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Investigation of Channel Dimension Dependence of BTI Degradation and Variation in Planar HKMG MOSFET
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2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023
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2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :4C.5-1-4C.5-6 Mar, 2022
Academic Journal
Academic Journal
Feng, X. Y.; Cui, D. D.; Zeng, L. J.; Wu, Z. X.; Xie, X. X.; Zhang, J. S.; Huang, J. L.; Zhang, X. Y.
Academic Journal
Academic Journal
Academic Journal
Academic Journal
Conference
IEEE 10th International Conference on Industrial Informatics Industrial Informatics (INDIN), 2012 10th IEEE International Conference on. :540-545 Jul, 2012
Academic Journal
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[AR] Huang, J. L.
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