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Academic Journal
Kulse, P.; Birkholz, M.; Ehwald, K.-E.; Bauer, J.; Drews, J.; Haak, U.; Höppner, W.; Katzer, J.; Schulz, K.; Wolansky, D.
In Microelectronic Engineering September 2012 97:276-279
Conference
Knoll, D.; Heinemann, B.; Barth, R.; Blum, K.; Borngraber, J.; Drews, J.; Ehwald, K.-E.; Fischer, G.; Fox, A.; Grabolla, T.; Haak, U.; Hoppner, W.; Korndorfer, F.; Kuck, B.; Marschmeyer, S.; Richter, H.; Rucker, H.; Schley, P.; Schmidt, D.; Scholz, R.; Senapati, B.; Tillack, B.; Winkler, W.; Wolansky, D.; Wolf, C.; Wulf, H.-E.; Yamamoto, Y.; Zaumseil, P.
Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :241-244 2004
Conference
Rucker, H.; Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Fursenko, O.; Grabolla, T.; Haak, U.; Hoppner, W.; Knoll, D.; Marschmeyer, S.; Mohapatra, N.; Richter, H.H.; Schley, P.; Schmidt, D.; Tillack, B.; Weidner, G.; Wolansky, D.; Wulf, H.E.; Yamamoto, Y.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :239-242 2004
Conference
Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Formanek, P.; Grabolla, T.; Haak, U.; Hoppner, W.; Kopke, D.K.; Kuck, B.; Kurps, R.; Marschmeyer, S.; Richter, H.H.; Rucker, H.; Schley, P.; Schmidt, D.; Winkler, W.; Wolansky, D.; Wulf, H.E.; Yamamoto, Y.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :251-254 2004
Conference
Wolansky, D.; Bauer, J.; Haak, U.; Hoppner, W.; Katzer, J.; Kulse, P.; Mai, A.; Rucker, H.; Scheit, A.; Schulz, K.
2012 International Semiconductor Conference Dresden-Grenoble (ISCDG) Semiconductor Conference Dresden-Grenoble (ISCDG), 2012 International. :203-205 Sep, 2012
Conference
Heinemann, B.; Rucker, H.; Barth, R.; Bauer, J.; Bolze, D.; Bugiel, E.; Drews, J.; Ehwald, K.-E.; Grabolla, T.; Haak, U.; Hoppner, W.; Knoll, D.; Kruger, D.; Kuck, B.; Kurps, R.; Marschmeyer, M.; Richter, H.H.; Schley, P.; Schmidt, D.; Scholz, R.; Tillack, B.; Winkler, W.; Wolnsky, D.; Wulf, H.-E.; Yamamoto, Y.; Zaumseil, P.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :775-778 2002
Conference
Knoll, D.; Ehwald, K.E.; Heinemann, B.; Fox, A.; Blum, K.; Rucker, H.; Furnhammer, F.; Senapati, B.; Barth, R.; Haak, U.; Hoppner, W.; Drews, J.; Kurps, R.; Marschmeyer, S.; Richter, H.H.; Grabolla, T.; Kuck, B.; Fursenko, O.; Schley, P.; Scholz, R.; Tillack, B.; Yamamoto, Y.; Kopke, K.; Wulf, H.E.; Wolansky, D.; Winkler, W.
Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :783-786 2002
Academic Journal
Rucker, H.; Heinemann, B.; Winkler, W.; Barth, R.; Borngraber, J.; Drews, J.; Fischer, G. G.; Fox, A.; Grabolla, T.; Haak, U.; Knoll, D.; Korndorfer, F.; Mai, A.; Marschmeyer, S.; Schley, P.; Schmidt, D.; Schmidt, J.; Schubert, M. A.; Schulz, K.; Tillack, B.; Wolansky, D.; Yamamoto, Y.
IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 45(9):1678-1686 Sep, 2010
Conference
Rucker, H.; Heinemann, B.; Winkler, W.; Barth, R.; Borngraber, J.; Drews, J.; Fischer, G. G.; Fox, A.; Grabolla, T.; Haak, U.; Knoll, D.; Korndorfer, F.; Mai, A.; Marschmeyer, S.; Schley, P.; Schmidt, D.; Schmidt, J.; Schulz, K.; Tillack, B.; Wolansky, D.; Yamamoto, Y.
2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE. :166-169 Oct, 2009
Conference
Fox, A.; Heinemann, B.; Barth, R.; Bolze, D.; Drews, J.; Haak, U.; Knoll, D.; Kuck, B.; Kurps, R.; Marschmeyer, S.; Richter, H.H.; Rucker, H.; Schley, P.; Schmidt, D.; Tillack, B.; Weidner, G.; Wipf, C.; Wolansky, D.; Yamamoto, Y.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008
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[AR] Haak, U.
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