부산대학교 도서관

Goff, J. M. (1-SAND-CPR) AMS Author Profile; Sievers, C. (1-SAND-CPR) AMS Author Profile; Wood, M. A. (1-SAND-CPR) AMS Author Profile; Thompson, A. P. (1-SAND-CPR) AMS Author Profile

Journal of Computational Physics (J. Comput. Phys.) (20240101), 510, Paper No 113073, 33~pp. ISSN: 0021-9991 (print).eISSN: 1090-2716.

Powell, J. T.; Sweeting, M. J.; Ulug, P.; Blankensteijn, J. D.; Lederle, F. A.; Becquemin, J.‐P.; Greenhalgh, R. M.; Greenhalgh, R. M.; Beard, J. D.; Buxton, M. J.; Brown, L. C.; Harris, P. L.; Powell, J. T.; Rose, J. D. G.; Russell, I. T.; Sculpher, M. J.; Thompson, S. G.; Lilford, R.J.; Bell, P. R. F.; Greenhalgh, R. M.; Whitaker, S.C.; Poole‐Wilson, the late P.A.; Ruckley, C. V.; Campbell, W. B.; Dean, M. R. E.; Ruttley, M. S. T.; Coles, E. C.; Powell, J. T.; Halliday, A.; Gibbs, S. J.; Brown, L. C.; Epstein, D.; Sculpher, M. J.; Thompson, S. G.; Hannon, R. J.; Johnston, L.; Bradbury, A. W.; Henderson, M. J.; Parvin, S. D.; Shepherd, D. F. C.; Greenhalgh, R. M.; Mitchell, A. W.; Edwards, P. R.; Abbott, G. T.; Higman, D. J.; Vohra, A.; Ashley, S.; Robottom, C.; Wyatt, M. G.; Rose, J. D. G.; Byrne, D.; Edwards, R.; Leiberman, D. P.; McCarter, D. H.; Taylor, P. R.; Reidy, J. F.; Wilkinson, A. R.; Ettles, D. F.; Clason, A. E.; Leen, G. L. S.; Wilson, N. V.; Downes, M.; Walker, S. R.; Lavelle, J. M.; Gough, M. J.; McPherson, S.; Scott, D. J. A.; Kessell, D. O.; Naylor, R.; Sayers, R.; Fishwick, N. G.; Harris, P. L.; Gould, D. A.; Walker, M. G.; Chalmers, N. C.; Garnham, A.; Collins, M. A.; Beard, J. D.; Gaines, P. A.; Ashour, M. Y.; Uberoi, R.; Braithwaite, B.; Whitaker, S. C.; Davies, J. N.; Travis, S.; Hamilton, G.; Platts, A.; Shandall, A.; Sullivan, B. A.; Sobeh, M.; Matson, M.; Fox, A. D.; Orme, R.; Yusef, W.; Doyle, T.; Horrocks, M.; Hardman, J.; Blair, P. H. B.; Ellis, P. K.; Morris, G.; Odurny, A.; Vohra, R.; Duddy, M.; Thompson, M.; Loosemore, T. M. L.; Belli, A. M.; Morgan, R.; Adiseshiah, M.; Brookes, J. A. S.; McCollum, C. N.; Ashleigh, R.; Aukett, M.; Baker, S.; Barbe, E.; Batson, N.; Bell, J.; Blundell, J.; Boardley, D.; Boyes, S.; Brown, O.; Bryce, J.; Carmichael, M.; Chance, T.; Coleman, J.; Cosgrove, C.; Curran, G.; Dennison, T.; Devine, C.; Dewhirst, N.; Errington, B.; Farrell, H.; Fisher, C.; Fulford, P.; Gough, M.; Graham, C.; Hooper, R.; Horne, G.; Horrocks, L.; Hughes, B.; Hutchings, T.; Ireland, M.; Judge, C.; Kelly, L.; Kemp, J.; Kite, A.; Kivela, M.; Lapworth, M.; Lee, C.; Linekar, L.; Mahmood, A.; March, L.; Martin, J.; Matharu, N.; McGuigen, K.; Morris‐Vincent, P.; Murray, S.; Murtagh, A.; Owen, G.; Ramoutar, V.; Rippin, C.; Rowley, J.; Sinclair, J.; Spencer, S.; Taylor, V.; Tomlinson, C.; Ward, S.; Wealleans, V.; West, J.; White, K.; Williams, J.; Wilson, L.; Grobbee, D. E.; Blankensteijn, J. D.; Bak, A. A. A.; Buth, J.; Pattynama, P. M.; Verhoeven, E. L. G.; van