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Hafez, W.; Agnihotri, P.; Asoro, M.; Aykol, M.; Bains, B.; Bambery, R.; Bapna, M.; Barik, A.; Chatterjee, A.; Chiu, P.C.; Chu, T.; Firby, C.; Fischer, K.; Fradkin, M.; Greve, H.; Gupta, A.; Haralson, E.; Haran, M.; Hicks, J.; Illa, A.; Jang, M.; Klopcic, S.; Kobrinsky, M.; Kuns, B.; Lai, H.-h.; Lanni, G.; Lee, S.-H.; Lindert, N.; Lo, C.-l.; Luo, Y.; Malyavanatham, G.; Marinkovic, B.; Maymon, Y.; Nabors, M.; Neirynck, J.; Packan, P.; Paliwal, A.; Pantisano, L.; Paulson, L.; Penmatsa, P.; Prasad, C.; Puls, C.; Rahman, T.; Ramaswamy, R.; Samant, S.; Sell, B.; Sethi, K.; Shah, F.; Shamanna, M.; Shang, K.; Li, Q.; Sibakoti, M.; Stoeger, J.; Strutt, N.; Thirugnanasambandam, R.; Tsai, C.; Wang, X.; Wang, A.; Wu, S.-j.; Xu, Q.; Zhong, X.-h.; Natarajan, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Shamanna, M.; Abuayob, E.; Aenuganti, G.; Alvares, C.; Antony, J.; Bahudhanam, A.; Chandran, A.; Chew, P.; Chatterjee, A.; Chauhan, B.; Dandeti, N.; Desai, J.; Doyle, M.; Dmukauskas, T.; Farache, P.; Fetzer, E.; Fischer, K.; Hack, P.; Greenzweig, Y.; Giacobbe, J.; Hafez, W.; Haralson, E.; Hegde, A.; Illa, A.; Islam, M.; Jain, S.; Jang, M.; Nguyen, J.; Tong, T.; Jiang, L.; Karl, E.; Kalangi, P.; Khoo, G.; Krishnamoorthy, A.; Kuns, B.; Li, W.; Livengood, R.; Malik, T.; Priyanka, R.; Faraby, H.; Maymon, Y.; Mistry, K.; Morgan, K.; Natarajan, S.; Nevo, O.; Oh, M.; Pardy, P.; Park, J.; Penmatsa, P.; Phelps, B.; Peterson, C.; Rajappa, S.; Raveh, A.; Rezaie, A; Ravishankar, T.; Ramaswamy, R.; Reddy, S.; Saha, R.; Sen, S.; Sanchez, R.; Sanaga, R.; Simkhovich, B.; Sell, B.; Senger, M.; Schnarch, B.; Seshadri, M.; Sidorov, O.; Subramaniam, S.; Subramanian, K.; Truong, B.; Bangalore, S.; Hicks, J.; Venkatesh, S.; Christensen, D.; Bhargav, K.; Haartman, M. Von; Joshi, P.; Zickel, S.; Lin, C-H; Huening, J.; Wu, T-H; Bakken, N.; Afzal, A.; Raman, A.; Rao, Sj.; Kawar, V.; Neirynck, J.; Bradley, D.; Duwe, M.; Wu, S.; Patil, V.; Bayoumy, M.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Conference
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :337-340 2004
Conference
2004 Asia-Pacific Radio Science Conference, 2004. Proceedings. Asia-pacific radio science conference Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific. :480-483 2004
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(7):1423-1428 Jul, 2005
Conference
Natarajan, S.; Agostinelli, M.; Akbar, S.; Bost, M.; Bowonder, A.; Chikarmane, V.; Chouksey, S.; Dasgupta, A.; Fischer, K.; Fu, Q.; Ghani, T.; Giles, M.; Govindaraju, S.; Grover, R.; Han, W.; Hanken, D.; Haralson, E.; Haran, M.; Heckscher, M.; Heussner, R.; Jain, P.; James, R.; Jhaveri, R.; Jin, I.; Kam, H.; Karl, E.; Kenyon, C.; Liu, M.; Luo, Y.; Mehandru, R.; Morarka, S.; Neiberg, L.; Packan, P.; Paliwal, A.; Parker, C.; Patel, P.; Patel, R.; Pelto, C.; Pipes, L.; Plekhanov, P.; Prince, M.; Rajamani, S.; Sandford, J.; Sell, B.; Sivakumar, S.; Smith, P.; Song, B.; Tone, K.; Troeger, T.; Wiedemer, J.; Yang, M.; Zhang, K.
2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :3.7.1-3.7.3 Dec, 2014
Academic Journal
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 26(4):246-248 Apr, 2005
Conference
International Semiconductor Device Research Symposium, 2003 Semiconductor device research Semiconductor Device Research Symposium, 2003 International. :57-58 2003
Academic Journal
In: American Literary History . (American Literary History, 2008, 20(3):539-547)
Academic Journal
In: Henry James Review . (Henry James Review, Fall 2004, 25(3):239-245)
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[AR] Haralson, E.
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