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Clark, D.M.; Eikenberry, S.S.; Raines, S.N.; Gruel, N.; Elston, R.; Guzman, R.; Julian, J.; Boreman, G.; Glenn, P.E.; Hull-Allen, C.G.; Hoffman, J.; Rodgers, M.; Thompson, K.; Flint, S.; Comstock, L.; Myrick, B.
In New Astronomy Reviews 2006 50(4):433-435
Academic Journal
In: Electronics Letters . (Electronics Letters, 21 July 1994, 30(15):1229-1230)
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In: Proceedings of SPIE - The International Society for Optical Engineering , Astronomical Interferometry. (Proceedings of SPIE - The International Society for Optical Engineering, 1998, 3350:588-594)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Three-Dimensional Imaging and Laser-based Systems for Metrology and Inspection III. (Proceedings of SPIE - The International Society for Optical Engineering, 1997, 3204:81-89)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 2 January 1990, 1165:270-282)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 1990, 1333:386-400)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering . (Proceedings of SPIE - The International Society for Optical Engineering, 28 July 1989, 1160:465-480)
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[AR] Hull-Allen, C.G.
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