Voorthuisen, A. E.; Blankensteijn, J. D.; Balm, R.; Buth, J.; Cuypers, P. W. M.; Grobbee, D. E.; Prinssen, M.; van Sambeek, M. R. H. M.; Verhoeven, E. L. G.; Baas, A. F.; Hunink, M. G.; van Engelshoven, J. M.; Jacobs, M. J. H. M.; de Mol, B. A. J. M.; van Bockel, J. H.; Balm, R.; Reekers, J.; Tielbeek, X.; Verhoeven, E. L. G.; Wisselink, W.; Boekema, N.; Heuveling, L. M.; Sikking, I.; Prinssen, M.; Balm, R.; Blankensteijn, J. D.; Buth, J.; Cuypers, P. W. M.; van Sambeek, M. R. H. M.; Verhoeven, E. L. G.; de Bruin, J. L.; Baas, A. F.; Blankensteijn, J. D.; Prinssen, M.; Buth, J.; Tielbeek, A.V.; Blankensteijn, J. D.; Balm, R.; Reekers, J. A.; van Sambeek, M. R. H. M.; Pattynama, P.; Verhoeven, E. L. G.; Prins, T.; van der Ham, A. C.; van der Velden, J. J. I. M.; van Sterkenburg, S. M. M.; ten Haken, G. B.; Bruijninckx, C. M. A.; van Overhagen, H.; Tutein Nolthenius, R. P.; Hendriksz, T. R.; Teijink, J. A. W.; Odink, H. F.; de Smet, A. A. E. A.; Vroegindeweij, D.; van Loenhout, R. M. M.; Rutten, M. J.; Hamming, J. F.; Lampmann, L. E. H.; Bender, M. H. M.; Pasmans, H.; Vahl, A. C.; de Vries, C.; Mackaay, A. J. C.; van Dortmont, L. M. C.; van der Vliet, A. J.; Schultze Kool, L. J.; Boomsma, J. H. B.; van Dop, H. R.; de Mol van Otterloo, J. C. A.; de Rooij, T. P. W.; Smits, T. M.; Yilmaz, E. N.; Wisselink, W.; van den Berg, F. G.; Visser, M. J. T.; van der Linden, E.; Schurink, G. W. H.; de Haan, M.; Smeets, H. J.; Stabel, P.; van Elst, F.; Poniewierski, J.; Vermassen, F. E. G.; Lederle, F. A.; Freischlag, J. A.; Kohler, T. R.; Latts, E.; Matsumura, J.; Padberg, F. T., Jr; Kyriakides, T. C.; Swanson, K. M.; Guarino, P.; Peduzzi, P.; Antonelli, M.; Cushing, C.; Davis, E.; Durant, L.; Joyner, S.; Kossack, the late A.; Kyriakides, T. C.; LeGwin, Mary; McBride, V.; OʼConnor, T.; Poulton, J.; Stratton, the late S.; Zellner, S.; Snodgrass, A. J.; Thornton, J.; Swanson, K. M.; Haakenson, C. M.; Stroupe, K.T.; Jonk, Y.; Hallett, J. W.; Hertzer, N.; Towne, J.; Katz, D. A.; Karrison, T.; Matts, J. P.; Marottoli, R.; Kasl, S.; Mehta, R.; Feldman, R.; Farrell, W.; Allore, H.; Perry, E.; Niederman, J.; Randall, F.; Zeman, M.; Beckwith, the late D.; OʼLeary, T. J.; Huang, G. D.; Latts, E.; Bader, M.; Ketteler, E. R.; Kingsley, D. D.; Marek, J. M.; Massen, R. J.; Matteson, B. D.; Pitcher, J. D.; Langsfeld, M.; Corson, J. D.; Goff, J. M., Jr; Kasirajan, K.; Paap, C.; Robertson, D. C.; Salam, A.; Veeraswamy, R.; Milner, R.; Kasirajan, K.; Guidot, J.; Lal, B. K.; Busuttil, S. J.; Lilly, M. P.; Braganza, M.; Ellis, K.; Patterson, M. A.; Jordan, W. D.; Whitley, D.; Taylor, S.; Passman, M.; Kerns, D.; Inman, C.; Poirier, J.; Ebaugh, J.; Raffetto, J.; Chew, D.; Lathi, S.; Owens, C.; Hickson, K.; Dosluoglu, H. H.; Eschberger, K.; Kibbe, M. R.; Baraniewski, H. M.; Matsumura, J.; Endo, M.; Busman, A.; Meadows, W.; Evans, M.; Giglia, J. S.; El