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Eigenanalysis of morphological diversity in silicon random nanostructures formed via resist collapse
Academic Journal
Naruse, Makoto; Hoga, Morihisa; Ohyagi, Yasuyuki; Nishio, Shumpei; Tate, Naoya; Yoshida, Naoki; Matsumoto, Tsutomu
In Physica A: Statistical Mechanics and its Applications 15 November 2016 462:883-888
Academic Journal
In Sensors & Actuators: A. Physical 1 June 2014 212:87-92
Academic Journal
Hoga, Morihisa; Itoh, Kimio; Ishikawa, Mikio; Kuwahara, Naoko; Fukuda, Masaharu; Toyama, Nobuhito; Kurokawa, Syuhei; Doi, Toshiro
In Microelectronic Engineering August 2011 88(8):1975-1977
Academic Journal
Fujita, Hiroshi; Ishikawa, Mikio; Kuwahara, Naoko; Fukuda, Masaharu; Sakaki, Masashi; Takikawa, Tadahiko; Sano, Hisatake; Hoga, Morihisa; Hayashi, Naoya
In Microelectronic Engineering 2008 85(7):1514-1517
Academic Journal
Kurihara, Masaaki; Abe, Makoto; Suzuki, Katsutoshi; Yoshida, Kouji; Shimomura, Takeya; Hoga, Morihisa; Mohri, Hiroshi; Hayashi, Naoya
In Microelectronic Engineering 2007 84(5):999-1002
Academic Journal
Sano, Hisatake; Kuwahara, Naoko; Kitada, Minoru; Yusa, Satoshi; Fujita, Horoshi; Takikawa, Tadahiko; Hoga, Morihisa
In Microelectronic Engineering 2007 84(5):825-828
Report
Matsumoto, Tsutomu; Hoga, Morihisa; Ohyagi, Yasuyuki; Ishikawa, Mikio; Naruse, Makoto; Hanaki, Kenta; Suzuki, Ryosuke; Sekiguchi, Daiki; Tate, Naoya; Ohtsu, Motoichi
Scientific Reports, Vol. 4, Article No. 6142 (2014)
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[AR] Hoga, Morihisa
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