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2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :615-619 May, 2010
Conference
Pirovano, A.; Pellizzer, F.; Redaelli, A.; Tortorelli, I.; Varesi, E.; Ottogalli, F.; Tosi, M.; Besana, P.; Cecchini, R.; Piva, R.; Magistretti, M.; Scaravaggi, M.; Mazzone, G.; Petruzza, P.; Bedeschi, F.; Marangon, T.; Modelli, A.; Ielmini, D.; Lacaita, A.L.; Bez, R.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :313-316 2005
Conference
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :293-296 2004
Conference
Bedeschi, F.; Bez, R.; Boffino, C.; Bonizzoni, E.; Buda, E.; Casagrande, G.; Costa, L.; Ferraro, M.; Gastaldi, R.; Khouri, O.; Ottogalli, F.; Pellizzer, F.; Pirovano, A.; Resta, C.; Torelli, G.; Tosi, M.
Proceedings of the 30th European Solid-State Circuits Conference Solid-state circuits conference Solid-State Circuits Conference, 2004. ESSCIRC 2004. Proceeding of the 30th European. :207-210 2004
Conference
Bedeschi, F.; Resta, C.; Khouri, O.; Buda, E.; Costa, L.; Ferraro, M.; Pellizzer, F.; Ottogalli, F.; Pirovano, A.; Tosi, M.; Bez, R.; Gastaldi, R.; Casagrande, G.
2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) VLSI circuits VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on. :442-445 2004
Academic Journal
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 55(6):3189-3196 Dec, 2008
Academic Journal
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 55(4):2090-2097 Aug, 2008
Academic Journal
Bedeschi, F.; Bez, R.; Boffino, C.; Bonizzoni, E.; Buda, E.C.; Casagrande, G.; Costa, L.; Ferraro, M.; Gastaldi, R.; Khouri, O.; Ottogalli, F.; Pellizzer, F.; Pirovano, A.; Resta, C.; Torelli, G.; Tosi, M.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 40(7):1557-1565 Jul, 2005
Academic Journal
Pirovano, A.; Redaelli, A.; Pellizzer, F.; Ottogalli, F.; Tosi, M.; Ielmini, D.; Lacaita, A.L.; Bez, R.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 4(3):422-427 Sep, 2004
Conference
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :542-546 Apr, 2007
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[AR] Ottogalli, F.
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