Sayed, H.; Reed, A. B.; Ruf, M.; Ross, S.; Jean‐Claude, J. M.; Pinault, G.; Kang, P.; White, N.; Eiseman, M.; Jones, the late R.; Timaran, C. H.; Modrall, J. G.; Welborn, M. B., III; Lopez, J.; Nguyen, T.; Chacko, J. K. Y.; Granke, K.; Vouyouka, A. G.; Olgren, E.; Chand, P.; Allende, B.; Ranella, M.; Yales, C.; Whitehill, T. A.; Krupski, the late W. C.; Nehler, M. R.; Johnson, S. P.; Jones, D. N.; Strecker, P.; Bhola, M. A.; Shortell, C. K.; Gray, J. L.; Lawson, J. H.; McCann, R.; Sebastian, M.W.; Kistler Tetterton, J.; Blackwell, C.; Prinzo, P. A.; Lee, N.; Padberg, F. T., Jr; Cerveira, J. J.; Lal, B. K.; Zickler, R. W.; Hauck, K. A.; Berceli, S. A.; Lee, W. A.; Ozaki, C. K.; Nelson, P. R.; Irwin, A. S.; Baum, R.; Aulivola, B.; Rodriguez, H.; Littooy, F. N.; Greisler, H.; OʼSullivan, M. T.; Kougias, P.; Lin, P. H.; Bush, R. L.; Guinn, G.; Bechara, C.; Cagiannos, C.; Pisimisis, G.; Barshes, N.; Pillack, S.; Guillory, B.; Cikrit, D.; Lalka, S. G.; Lemmon, G.; Nachreiner, R.; Rusomaroff, M.; OʼBrien, E.; Cullen, J. J.; Hoballah, J.; Sharp, W. J.; McCandless, J. L.; Beach, V.; Minion, D.; Schwarcz, T. H.; Kimbrough, J.; Ashe, L.; Rockich, A.; Warner‐Carpenter, J.; Moursi, M.; Eidt, J. F.; Brock, S.; Bianchi, C.; Bishop, V.; Gordon, I. L.; Fujitani, R.; Kubaska, S. M., III; Behdad, M.; Azadegan, R.; Ma Agas, C.; Zalecki, K.; Hoch, J. R.; Carr, S. C.; Acher, C.; Schwarze, M.; Tefera, G.; Mell, M.; Dunlap, B.; Rieder, J.; Stuart, J. M.; Weiman, D. S.; Abul‐Khoudoud, O.; Garrett, H. E.; Walsh, S. M.; Wilson, K. L.; Seabrook, G. R.; Cambria, R. A.; Brown, K. R.; Lewis, B. D.; Framberg, S.; Kallio, C.; Barke, R. A.; Santilli, S. M.; dʼAudiffret, A. C.; Oberle, N.; Proebstle, C.; Johnson, L. L.; Jacobowitz, G. R.; Cayne, N.; Rockman, C.; Adelman, M.; Gagne, P.; Nalbandian, M.; Caropolo, L. J.; Pipinos, I. I.; Johanning, J.; Lynch, T.; DeSpiegelaere, H.; Purviance, G.; Zhou, W.; Dalman, R.; Lee, J. T.; Safadi, B.; Coogan, S. M.; Wren, S. M.; Bahmani, D. D.; Maples, D.; Thunen, S.; Golden, M. A.; Mitchell, M. E.; Fairman, R.; Reinhardt, S.; Wilson, M. A.; Tzeng, E.; Muluk, S.; Peterson, N. M.; Foster, M.; Edwards, J.; Moneta, G. L.; Landry, G.; Taylor, L.; Yeager, R.; Cannady, E.; Treiman, G.; Hatton‐Ward, S.; Salabsky, the late