e-Article
'e-Article'
searched 415results | List
1~10
Academic Journal
Leyva, N.; Monemi, A.; Oliete-Escuin, N.; Lopez-Paradis, G.; Abancens, X.; Balkind, J.; Vallejo, E.; Moreto, M.; Alvarez, L.
IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 14(3):395-408 Sep, 2024
Academic Journal
In: Journal of Parallel and Distributed Computing . (Journal of Parallel and Distributed Computing, October 2024, 192)
Academic Journal
In: Neural Computing and Applications . (Neural Computing and Applications, August 2024, 36(23):14017-14034)
Academic Journal
Langarita-Benítez, R.; Badouh, A.; Soria-Pardos, V.; López-Paradís, G.; Doblas, M.; Armejach, A.; Marco-Sola, S.; Moretó, M.; Aguado-Puig, Q.; López-Villellas, L.; Alastruey-Benedé, J.; Ibáñez, P.; Setoain, J.; Kim, C.; Ono, M.
In: Future Generation Computer Systems . (Future Generation Computer Systems, August 2024, 157:313-329)
Academic Journal
IEEE/ACM Transactions on Computational Biology and Bioinformatics IEEE/ACM Trans. Comput. Biol. and Bioinf. Computational Biology and Bioinformatics, IEEE/ACM Transactions on. 20(5):3139-3153 Jan, 2023
Academic Journal
Jimenez, V.; Rodriguez, M.; Dominguez, M.; Sans, J.; Diaz, I.; Valente, L.; Guglielmi, V.L.; Quiroga, J.V.; Genovese, R.I.; Sonmez, N.; Palomar, O.; Moreto, M.
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(3):36-44 Jun, 2023
Academic Journal
In: Journal of Control, Automation and Electrical Systems . (Journal of Control, Automation and Electrical Systems, June 2024, 35(3):485-498)
Academic Journal
Solà-Ginés, M.; Miró, L.; Rodríguez, C.; Polo, J.; Pérez-Bosque, A.; Moretó, M.; Bellver-Sanchis, A.; Griñán-Ferré, C.; Pallàs, M.; Pont, L.; Benavente, F.; Barbosa, J.
In: PLoS ONE . (PLoS ONE, May 2024, 19(5 May))
Academic Journal
IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 72(3):627-640 Mar, 2023
Academic Journal
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(6):5-6 Dec, 2023
Refining the search results
Facets
[AR] Moreto, M.
Publication year
-
Database provider
Title
Publisher
자료유형(Source Type)
Subject
Language