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Academic Journal
In Journal of Materials Processing Tech. 31 October 2000 106(1-3):68-73
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Adams, R; Bahnson, M; Bhaduri, S; Adams, T; Bairaktarova, D; Bielefeldt, A; Aguirre-Munoz, Z; Balakrishnan, B; Blosser, EG; Ahn, B; Beagon, U; Bodnar, C; Aleong, R; Becker, K; Borgford-Parnell, J; Amelink, C; Beddoes, K; Maura, B; Anderson, R; Bego, C; Bowe, B; Andrews, CJ; Beigpourian, B; Bowen, B; Angel, J; Bekki, J; Boyd, J; Fonseca, MA; Bennett, D; Bradburn, I; Kranov, AA; Berdanier, C; Brady, C; Bae, CL; Bernhard, J; Brawner, C; Brose, A; Case, J; Cropley, D; Brown, F; Cassady, R; Cross, K; Brown, P; Celik, S; Cunningham, P; Ben, C; Cutler, S; Brown, S; Chance, SM; Dabbagh, N; Brozina, C; Chen, H; Dallal, A; Brunhaver, S; Chen, O; Daly, S; Bryant, A; Cheville, RA; Daniel, S; Bucciarelli, L; Chiu, J; Danowitz, A; Burkholder, E; Choe, NH; Darolia, R; Burks, G; Clark, R; Davis, K; Burt, B; Clevenger, C; Davis, S; Canney, N; Cole, J; de Jong, T; Cao, Y; Coley, B; De Vries, C; Caratozzolo, P; Cooper, L; Delaine, D; Carballo, R; Cooper, M; DeMonbrun, R; Cardella, M; Craig, T; Denton, M; Di Stefano, M; Erdman, AM; Gilmartin, S; DiBiasio, D; Eris, O; Gladstone, J; Diefes-Dux, H; Evangelou, D; Glancy, A; Dika, S; Ewen, B; Godwin, A; Direito, I; Faber, C; Goldsmith, R; Dohn, N; Falconer, J; Grigg, SJ; Dolansky, M; Fantz, T; Grohs, J; Faulkner, B; Doom, D; Felder, R; Gummer, E; Douglas, E; Ferris, T; Guzey, S; Douglas, KA; Figueiredo, J; Hadgraft, R; Dounas-Frazer, D; Fiorella, L; Hammack, R; Dringenberg, E; Flores, L; Han, K; Duffy, G; Fong, C; Harding, T; Easley, D; Fowler, RR; Harper, K; Eccles, J; Friedrichsen, D; Hartmann, B; Edstrom, K; Ge, J; Hattingh, T; Ellestad, R; Gelles, L; Henderson, R; Henderson, TS; Immekus, J; Kamphorst, J; Herman, G; Inda, M; Karatas, F; Hess, J; Itabashi-Campbell, R; Kartal, O; Hieb, J; Jackson, A; Karwat, D; Higbee, S; Jankowski, N; Katz, A; Hilton, E; Javernick-Will, A; Keipi, T; Hira, A; Jensen, KJ; Kim, D; Hirshfield, L; Smith, J; Kirn, A; Knaphus-Soran, E; Holly, J; Jesiek, B; Knight, D; Horng, S-M; Johnson, A; Knott, T; Huang-Saad, A; Johnson, B; Kohl, P; Huerta, M; Johri, A; Kohtala, C; Huff, J; Jones, B; Komives, S; Hughes, B; Jones, L; Korsunskiy, E; Hughes, R; Jones, T; Kotys-Schwartz, D; Hunsu, N; Kaminski, J; Kramer, J; Hunter, C; Kampe, J-C; Inkelas, KK; Lamm, M; Lonngren, J; McCall, C; Lande, M; Lottero-Perdue, PS; McCave, E; Lappalainen, P; Aguilar, JFL; McCray, E; Lawanto, O; Lucena, J; McGee, E; Lawson, J; Luk, LYY; McGough, C; Leath, S; Lutz, B; McGowan, V; Lee, D; Ma, Y; McNair, LD; Lee, W; Madon, T; McNaughtan, J; Liberatore, M; Mamaril, N; McNeill, N; Lichtenstein, G; Mangiante, E; Mejia, J; Lima, M; Martin, B; Diaz, NM; Lima, RM; Martin, K; Menekse, M; Lin, J; Lippard, C; Mones, AM; Mesquita, DIDA; Michell