B.; Kansal, N.; Owens, E.; Estes, M.; Forbes, B. A.; Sobotta, C.; Rapp, J. H.; Reilly, L. M.; Perez, S. L.; Yan, K.; Sarkar, R.; Dwyer, S. S.; Perez, S.; Chong, K.; Kohler, T. R.; Hatsukami, T. S.; Glickerman, D. G.; Sobel, M.; Burdick, T. S.; Pedersen, K.; Cleary, P.; Back, M.; Bandyk, D.; Johnson, B.; Shames, M.; Reinhard, R. L.; Thomas, S. C.; Hunter, G. C.; Leon, L. R., Jr; Westerband, A.; Guerra, R. J.; Riveros, M.; Mills, J. L., Sr; Hughes, J. D.; Escalante, A. M.; Psalms, S. B.; Day, N. N.; Macsata, R.; Sidawy, A.; Weiswasser, J.; Arora, S.; Jasper, B. J.; Dardik, A.; Gahtan, V.; Muhs, B. E.; Sumpio, B. E.; Gusberg, R. J.; Spector, M.; Pollak, J.; Aruny, J.; Kelly, E. L.; Wong, J.; Vasilas, P.; Joncas, C.; Gelabert, H. A.; DeVirgillio, C.; Rigberg, D. A.; Cole, L.; Becquemin, J.‐P.; Marzelle, J.; Becquemin, J.‐P.; Sapoval, M.; Becquemin, J.‐P.; Favre, J.‐P.; Watelet, J.; Lermusiaux, P.; Sapoval, M.; Lepage, E.; Hemery, F.; Dolbeau, G.; Hawajry, N.; Cunin, P.; Harris, P.; Stockx, L.; Chatellier, G.; Mialhe, C.; Fiessinger, J.‐N.; Pagny, L.; Kobeiter, H.; Boissier, C.; Lacroix, P.; Ledru, F.; Pinot, J.‐J.; Deux, J.‐F.; Tzvetkov, B.; Duvaldestin, P.; Watelet, J.; Jourdain, C.; David, V.; Enouf, D.; Ady, N.; Krimi, A.; Boudjema, N.; Jousset, Y.; Enon, B.; Blin, V.; Picquet, J.; LʼHoste, P.; Thouveny, F.; Borie, H.; Kowarski, S.; Pernes, J.‐M.; Auguste, M.; Becquemin, J.‐P.; Desgranges, P.; Allaire, E.; Marzelle, J.; Kobeiter, H.; Meaulle, P.‐Y.; Chaix, D.; Juliae, P.; Fabiani, J. N.; Chevalier, P.; Combes, M.; Seguin, A.; Belhomme, D.; Sapoval, M.; Baque, J.; Pellerin, O.; Favre, J. P.; Barral, X.; Veyret, C.; Watelet, J.; Peillon, C.; Plissonier, D.; Thomas, P.; Clavier, E.; Lermusiaux, P.; Martinez, R.; Bleuet, F.; C, Dupreix; Verhoye, J. P.; Langanay, T.; Heautot, J. F.; Koussa, M.; Haulon, S.; Halna, P.; Destrieux, L.; Lions, C.; Wiloteaux, S.; Beregi, J. P.; Bergeron, P.; Pinot, J.‐J.; Patra, P.; Costargent, A.; Chaillou, P.; DʼAlicourt, A.; Goueffic, Y.; Cheysson, E.; Parrot, A.; Garance, P.; Demon, A.; Tyazi, A.; Pillet, J.‐C.; Lescalie, F.; Tilly, G.; Steinmetz, E.; Favier, C.; Brenot, R.; Krause, D.; Cercueil, J. P.; Vahdat, O.; Sauer, M.; Soula, P.; Querian, A.; Garcia, O.; Levade, M.; Colombier, D.; Cardon, J.‐M.; Joyeux, A.; Borrelly, P.; Dogas, G.; Magnan, P.‐É.; Branchereau, A.; Bartoli, J.‐M.; Hassen‐Khodja, R.; Batt, M.; Planchard, P.‐F.; Bouillanne, P.‐J.; Haudebourg, P.; Bayne, J.; Gouny, P.; Badra, A.; Braesco, J.; Nonent, M.; Lucas, A.; Cardon, A.; Kerdiles, Y.; Rolland, Y.; Kassab, M.; Brillu, C.; Goubault, F.; Tailboux, L.; Darrieux, H.; Briand, O.; Maillard, J.‐C.; Varty, K.; Cousins, C.

British Journal of Surgery. Feb 01, 2017 104(3):166-178

Starnes, B.W.; O’Donnell, S. D.; Gillespie, D. L.; Goff, J. M.; Rosa, P.; Parker, M. V.; Chang, A.

