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IEEE Access Access, IEEE. 7:54273-54284 2019
Academic Journal
Russell, A.J.C.; Sanderson, T.; Bushell, E.; Talman, A.M.; Anar, B.; Girling, G.; Metcalf, T.; Montandon, R.; Schwach, F.; Lawniczak, M.K.N.; Hunziker, M.; Pandey, V.; Sayers, C.; Billker, O.; Martin, J.S.; Roberts, A.B.; Modrzynska, K.K.; Waters, A.P.; Pardo, M.; Choudhary, J.S.; Rayner, J.C.; Voet, T.; Kent, R.S.
In: Cell Host and Microbe . (Cell Host and Microbe, 8 February 2023, 31(2):305-319.e10)
Academic Journal
Pance, A.; Ng, B.L.; Mwikali, K.; Koutsourakis, M.; Agu, C.; Rouhani, F.J.; Montandon, R.; Law, F.; Ponstingl, H.; Rayner, J.C.
In: Frontiers in Cellular and Infection Microbiology . (Frontiers in Cellular and Infection Microbiology, 2023, 13)
Academic Journal
Carrasquilla, M.; Adjalley, S.; Sanderson, T.; Marin-Menendez, A.; Coyle, R.; Montandon, R.; Rayner, J.C.; Pance, A.; Lee, M.C.S.
In: Scientific Reports . (Scientific Reports, 1 December 2020, 10(1))
Conference
Proceedings of International Workshop on Defect and Fault Tolerance in VLSI Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,. :269-277 1995
Conference
Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair Design automation/hardware description languages/VLSI Design Automation Conference, 1995. Proceedings of the ASP-DAC '95/CHDL '95/VLSI '95., IFIP International Conference on Hardware Description Languages. IFIP International Conference on Very Large Scal. :711-716 1995
Academic Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 8(1):98-103 Feb, 2000
Academic Journal
In: IEEE Access . (IEEE Access, 2019, 7:54273-54284)
Academic Journal
Academic Journal
In: Environment and Urbanization . (Environment and Urbanization, 1 April 2017, 29(1):33-50)
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[AR] Montandon, R.
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