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Academic Journal
Kim, Okhyeon; Kim, Yewon; Kim, Hye-Lee; Wu, Zhe; Park, Chang Yup; Ahn, Dong-Ho; Kuh, Bong Jin; Lee, Won-Jun
In Surfaces and Interfaces October 2024 53
Academic Journal
Jeong, Joo Hee; Seo, Seung Wan; Kim, Dongseon; Yoon, Seong Hun; Lee, Seung Hee; Kuh, Bong Jin; Kim, Taikyu; Jeong, Jae Kyeong
Conference
Park, Jaehyun; Kim, Wukang; Park, Sungil; Yun, Jinchan; Hwang, Kyuman; Yang, Jinwook; Kim, Dahye; Jeong, Jae Won; Yun, Chuljin; Bae, Jinho; Park, Jejune; Park, Sam; Huh, Woong; Huh, Daihong; Yang, Suk; Lee, Junghan; Seo, Jaehoon; Kim, Ajeong; Oh, Kyungseok; Yoo, Donggon; Kuh, Bong Jin; Ha, Daewon; Shin, Yu Gyun; Song, Jaihyuk
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Conference
Myeong, Ilho; Lim, Suhwan; Kim, Taeyoung; Park, Sanghyun; Noh, Suseong; Lee, Seung Min; Woo, Jongho; Ko, Hanseung; Noh, Youngji; Choi, Munkang; Lee, Kiheun; Han, Sangwoo; Baek, Jongyeon; Kim, Kijoon; Jung, Dongjin; Kim, Jisung; Park, Jaewoo; Kim, Seunghyun; Kim, Hyoseok; Yoon, Ilyounz; Kim, Jaeho; Kim, Kwangsoo; Park, Kwangmin; Kuh, Bong Jin; Kim, Wanki; Ha, Daewon; Ahn, Sujin; Song, Jaihyuk; Yoo, Sijung; Lee, Hyun Jae; Choe, Duk-Hyun; Nam, Seung-Geol; Heo, Jinseong
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :9B.3-1-9B.3-6 Apr, 2024
Conference
Kim, Taeyoung; Lim, Suhwan; Myeong, Ilho; Park, Sanghyun; Noh, Suseong; Lee, Seung Min; Woo, Jongho; Ko, Hanseung; Noh, Youngji; Choi, Moonkang; Lee, Kiheun; Han, Sangwoo; Baek, Jongyeon; Kim, Kijoon; Jung, Dongjin; Kim, Ji-sung; Park, Jaewoo; Kim, Seunghyun; Kim, Hyoseok; Yoo, Sijung; Lee, Hyun Jae; Choe, Duk-Hyun; Nam, Seung-Geol; Yoon, Ilyoung; Kim, Chaeho; Kim, Kwanzsoo; Park, Kwanzmin; Kuh, Bong Jin; Heo, Jinseong; Kim, Wanki; Ha, Daewon; Song, Jaihyuk
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :P6.EM-1-P6.EM-4 Apr, 2024
Design Guidelines of Thermally Stable Hafnia Ferroelectrics for the Fabrication of 3D Memory Devices
Conference
Kim, Giuk; Shin, Hunbeom; Eom, Taehyong; Jung, Minhyun; Kim, Taeho; Lee, Sangho; Kim, Minki; Jeong, Yeongseok; Kim, Ji-Sung; Nam, Kab-Jin; Kuh, Bong Jin; Jeon, Sanghun
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :5.4.1-5.4.4 Dec, 2022
Academic Journal
Kim, Okhyeon; Kim, Yewon; Kim, Hye-Lee; Wu, Zhe; Park, Chang Yup; Ahn, Dong-Ho; Kuh, Bong Jin; Lee, Won-Jun
Periodical
IEEE Electron Device Letters; 2024, Vol. 45 Issue: 5 p849-852, 4p
Academic Journal
Park, Ju Yong; Choe, Duk‐Hyun; Lee, Dong Hyun; Yu, Geun Taek; Yang, Kun; Kim, Se Hyun; Park, Geun Hyeong; Nam, Seung‐Geol; Lee, Hyun Jae; Jo, Sanghyun; Kuh, Bong Jin; Ha, Daewon; Kim, Yongsung; Heo, Jinseong; Park, Min Hyuk
Advanced Materials; 10/26/2023, Vol. 35 Issue 43, p1-26, 26p
Academic Journal
Kim, Taikyu; Choi, Cheol Hee; Hur, Jae Seok; Ha, Daewon; Kuh, Bong Jin; Kim, Yongsung; Cho, Min Hee; Kim, Sangwook; Jeong, Jae Kyeong
Advanced Materials; 10/26/2023, Vol. 35 Issue 43, p1-50, 50p
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[AR] Kuh, Bong Jin
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