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Academic Journal
Burgos, M.A.; Rosique, Lina; Piqueras, F.; García-Navalón, C.; Sevilla-García, M.A.; Hellín, D.; Esteban, F.
In Heliyon 15 March 2024 10(5)
Academic Journal
In: Energy Policy . (Energy Policy, September 2022, 168)
Academic Journal
Leys, F.E.; Bonzom, R.; Kaczer, B.; Janssens, T.; Vandervorst, W.; De Jaeger, B.; Van Steenbergen, J.; Martens, K.; Hellin, D.; Rip, J.; Dilliway, G.; Delabie, A.; Zimmerman, P.; Houssa, M.; Theuwis, A.; Loo, R.; Meuris, M.; Caymax, M.; Heyns, M.M.
In Materials Science in Semiconductor Processing 2006 9(4):679-684
Academic Journal
Sepulveda, A.; Zhang, L.; Kenis, K.; Batuk, D.; Baudot, S.; Briggs, B.; Sanchez, E.A.; Barla, K.; Morin, P.; Hellin, D.; Mountsier, T.
In: Materials Science in Semiconductor Processing . (Materials Science in Semiconductor Processing, April 2022, 141)
Academic Journal
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 5(4):639-651 Dec, 2005
Conference
Mertens, P.W.; Vereecke, G.; Vos, R.; Arnauts, S.; Barbagini, F.; Bearda, T.; Degendt, S.; Demaco, C.; Eitoku, A.; Frank, M.; Fyen, W.; Hall, L.; Hellin, D.; Holsteyns, F.; Kesters, E.; Claes, M.; Kim, K.; Kenis, K.; Kraus, H.; Hoyer, R.; Le, T.Q.; Lux, M.; Lee, K.-T.; Kocsis, M.; Kotani, T.; Malhouitre, S.; Muscat, A.; Onsia, B.; Garaud, S.; Rip, J.; Sano, K.; Sioncke, S.; Snow, J.; Hoeymissen, J.V.; Wostyn, K.; Xu, K.; Parachiev, V.; Heyns, M.
2006 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2006 International Symposium on. :1-4 Apr, 2006
Academic Journal
In: European Journal of Case Reports in Internal Medicine . (European Journal of Case Reports in Internal Medicine, 2018, 5(6))
Academic Journal
In: Journal of Micro/ Nanolithography, MEMS, and MOEMS . (Journal of Micro/ Nanolithography, MEMS, and MOEMS, 5 March 2015, 14(1))
Academic Journal
Xu, K.; Souriau, L.; Versluijs, J.; Wong, P.; Vangoidsenhoven, D.; Vandenbroeck, N.; Dekkers, H.; Shi, X.; Albert, J.; Tan, C.L.; Wiaux, V.; Boullart, W.; Hellin, D.; Vertommen, J.; Coenegrachts, B.; Orain, I.; Kimura, Y.
In: Journal of Micro/Nanolithography, MEMS, and MOEMS . (Journal of Micro/Nanolithography, MEMS, and MOEMS, 2013, 12(4))
Academic Journal
In: Microelectronic Engineering . (Microelectronic Engineering, January 2011, 88(1):21-27)
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[AR] Hellín, D.
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