Journal of Vascular Surgery. Aug 01, 2003 38(2):263-271

University of Michigan, 48109, Ann Arbor, MI, USA; I. Physikalisches Institut, III. Physikalisches Institut, RWTH, D-52056, Aachen, Germany; Nuclear Physics Institute, St Petersburg, Russia; Boston University, 02215, Boston, MA, USA; Shanghai Institute of Ceramics, SIC, Shanghai, China; FBLJA Project, World Laboratory, CH-1211, Geneva 23, Switzerland; DESY-Institut f??r Hochenergiephysik, D-15738, Zeuthen, Germany; INFN-Sezione di Perugia and Universit?? Degli Studi di Perugia, I-06100, Perugia, Italy; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; University of Nijmegen and NIKHEF, NL-6525 ED, Nijmegen, The Netherlands; Institute of High Energy Physics, IHEP, 100039, Berjing, People's Republic of China; California Institute of Technology, 91125, Pasadena, CA, USA; University of Hamburg, D-22761, Hamburg, Germany; Carnegie Mellon University, 15213, Pittsburgh, PA, USA; Laboratoire d'Annecy-le-Vieux de Physique des Particules, LAPP, IN2P3-CNRS, BP 110, F-74941, Annecy-le-Vieux Cedex, France; Eiogen??ssische Technische Hochschule, ETH Z??rich, CH-8093, Z??rich, Switzerland; INFN-Sezione di Milano, I-20133, Milan, Italy; Certro de Investigaciones Energeticas, Medioambientales y Technologicas, CIEMAT, E-28040, Madrid, Spain; Oak Ridge National Laboratory, 37831, Oak Ridge, TN, USA; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; University of Lausanne, CH-1015, Lausanne, Switzerland; INFN Sezione di Firenze and University of Florence, I-50125, Florence, Italy; INFN-Sezione di Perugia and Universit?? Degli Studi di Perugia, I-06100, Perugia, Italy; INFN-Sezione di Napoli and University of Naples, I-80125, Naples, Italy; Harvard University, 02139, Cambridge, MA, USA; INFN Sezione di Firenze and University of Florence, I-50125, Florence, Italy; University of California, 92093, San Diego, CA, USA; Tata Institute of Fundamental Research, 400 005, Bombay, India; INFN-Sezione di Roma and University of Rome, ???La Sapienza???, I-00185, Rome, Italy; USTC, Chinese University of Science and Technology, 230 029, Hefei, Anhui, People's Republic of China; Institute of Mechantronics, Bulgarian Academy of Sciences, BU-1113, Sona, Bulgaria; INFN-Sezione di Perugia and Universit?? Degli Studi di Perugia, I-06100, Perugia, Italy; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; High Energy Physics Group, Tarwan, China; University of Geneva, CH-1211, Geneva 4, Switzerland; Institute of Atomic Physics and University of Bucharest, RO-76900, Bucharest, Romania; Johns Hopkins University, 21218, Baltimore, MD, USA; University of Alabama, 35486, Tuscaloosa, AL, USA; Princeton University, 