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Academic Journal
In: Journal of Laser Micro Nanoengineering . (Journal of Laser Micro Nanoengineering, 2024, 19(1):10-19)
Academic Journal
In: Journal of Laser Micro Nanoengineering . (Journal of Laser Micro Nanoengineering, 2024, 19(1):79-84)
Academic Journal
In: Journal of Laser Applications . (Journal of Laser Applications, 1 November 2023, 35(4))
Academic Journal
Caballero-Folch, R.; Domingo-Pardo, C.; Cortès, G.; Taín, J.L.; Agramunt, J.; Algora, A.; Ameil, F.; Ayyad, Y.; Benlliure, J.; Bowry, M.; Calviño, F.; Cano-Ott, D.; Davinson, T.; Dillmann, I.; Estrade, A.; Evdokimov, A.; Faestermann, T.; Farinon, F.; Galaviz, D.; García-Ríos, A.; Geissel, H.; Gelletly, W.; Gernhäuser, R.; Gómez-Hornillos, M.B.; Guerrero, C.; Heil, M.; Hinke, C.; Knöbel, R.; Kojouharov, I.; Kurcewicz, J.; Kurz, N.; Litvinov, Y.; Maier, L.; Marganiec, J.; Marta, M.; Martínez, T.; Montes, F.; Mukha, I.; Napoli, D.R.; Nociforo, C.; Paradela, C.; Pietri, S.; Podolyák, Zs.; Prochazka, A.; Rice, S.; Riego, A.; Rubio, B.; Schaffner, H.; Scheidenberger, C.; Smith, K.; Sokol, E.; Steiger, K.; Sun, B.; Takechi, M.; Testov, D.; Weick, H.; Wilson, E.; Winfield, J.S.; Wood, R.; Woods, P.J.; Yeremin, A.
In Nuclear Data Sheets June 2014 120:81-83
Conference
Piller, F. T.; Poprawe, R.; Schleifenbaum, H. J.; Schuh, G.; Barg, S.; Dolle, C.; Hinke, C.; Jank, M.-H.; Jiang, R.; Meiners, W.; Riesener, M.; Schrage, J.; Ziegler, S.
2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2018 IEEE International Conference on. :1730-1735 Dec, 2018
Academic Journal
Grawe, H.; Straub, K.; Faestermann, T.; Górska, M.; Hinke, C.; Krücken, R.; Nowacki, F.; Böhmer, M.; Boutachkov, P.; Geissel, H.; Gernhäuser, R.; Gottardo, A.; Grȩbosz, J.; Kurz, N.; Liu, Z.; Maier, L.; Pietri, S.; Podolyák, Zs.; Steiger, K.; Weick, H.; Wollersheim, H.J.; Woods, P.J.; Al-Dahan, N.; Alkhomashi, N.; Ataç, A.; Blazhev, A.; Braun, N.; Čeliković, I.; Davinson, T.; Dillmann, I.; Domingo-Pardo, C.; Doornenbal, P.; Farrelly, G.; Farinon, F.; de France, G.; Gerl, J.; Goel, N.; Habermann, T.; Hoischen, R.; Janik, R.; Karny, M.; Kaşkaş, A.; Kojouharov, I.; Kröll, Th.; Lewitowicz, M.; Litvinov, Yu.A.; Myalski, S.; Nebel, F.; Nishimura, S.; Nociforo, C.; Nyberg, J.; Parikh, A.; Procházka, A.; Regan, P.H.; Rigollet, C.; Schaffner, H.; Scheidenberger, C.; Schwertel, S.; Söderström, P.-A.; Steer, S.; Stolz, A.; Strmeň, P.
In Physics Letters B 10 September 2021 820
Report
Caballero-Folch, R.; Domingo-Pardo, C.; Agramunt, J.; Algora, A.; Ameil, F.; Ayyad, Y.; Benlliure, J.; Bowry, M.; Calviño, F.; Cano-Ott, D.; Cortès, G.; Davinson, T.; Dillmann, I.; Estrade, A.; Evdokimov, A.; Faestermann, T.; Farinon, F.; Galaviz, D.; García, A. R.; Geissel, H.; Gelletly, W.; Gernhäuser, R.; Gómez-Hornillos, M. B.; Guerrero, C.; Heil, M.; Hinke, C.; Knöbel, R.; Kojouharov, I.; Kurcewicz, J.; Kurz, N.; Litvinov, Yu. A.; Maier, L.; Marganiec, J.; Marta, M.; Martínez, T.; Montes, F.; Mukha, I.; Napoli, D. R.; Nociforo, C.; Paradela, C.; Pietri, S.; Podolyák, Zs.; Prochazka, A.; Rice, S.; Riego, A.; Rubio, B.; Schaffner, H.; Scheidenberger, Ch.; Smith, K.; Sokol, E.; Steiger, K.; Sun, B.; Taín, J. L.; Takechi, M.; Testov, D.; Weick, H.; Wilson, E.; Winfield, J. S.; Wood, R.; Woods, P. J.; Yeremin, A.
Phys. Rev. C 95, 064322 (2017)
Conference
In: Procedia CIRP , 13th CIRP Conference on Photonic Technologies, LANE 2024. (Procedia CIRP, 2024, 124:803-806)
Conference
In: 2024 International Conference on Control, Automation and Diagnosis, ICCAD 2024 , 2024 International Conference on Control, Automation and Diagnosis, ICCAD 2024. (2024 International Conference on Control, Automation and Diagnosis, ICCAD 2024, 2024)
Conference
In: 2024 International Conference on Control, Automation and Diagnosis, ICCAD 2024 , 2024 International Conference on Control, Automation and Diagnosis, ICCAD 2024. (2024 International Conference on Control, Automation and Diagnosis, ICCAD 2024, 2024)
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