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Aguilar, JA; Anker, A; Allison, P; Archambault, S; Baldi, P; Barwick, SW; Beatty, JJ; Beise, J; Besson, D; Bishop, A; Bondarev, E; Botner, O; Bouma, S; Buitink, S; Cataldo, M; Chen, CC; Chen, CH; Chen, P; Chen, YC; Choi, T; Clark, BA; Clay, W; Curtis-Ginsberg, Z; Connolly, A; Cremonesi, L; Dasgupta, P; Davies, J; de Kockere, S; de Vries, KD; Deaconu, C; DuVernois, MA; Flaherty, J; Friedman, E; Gaior, R; Gaswint, G; Glaser, C; Hallgren, A; Hallmann, S; Ham, Y-B; Hanson, JC; Harty, N; Hendricks, B; Hoffman, KD; Hong, E; Hornhuber, C; Hsu, SY; Hu, L; Huang, JJ; Huang, M-H; Hughes, K; Ishihara, A; Jee, G; Jung, J; Karle, A; Kelley, JL; Klein, SR; Kleinfelder, SA; Kim, J; Kim, K-C; Kim, M-C; Kravchenko, I; Krebs, R; Ku, Y; Kuo, CY; Kurusu, K; Kwon, Hyuck-Jin; Lahmann, R; Landsman, H; Latif, U; Lee, C; Leung, C-H; Li, C-J; Liu, J; Liu, T-C; Lu, M-Y; Madison, K; Mammo, J; Mase, K; McAleer, S; Meures, T; Meyers, ZS; Michaels, K; Mikhailova, M; Mulrey, K; Nam, J; Nichol, RJ; Nir, G; Nelles, A; Novikov, A; Nozdrina, A; Oberla, E; Oeyen, B; Osborn, J; Pan, Y; Pandya, H; Paul, MP; Persichilli, C; Pfendner, C; Plaisier, I; Punsuebsay, N
Academic Journal
Aguilar, J. A.; Anker, A.; Allison, P.; Archambault, S.; Baldi, P.; Barwick, S. W.; Beatty, J. J.; Beise, J.; Besson, D.; Bishop, A.; Bondarev, E.; Botner, O.; Bouma, S.; Buitink, S.; Cataldo, M.; Chen, C. C.; Chen, C. H.; Chen, P.; Chen, Y. C.; Choi, T.; Clark, B. A.; Clay, W.; Curtis-Ginsberg, Z.; Connolly, A.; Cremonesi, L.; Dasgupta, P.; Davies, J.; de Kockere, S.; de Vries, K. D.; Deaconu, C.; DuVernois, M. A.; Flaherty, J.; Friedman, E.; Gaior, R.; Gaswint, G.; Glaser, C.; Hallgren, A.; Hallmann, S.; Ham, Y-B; Hanson, J. C.; Harty, N.; Hendricks, B.; Hoffman, K. D.; Hong, E.; Hornhuber, C.; Hsu, S. Y.; Hu, L.; Huang, J. J.; Huang, M-H; Hughes, K.; Ishihara, A.; Jee, G.; Jung, J.; Karle, A.; Kelley, J. L.; Klein, S. R.; Kleinfelder, S. A.; Kim, J.; Kim, K-C; Kim, M-C; Kravchenko, I; Krebs, R.; Ku, Y.; Kuo, C. Y.; Kurusu, K.; Kwon, Hyuck-Jin; Lahmann, R.; Landsman, H.; Latif, U.; Lee, C.; Leung, C-H; Li, C-J; Liu, J.; Liu, T-C; Lu, M-Y; Madison, K.; Mammo, J.; Mase, K.; McAleer, S.; Meures, T.; Meyers, Z. S.; Michaels, K.; Mikhailova, M.; Mulrey, K.; Nam, J.; Nichol, R. J.; Nir, G.; Nelles, A.; Novikov, A.; Nozdrina, A.; Oberla, E.; Oeyen, B.; Osborn, J.; Pan, Y.; Pandya, H.; Paul, M. P.; Persichilli, C.; Pfendner, C.; Plaisier, I; Punsuebsay, N.; Pyras, L.; Rice-Smith, R.; Roth, J.; Ryckbosch, D.; Scholten, O.; Seckel, D.; Seikh, M. F. H.; Shiao, Y-S; Shin, B-K; Shultz, A.; Smith, D.; Southall, D.; Tatar, J.; Torres, J.; Toscano, S.; Tosi, D.; Touart, J.; Van den Broeck, D. J.; van Eijndhoven, N.; Varner, G. S.; Vieregg, A. G.; Wang, M-Z; Wang, S-H; Wang, Y. H.; Welling, C.; Williams, D. R.; Wissel, S.; Xie, C.; Yoshida, S.; Young, R.; Zhao, L.; Zink, A.
Academic Journal
Academic Journal
Journal of Physics: A Mathematical & General; 10/6/2000, Vol. 33 Issue 39, p1-1, 1p
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[AR] Leung, C-H
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