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Academic Journal
Obradovic, A.; Ager, C.; Khosravi-Maharlooei, M.; Drake, C.G.; Turunen, M.; Tomassoni, L.; Fernandez, E.C.; Realubit, R.; Karan, C.; Califano, A.; Nirschl, T.; Yegnasubramanian, S.; DeMarzo, A.M.; Kochel, C.M.; Jackson, C.M.; Allaf, M.; Bivalacqua, T.; Lim, M.; McCann, P.; Rogava, M.; Iuga, A.
In: Cancer Cell . (Cancer Cell, 8 May 2023, 41(5):933-949.e11)
Conference
Pacha, C.; von Arnim, K.; Schulz, T.; Weize Xiong; Gostkowski, M.; Knoblinger, G.; Marshall, A.; Nirschl, T.; Berthold, J.; Russ, C.; Gossner, H.; Duvvury, C.; Patruno, P.; Cleavelin, R.; Schruefer, K.
2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :1656-1665 2006
Conference
2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :223-228 2005
Conference
Nirschl, T.; Schaper, U.; Einfeld, J.; Henzler, S.; Sterkel, M.; Singer, J.; Fulde, M.; Hansch, W.; Georgakos, G.; Schmitt-Landsiedell, D.
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :43-46 2005
Conference
Nirschl, T.; Henzler, St.; Fischer, J.; Bargagli-Stoffi, A.; Fulde, M.; Sterkel, M.; Teichmann, P.; Schaper, U.; Einfeld, J.; Linnenbank, C.; Sedlmeir, J.; Weber, C.; Heinrich, R.; Ostermayr, N.; Olbrich, A.; Dobler, B.; Ruderer, E.; Kakoschke, R.; Schrufert, K.; Georgakos, G.; Hansch, W.; Schmitt-Landsiedel, D.
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :173-176 2005
Conference
ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705) Solid-state circuits Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European. :409-412 2003
Academic Journal
Fischer, T.; Amirante, E.; Huber, P.; Nirschl, T.; Olbrich, A.; Ostermayr, M.; Schmitt-Landsiedel, D.
IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(4):534-541 Nov, 2008
Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead
Academic Journal
Henzler, S.; Georgakos, G.; Eireiner, M.; Nirschl, T.; Pacha, C.; Berthold, J.; Schmitt-Landsiedel, D.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 41(7):1654-1661 Jul, 2006
Conference
Nirschl, T.; Henzler, S.; Pacha, C.; Peng-Fei Wang; Hansch, W.; Georgakos, G.; Schmitt-Landsiedel, D.
4th IEEE Conference on Nanotechnology, 2004. Nanotechnology Nanotechnology, 2004. 4th IEEE Conference on. :402-404 2004
Academic Journal
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 39(7):1148-1158 Jul, 2004
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[AR] Nirschl, T.
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