, K; Litzler, E; Matthews, M; Miller, S; Lo, CK; Matusovich, H; Minichiello, A; London, J; Maynard, N; Miskioglu, EE; Longwell-Grice, R; Mazzurco, A; Yusof, KM; Mohedas, I; Nghia, TLH; Pearson, A; Monat, J; Norton, P; Pearson, N; Monteiro, F; Novoselich, BJ; Pembridge, J; Moote, J; Noy, S; Perez-Felkner, L; Mora, M; O'Hara, R; Perkins, H; O'Moore, L; Peters-Burton, E; Morgan, D; Ohland, M; Pfirman, A; Morgan, T; Okai, B; Pinto, C; Morton, T; Olds, B; Pitterson, N; Mosyjowski, E; Orr, M; Polmear, M; Murphy, T; Ortega-Alvarez, JD; Prince, T; Murray, J; Oseguera, L; Purzer, S; Murzi, H; Owen, C; Quan, GM; Nagy, G; Ozkan, DS; Quillin, K; Natarajathinam, M; Panther, G; Rayess, N; Nelson, M; Patrick, A; Reed, T; Newberry, B; Paul, K; Reeping, D; Newstetter, W; Pawley, A; Reese, M; Reid, K; Rulifson, G; Shivy, V; Renn, K; Rynearson, AM; Simpson, Z; Ricco, G; Sanchez-Pena, ML; Sitomer, A; Richards, L; Saunders-Smits, G; Siverling, E; Rios, L; Sax, L; Slaton, A; Ro, HK; Schimpf, C; Sleezer, R; Roberts, D; Rodgers, K; Schippers, M; Smith-On, C; Rodriguez, S; Schnittka, C; Schunn, C; Rogers, C; Seah, LH; Rohde, J; Rohrer, D; Secules, S; Smith, K; Smith, N; Romine, W; Seifert, C; Sochacka, N; Ross, L; Sessa, V; Stearns, E; Ross, M; Sharp, H; Steif, M; Rottmann, C; Sharp, J; Stephan, P; Rucks, L; Shaw, C; Stevens, R; Streveler, R; Tolbert, D; van Der Marel, F; Strobel, J; Toraman, S; van Hattum, N; Stump, G; Tougaw, D; Verdin, D; Su, X; Trautvetter, LC; Verleger, M; Sundararaja, N; Trenshaw, KF; Vieira, C; Trevelyan, J; Svihla, V; Troussas, C; Villanueva, I; Swan, C; Tsai, J; Vinck, D; Virguez, L; Swanson, R; Tsugawa, MA; Vitasari, P; Sweeny, K; Tuononen, T; Vossoughi, S; Swenson, J; Turner, J; Wallin, P; Talley, K; Turner, S; Tan, L; Tyson, W; Watted, A; Tang, Y; Utley, J; Webber, K; Tank, K; Vasquez, RV; Weintrop, D; Thomas, K; Valdivia, A; Weiss, E; Thompson, JD; Valentine, A; West, R; Tierney, G; Van den Bogaard, M; Wiles, D; Wilson-Lopez, AA; Xinrui, X; Zastavker, Y; Wilson, D; Xu, YJ; Zhang, G; Wolmarans, N; Yang, Y; Zhu, J; Wong, R; Yi, S; Zoltowski, CB; Woollacott, L; Yoon, SY
Academic Journal
Journal of Physics: Conference Series; 2013, Vol. 460 Issue 1, p012004-012007, 4p
Academic Journal
The Journal of Investigative Dermatology. May 01, 2005 124 Suppl 4:A90-A90
Academic Journal
Llewellyn, E J; Lloyd, N D; Degenstein, D A; Gattinger, R L; Petelina, S V; Bourassa, A E; Wiensz, J T; Ivanov, E V; McDade, I C; Solheim, B H; McConnell, J C; Haley, C S; von Savigny, C; Sioris, C E; McLinden, C A; Griffioen, E; Kaminski, J; Evans, W FJ; Puckrin, E; Strong, K; Wehrle, V; Hum, R H; Kendall, D JW; Matsushita, J; Murtagh, D P; Brohede, S; Stegman, J; Witt, G; Barnes, G; Payne, W F; Piché, L; Smith, K; Warshaw, G; Deslauniers, D-L; Marchand, P; Richardson, E H; King, R A; Wevers, I; McCreath, W; Kyrölä, E; Oikarinen, L; Leppelmeier, G W; Auvinen, H; Mégie, G; Hauchecorne, A; Lefèvre, F; de La Nöe, J; Ricaud, P; Frisk, U; Sjoberg, F; von Schéele, F; Nordh, L
