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Hafez, W.; Agnihotri, P.; Asoro, M.; Aykol, M.; Bains, B.; Bambery, R.; Bapna, M.; Barik, A.; Chatterjee, A.; Chiu, P.C.; Chu, T.; Firby, C.; Fischer, K.; Fradkin, M.; Greve, H.; Gupta, A.; Haralson, E.; Haran, M.; Hicks, J.; Illa, A.; Jang, M.; Klopcic, S.; Kobrinsky, M.; Kuns, B.; Lai, H.-h.; Lanni, G.; Lee, S.-H.; Lindert, N.; Lo, C.-l.; Luo, Y.; Malyavanatham, G.; Marinkovic, B.; Maymon, Y.; Nabors, M.; Neirynck, J.; Packan, P.; Paliwal, A.; Pantisano, L.; Paulson, L.; Penmatsa, P.; Prasad, C.; Puls, C.; Rahman, T.; Ramaswamy, R.; Samant, S.; Sell, B.; Sethi, K.; Shah, F.; Shamanna, M.; Shang, K.; Li, Q.; Sibakoti, M.; Stoeger, J.; Strutt, N.; Thirugnanasambandam, R.; Tsai, C.; Wang, X.; Wang, A.; Wu, S.-j.; Xu, Q.; Zhong, X.-h.; Natarajan, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Shamanna, M.; Abuayob, E.; Aenuganti, G.; Alvares, C.; Antony, J.; Bahudhanam, A.; Chandran, A.; Chew, P.; Chatterjee, A.; Chauhan, B.; Dandeti, N.; Desai, J.; Doyle, M.; Dmukauskas, T.; Farache, P.; Fetzer, E.; Fischer, K.; Hack, P.; Greenzweig, Y.; Giacobbe, J.; Hafez, W.; Haralson, E.; Hegde, A.; Illa, A.; Islam, M.; Jain, S.; Jang, M.; Nguyen, J.; Tong, T.; Jiang, L.; Karl, E.; Kalangi, P.; Khoo, G.; Krishnamoorthy, A.; Kuns, B.; Li, W.; Livengood, R.; Malik, T.; Priyanka, R.; Faraby, H.; Maymon, Y.; Mistry, K.; Morgan, K.; Natarajan, S.; Nevo, O.; Oh, M.; Pardy, P.; Park, J.; Penmatsa, P.; Phelps, B.; Peterson, C.; Rajappa, S.; Raveh, A.; Rezaie, A; Ravishankar, T.; Ramaswamy, R.; Reddy, S.; Saha, R.; Sen, S.; Sanchez, R.; Sanaga, R.; Simkhovich, B.; Sell, B.; Senger, M.; Schnarch, B.; Seshadri, M.; Sidorov, O.; Subramaniam, S.; Subramanian, K.; Truong, B.; Bangalore, S.; Hicks, J.; Venkatesh, S.; Christensen, D.; Bhargav, K.; Haartman, M. Von; Joshi, P.; Zickel, S.; Lin, C-H; Huening, J.; Wu, T-H; Bakken, N.; Afzal, A.; Raman, A.; Rao, Sj.; Kawar, V.; Neirynck, J.; Bradley, D.; Duwe, M.; Wu, S.; Patil, V.; Bayoumy, M.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Academic Journal
In: Applied Acoustics . (Applied Acoustics, October 2023, 213)
Academic Journal
In: Journal of Experimental Psychology: General . (Journal of Experimental Psychology: General, October 2019, 148(10):1842-1848)
Conference
In: IEEE International Conference on Intelligent Robots and Systems , 2020 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2020. (IEEE International Conference on Intelligent Robots and Systems, 24 October 2020, :11724-11731)
Academic Journal
In: Global Finance Journal . (Global Finance Journal, 2013, 24(2):114-118)
Academic Journal
In: Child Abuse and Neglect . (Child Abuse and Neglect, 2001, 25(4):457-472)
Book
In: Latent Variable Analysis and Signal Separation - 14th International Conference, LVA/ICA 2018, Proceedings . (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 2018, 10891 LNCS:228-237)
Conference
In: 2017 Hands-Free Speech Communications and Microphone Arrays, HSCMA 2017 - Proceedings , 2017 Hands-Free Speech Communications and Microphone Arrays, HSCMA 2017 - Proceedings. (2017 Hands-Free Speech Communications and Microphone Arrays, HSCMA 2017 - Proceedings, 10 April 2017, :96-100)
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[AR] Maymon, Y.
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