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Mertens, H.; Hosseini, M.; Chiarella, T.; Zhou, D.; Wang, S.; Mannaert, G.; Dupuy, E.; Radisic, D.; Tao, Z.; Oniki, Y.; Hikavyy, A.; Rosseel, R.; Mingardi, A.; Choudhury, S.; Gowda, P. Puttarame; Sebaai, F.; Peter, A.; Vandersmissen, K.; Soulie, J.P.; Keersgieter, A. De; Lima, L. Petersen Barbosa; Cavalcante, C.; Batuk, D.; Martinez, G.T.; Geypen, J.; Seidel, F.; Paulussen, K.; Favia, P.; Boemmels, J.; Loo, R.; Wong, P.; Marquez, A. Sepulveda; Chan, B.T.; Mitard, J.; Subramanian, S.; Demuynck, S.; Litta, E. Dentoni; Horiguchi, N.; Samavedam, S.; Biesemans, S.
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
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Mertens, H.; Ritzenthaler, R.; Oniki, Y.; Gowda, P. Puttarame; Mannaert, G.; Sebaai, F.; Hikavyy, A.; Rosseel, E.; Dupuy, E.; Peter, A.; Vandersmissen, K.; Radisic, D.; Briggs, B.; Batuk, D.; Geypen, J.; Martinez-Alanis, G.; Seidel, F.; Richard, O.; Chan, B.T.; Mitard, J.; Litta, E. Dentoni; Horiguchi, N.
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :23.1.1-23.1.4 Dec, 2022
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[AR] Gowda, P. Puttarame
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