Canadian Journal of Physics. Jun 01, 2004 82(6):411-422
Academic Journal
Journal of Physics B: Atomic & Molecular Physics; Apr1971, Vol. 4 Issue 4, p609-620, 12p
Periodical
Proceedings of the Institution of Mechanical Engineers -- Part B -- Engineering Manufacture (Professional Engineering Publishing); 2000, Vol. 214 Issue 7, p529-534, 6p
Electronic Resource
Anastassopoulos, V.; Aune, S.; Barth, K.; Belov, A.; Bräuninger, H.; Cantatore, G.; Carmona, J. M.; Castel, J. F.; Cetin, S. A.; Christensen, Finn Erland; Collar, J. I.; Dafni, T.; Davenport, M.; Decker, T. A.; Dermenev, A.; Desch, K.; Eleftheriadis, C.; Fanourakis, G.; Ferrer-Ribas, E.; Fischer, H.; García, J. A.; Gardikiotis, A.; Garza, J. G.; Gazis, E. N.; Geralis, T.; Giomataris, I; Gninenko, S.; Hailey, C. J.; Hasinoff, M. D.; Hoffmann, D H H; Iguaz, F. J.; Irastorza, I G; Jakobsen, A.; Jacoby, J.; Jakovčić, K; Kaminski, J; Karuza, M.; Kralj, N.; Krčmar, M; Kostoglou, S.; Krieger, Ch.; Lakić, B; Laurent, J. M.; Liolios, A.; Ljubicic, A.; Luzón, G.; Maroudas, M.; Miceli, L.; Neff, S.; Ortega, I.; Papaevangelou, T; Paraschou, K.; Pivovaro, M. J.; Raffelt, G; Rosu, M.; Ruz, J; Ruiz Chóliz, E.; Savvidis, I; Schmidt, S.; Semertzidis, Y. K.; Solanki, S. K.; Stewart, L.; Vafeiadis, T; Vogel, J. K.; Yildiz, S. C.; Zioutas, K
Anastassopoulos , V , Aune , S , Barth , K , Belov , A , Bräuninger , H , Cantatore , G , Carmona , J M , Castel , J F , Cetin , S A , Christensen , F E , Collar , J I , Dafni , T , Davenport , M , Decker , T A , Dermenev , A , Desch , K , Eleftheriadis , C , Fanourakis , G , Ferrer-Ribas , E , Fischer , H , García , J A , Gardikiotis , A , Garza , J G , Gazis , E N , Geralis , T , Giomataris , I , Gninenko , S , Hailey , C J , Hasinoff , M D , Hoffmann , D H H , Iguaz , F J , Irastorza , I G , Jakobsen , A , Jacoby , J , Jakovčić , K , Kaminski , J , Karuza , M , Kralj , N , Krčmar , M , Kostoglou , S , Krieger , C , Lakić , B , Laurent , J M , Liolios , A , Ljubicic , A , Luzón , G , Maroudas , M , Miceli , L , Neff , S , Ortega , I , Papaevangelou , T , Paraschou , K , Pivovaro , M J , Raffelt , G , Rosu , M , Ruz , J , Ruiz Chóliz , E , Savvidis , I , Schmidt , S , Semertzidis , Y K , Solanki , S K , Stewart , L , Vafeiadis , T , Vogel , J K , Yildiz , S C & Zioutas , K 2017 , ' New CAST limit on the axion–photon interaction ' , Nature Physics , vol. 13 , pp. 584-591 .
Periodical
Proceedings of the Institution of Mechanical Engineers -- Part B -- Engineering Manufacture (Professional Engineering Publishing); 1999, Vol. 213 Issue 8, p761-767, 7p
Periodical
Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture; May 1994, Vol. 208 Issue: 2 p141-152, 12p
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[AR] Kaminski, J
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