e-Article
'e-Article'
searched 479results | List
1~10
Conference
Joshi, K.; Nminibapiel, D.; Ghoneim, M.; Ali, D.; Ramamurthy, R.; Pantisano, L.; Meric, I.; Ramey, S.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023
Conference
Hafez, W.; Agnihotri, P.; Asoro, M.; Aykol, M.; Bains, B.; Bambery, R.; Bapna, M.; Barik, A.; Chatterjee, A.; Chiu, P.C.; Chu, T.; Firby, C.; Fischer, K.; Fradkin, M.; Greve, H.; Gupta, A.; Haralson, E.; Haran, M.; Hicks, J.; Illa, A.; Jang, M.; Klopcic, S.; Kobrinsky, M.; Kuns, B.; Lai, H.-h.; Lanni, G.; Lee, S.-H.; Lindert, N.; Lo, C.-l.; Luo, Y.; Malyavanatham, G.; Marinkovic, B.; Maymon, Y.; Nabors, M.; Neirynck, J.; Packan, P.; Paliwal, A.; Pantisano, L.; Paulson, L.; Penmatsa, P.; Prasad, C.; Puls, C.; Rahman, T.; Ramaswamy, R.; Samant, S.; Sell, B.; Sethi, K.; Shah, F.; Shamanna, M.; Shang, K.; Li, Q.; Sibakoti, M.; Stoeger, J.; Strutt, N.; Thirugnanasambandam, R.; Tsai, C.; Wang, X.; Wang, A.; Wu, S.-j.; Xu, Q.; Zhong, X.-h.; Natarajan, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022
Conference
Paliwoda, P.; Toledano-Luque, M.; Nigam, T.; Guarin, F.; Nour, M.; Cimino, S.; Pantisano, L.; Gupta, A.; Gonzalez, O. H.; Hauser, M.; Liu, W.; Vayshenker, A.; Ioannou, D.; Lee, D.; Jiang, L.; Yee, P.; Rauch, S.; Min, B.
2020 IEEE 29th North Atlantic Test Workshop (NATW) North Atlantic Test Workshop (NATW), 2020 IEEE 29th. :1-7 Jun, 2020
Academic Journal
Chen, Y.Y.; Goux, L.; Pantisano, L.; Swerts, J.; Adelmann, C.; Mertens, S.; Afanasiev, V.V.; Wang, X.P.; Govoreanu, B.; Degraeve, R.; Kubicek, S.; Paraschiv, V.; Verbrugge, B.; Jossart, N.; Altimime, L.; Jurczak, M.; Kittl, J.; Groeseneken, G.; Wouters, D.J.
In Microelectronic Engineering December 2013 112:92-96
Academic Journal
Cimino, S.; Padovani, A.; Larcher, L.; Afanas’ev, V.V.; Hwang, H.J.; Lee, Y.G.; Jurczac, M.; Wouters, D.; Lee, B.H.; Hwang, H.; Pantisano, L.
In Microelectronic Engineering July 2012 95:71-73
Academic Journal
O'Sullivan, B.J.; Thoan, N.H.; Jivanescu, M.; Pantisano, L.; Bearda, T.; Dross, F.; Gordon, I.; Afanas’ev, V.; Stesmans, A.; Poortmans, J.
In Energy Procedia 2012 27:185-190
Academic Journal
Paliwoda, P.; Chbili, Z.; Kerber, A.; Nigam, T.; Nagahiro, K.; Cimino, S.; Toledano-Luque, M.; Pantisano, L.; Min, B.W.; Misra, D.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(2):249-254 Jun, 2019
Conference
Razavieh, A.; Mahajan, V.; Oo, W. L.; Cimino, S.; Khokale, S. V.; Nagahiro, K.; Pantisano, L.; Ethirajan, T.; Lemon, J.; Gu, M.; Chen, Y.; Wang, H. T.; Lee, T. H.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Academic Journal
Li, Z.; Schram, T.; Pantisano, L.; Witters, T.; Stesmans, A.; Akheyar, A.; Afanasiev, V.V.; Yamada, N.; Takaaki, T.; De Gendt, S.; De Meyer, K.
In Microelectronic Engineering 2007 84(9):2213-2216
Refining the search results
Facets
[AR] Pantisano, L.
Publication year
-
Database provider
Title
Publisher
자료유형(Source Type)
Subject
Language