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Conference
Pellegrini, S.; Nicholson, I.; Helleboid, R.; Mamdy, B.; Forcolin, G.; Al-Rawhani, M.; Buj, C.; Marchand, G.; Rae, B.; Golanski, D.; Mugny, G.; Bianchi, R. A.; Rideau, D.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Rideau, D.; Uhring, W.; Bianchi, R. A.; Helleboid, R.; Mugny, G.; Grebot, J.; Manouvrier, J.R.; Neri, R.; Brun, F.; Lakeh, M. Dolatpoor; Rink, S.; Kammerer, J-B.; Lallement, C.; Lacombe, E.; Golanski, D.; Rae, B.; Bah, T. M.; Twaddle, F.; Quenette, V.; Marchand, G.; Buj, C.; Fillon, R.; Henrion, Y.; Nicholson, I.; Agnew, M.; Basset, M.; Perrier, R.; Al-Rawhani, M.; Mamdy, B.; Pellegrin, S.; Gouget, G.; Maciazek, P.; Juge, A.; Dartigues, A.; Alause, H. Wehbe
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :144-147 Sep, 2023
Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements
Academic Journal
Kriso, C.; Triozon, F.; Delerue, C.; Schneider, L.; Abbate, F.; Nolot, E.; Rideau, D.; Niquet, Y.-M.; Mugny, G.; Tavernier, C.
In Solid State Electronics March 2017 129:93-96
Conference
Rideau, D.; Oussaiti, Y.; Grebot, J.; Helleboid, R.; Lopez, A.; Mugny, G.; Bourreau, E.; Golanski, D.; Mamdy, B.; Alause, H. Wehbe; Nicholson, I.; Pellegrini, S.; Vlimant, C.E.; Agnew, M.; Cazimajou, T.; Pala, M.; Saint-Martin, J.; Dollfus, P.
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :293-296 Sep, 2021
Academic Journal
Tillement, J.; Georges, S.; Mugny, G.; Roy, F.; Boeuf, F.; Cervera, C.; Baylet, J.; Jany, C.; Nardelli, F.; Di Rito, T.; Saxod, O.; Gravrand, O.; Baron, T.
In: Sensors . (Sensors, November 2023, 23(22))
Conference
oussaiti, Y.; Rideau, D.; Manouvrier, J.R.; Quenette, V.; Mamdy, B.; Buj, C.; Grebot, J.; Wehbe-Alause, H.; Lopez, A.; Mugny, G.; Agnew, M.; Lacombe, E.; Pala, M.; Dollfus, P.
2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :145-148 Sep, 2020
Academic Journal
Chehaibou, B.; Delerue, C.; Abadie, C.; Prado, Y.; Gallas, B.; Lhuillier, E.; Xu, X.Z.; Vincent, G.; Mugny, G.; Arnaud, A.
In: Journal of Physical Chemistry C . (Journal of Physical Chemistry C, 20 July 2023, 127(28):13789-13799)
Academic Journal
Helleboid, R.; Saint-Martin, J.; Pala, M.; Dollfus, P.; Rideau, D.; Grebot, J.; Mamdy, B.; Mugny, G.; Basset, M.; Golanski, D.; Nicholson, I.; Agnew, M.; Pellegrini, S.
In: Journal of Physics D: Applied Physics . (Journal of Physics D: Applied Physics, 15 December 2022, 55(50))
Academic Journal
In Psychologie francaise 2008 53(2):223-237
Academic Journal
In Revue europeenne de psychologie appliquee 2007 57(4):257-265
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[AR] Mugny, G.
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