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Conference
Bertrand, B.; Martinez, B.; Li, J.; Paz, B. Cardoso; Millory, V.; Labracherie, V.; Brevard, L.; Sahin, H.; Roussely, G.; Sarrazin, A.; Meunier, T.; Vinet, M.; Niquet, Y.-M.; Brun, B.; Maurand, R.; De Franceschi, S.; Niebojewski, H.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Elbaz, G.; Casse, M.; Labracherie, V.; Roussely, G.; Bertrand, B.; Niebojewski, H.; Vinet, M.; Balestro, F.; Urdampilleta, M.; Meunier, T.; Paz, B. Cardoso
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :5-8 Sep, 2023
Conference
Paz, B. Cardoso; El-Homsy, V.; Niegemann, D. J.; Klemt, B.; Chanrion, E.; Thiney, V.; Jadot, B.; Mortemousque, P. A.; Bertrand, B.; Bedecarrats, T.; Niebojewski, H.; Perruchot, F.; De Franceschi, S.; Vinet, M.; Urdampilleta, M.; Meunier, T.
ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) Solid State Circuits Conference (ESSCIRC), ESSCIRC 2022- IEEE 48th European. :45-48 Sep, 2022
Report
Bédécarrats, T.; Paz, B. Cardoso; Diaz, B. Martinez; Niebojewski, H.; Bertrand1, B.; Rambal, N.; Comboroure, C.; Sarrazin, A.; Boulard, F.; Guyez, E.; Hartmann, J. -M.; Morand, Y.; Magalhaes-Lucas, A.; Nowak, E.; Catapano, E.; Cassé, M.; Urdampilleta, M.; Niquet, Y. -M.; Gaillard, F.; De Franceschi, S.; Meunier, T.; Vinet, M.
2021 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2021, pp. 1-4
Conference
Bedecarrats, T.; Paz, B. Cardoso; Diaz, B. Martinez; Niebojewski, H.; Bertrand, B.; Rambal, N.; Comboroure, C.; Sarrazin, A.; Boulard, F.; Guyez, E.; Hartmann, J.-M.; Morand, Y.; Magalhaes-Lucas, A.; Nowak, E.; Catapano, E.; Casse, M.; Urdampilleta, M.; Niquet, Y.-M.; Gaillard, F.; De Franceschi, S.; Meunier, T.; Vinet, M.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :1-4 Dec, 2021
Conference
Casse, M.; Paz, B. Cardoso; Bergamaschi, F.; Ghibaudo, G.; Serra, F.; Billiot, G.; Jansen, A. G. M.; Berlingard, Q.; Martinie, S.; Bedecarrats, T.; Contamin, L.; Juge, A.; Vincent, E.; Galy, P.; Pavanello, M.A; Vinet, M.; Meunier, T.; Gaillard, F.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :34.6.1-34.6.4 Dec, 2022
Conference
Contamin, L.C.; Paz, B. Cardoso; Diaz, B. Martinez; Bertrand, B.; Niebojewski, H.; Labracherie, V.; Sadik, A.; Catapano, E.; Casse, M.; Nowak, E.; Niquet, Y.-M.; Gaillard, F.; Meunier, T.; Mortemousque, P.-A.; Vinet, M.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :22.1.1-22.1.4 Dec, 2022
Conference
Niebojewski, H.; Bertrand, B.; Nowak, E.; Bedecarrats, T.; Paz, B. Cardoso; Contamin, L.; Mortemousque, P.A.; Labracherie, V.; Brevard, L.; Sahin, H.; Charbonnier, J.; Thomas, C.; Assous, M.; Casse, M.; Urdampilleta, M.; Niquet, Y.-M.; Perruchot, F.; Gaillard, F.; De Franceschi, S.; Meunier, T.; Vinet, M.
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :415-416 Jun, 2022
Conference
Vinet, M.; Bedecarrats, T.; Paz, B. Cardoso; Martinez, B.; Chanrion, E.; Catapano, E.; Contamin, L.; Pallegoix, L.; Venitucci, B.; Mazzocchi, V.; Niebojewski, H.; Bertrand, B.; Rambal, N.; Thomas, C.; Charbonnier, J.; Mortemousque, P.-A.; Hartmann, J.-M.; Nowak, E.; Thonnart, Y.; Billiot, G.; Casse, M.; Urdampilleta, M.; Niquet, Y.-M.; Perruchot, F.; De Franceschi, S.; Meunier, T.
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :14.2.1-14.2.4 Dec, 2021
Conference
Paz, B. Cardoso; Le Guevel, L.; Casse, M.; Billiot, G.; Pillonnet, G.; Jansen, A. G. M.; Maurand, R.; Haendler, S.; Juge, A.; Vincent, E.; Galy, P.; Ghibaudo, G.; Vinet, M.; de Franceschi, S.; Meunier, T.; Gaillard, F.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
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