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Conference
Burr, G. W.; Tsai, H.; Simon, W.; Boybat, I.; Ambrogio, S.; Ho, C.-E.; Liou, Z.-W.; Rasch, M.; Buchel, J.; Narayanan, P.; Gordon, T.; Jain, S.; Levin, T. M.; Hosokawa, K.; Le Gallo, M.; Smith, H.; Ishii, M.; Kohda, Y.; Chen, A.; Mackin, C.; Fasoli, A.; ElMaghraoui, K.; Muralidhar, R.; Okazaki, A.; Chen, C. -T.; Frank, M. M.; Lammie, C.; Vasilopoulos, A.; Friz, A. M.; Luquin, J.; Teehan, S.; Ahsan, I.; Sebastian, A.; Narayanan, V.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
In: Journal of Participation and Employee Ownership . (Journal of Participation and Employee Ownership, 14 June 2024, 7(1):1-25)
Conference
Burr, Geoffrey W.; Narayanan, P.; Ambrogio, S.; Okazaki, A.; Tsai, H.; Hosokawa, K.; Mackin, C.; Nomura, A.; Yasuda, T.; Demarest, J.; Brew, K. W.; Chan, V.; Choi, S.; Gordon, T.; Levin, T. M.; Friz, A.; Ishii, M.; Kohda, Y.; Chen, A.; Fasoli, A.; Luquin, J.; Saulnier, N.; Teehan, S.; Ahsan, I.; Narayanan, V.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Academic Journal
In: Palliative and Supportive Care . (Palliative and Supportive Care, 2024)
Academic Journal
Rasch, M.J.; Li, N.; Narayanan, V.; Mackin, C.; Chen, A.; Fasoli, A.; Narayanan, P.; Tsai, H.; Burr, G.W.; Le Gallo, M.; Odermatt, F.; Nandakumar, S.R.; Sebastian, A.
In: Nature Communications . (Nature Communications, December 2023, 14(1))
Conference
Bruce, R.L.; Sarwat, S. Ghazi; Boybat, I.; Cheng, C.-W.; Kim, W.; Nandakumar, S.R.; Mackin, C.; Philip, T.; Liu, Z.; Brew, K.; Gong, N.; Ok, I.; Adusumilli, P.; Spoon, K.; Ambrogio, S.; Kersting, B.; Bohnstingl, T.; Gallo, M. Le; Simon, A.; Li, N.; Saraf, I.; Han, J.-P.; Gignac, L.; Papalia, J.M.; Yamashita, T.; Saulnier, N.; Burr, G. W.; Tsai, H.; Sebastian, A.; Narayanan, V.; BrightSky, M.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
Academic Journal
Narayanan, P.; Ambrogio, S.; Okazaki, A.; Hosokawa, K.; Tsai, H.; Nomura, A.; Yasuda, T.; Mackin, C.; Lewis, S.C.; Friz, A.; Ishii, M.; Kohda, Y.; Mori, H.; Spoon, K.; Khaddam-Aljameh, R.; Saulnier, N.; Bergendahl, M.; Demarest, J.; Brew, K.W.; Chan, V.; Choi, S.; Ok, I.; Ahsan, I.; Lie, F.L.; Haensch, W.; Narayanan, V.; Burr, G.W.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(12):6629-6636 Dec, 2021
Academic Journal
Ambrogio, S.; Narayanan, P.; Fasoli, A.; Mackin, C.; Chen, A.; Friz, A.; Luquin, J.; Tsai, H.; Burr, G.W.; Okazaki, A.; Hosokawa, K.; Nomura, A.; Yasuda, T.; Ishii, M.; Kohda, Y.; Saulnier, N.; Brew, K.; Choi, S.; Ok, I.; Philip, T.; Chan, V.; Silvestre, C.; Ahsan, I.; Narayanan, V.
In: Nature . (Nature, 24 August 2023, 620(7975):768-775)
Academic Journal
Kariyappa, S.; Tsai, H.; Spoon, K.; Ambrogio, S.; Narayanan, P.; Mackin, C.; Chen, A.; Qureshi, M.; Burr, G.W.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(9):4356-4362 Sep, 2021
Academic Journal
Li, N.; Brew, K.; Philip, T.; Simon, A.; Saraf, I.; Saulnier, N.; Han, J.-P.; Rasch, M.; Narayanan, V.; Mackin, C.; Chen, A.; Burr, G.W.; Sarwat, S.G.; Sebastian, A.
In: Advanced Electronic Materials . (Advanced Electronic Materials, June 2023, 9(6))
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[AR] Mackin, C.
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