struc, V.
2020 IEEE International Joint Conference on Biometrics (IJCB) Biometrics (IJCB),2020 IEEE International Joint Conference on. :1-10 Sep, 2020
Academic Journal
In Polymer Testing October 2014 39:115-121
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