08544, Princeton, NJ, USA; Central Research Institute for Physics of the Hungarian Academy of Sciences, H-1525, Budapest 114, Hungary; NIKHEF, National Institute for High Energy Physics, NL-1009 DB, Amsterdam, The Netherlands; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; INFN-Sezione di Bologna, I-40126, Bologna, Italy; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; INFN-Sezione di Bologna, I-40126, Bologna, Italy; Eiogen??ssische Technische Hochschule, ETH Z??rich, CH-8093, Z??rich, Switzerland; Institute of Mechantronics, Bulgarian Academy of Sciences, BU-1113, Sona, Bulgaria; NIKHEF, National Institute for High Energy Physics, NL-1009 DB, Amsterdam, The Netherlands; Los Alamos National Laboratory, 87544, Los Alamos, NM, USA; Paul Scherrer Institut, PSI, CH-5232, Villigen, Switzerland; Institute of Mechantronics, Bulgarian Academy of Sciences, BU-1113, Sona, Bulgaria; Center for High Energy Physics, Korea Advanced Inst. of Sciences and Technology, 305-701, Taejon, Republic of Korea; FBLJA Project, World Laboratory, CH-1211, Geneva 23, Switzerland; USTC, Chinese University of Science and Technology, 230 029, Hefei, Anhui, People's Republic of China; Purdue University, 47907, West Lafayette, IN, USA; Institut de Physique Nucl??aire de Lyon, IN2P3-CNRS, Universit?? Claude Bernard, F-69622, Villeurbanne Cedex, France; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; INFN Sezione di Firenze and University of Florence, I-50125, Florence, Italy; Northeastern University, 02115, Boston, MA, USA; Eiogen??ssische Technische Hochschule, ETH Z??rich, CH-8093, Z??rich, Switzerland; Institute of High Energy Physics, IHEP, 100039, Berjing, People's Republic of China; Dept. de Fisica de Particulas Elementales, Univ. de Santiago, E-15706, Santiago de Compostela, Spain; FBLJA Project, World Laboratory, CH-1211, Geneva 23, Switzerland; INFN-Sezione di Bologna, I-40126, Bologna, Italy; FBLJA Project, World Laboratory, CH-1211, Geneva 23, Switzerland; INFN-Sezione di Bologna, I-40126, Bologna, Italy; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; Department of Natural Sciences, University of Cyprus, Nicosia, Cyprus; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; Harvard University, 02139, Cambridge, MA, USA; Research Institute for High Energy Physics, SEFT, P.O. Box 9, FIN-00014, Helsinki, Finland; Ann Arbor; Bilei, G. M.; Monteleoni, B.; Bertucci, B.; Ferroni, F.; Vorobyov, An. A.; Zhou, B.; Zeng, M.; Zeng, Y.; Xue, Z. L.; Xie, Y. Y.; Wallraff, W.; Wyslouch, B.; Vogt, H.; Martin, J. P.; Tonwar, S. C.; T??th, J.; Ting, S. M.; Tang, X. W.; Toker, O.; Taylor, L.; Shen, D. Z.; Sopczak, A.; Shumilov, E.; Schneegans, M.; Son, D.; R??hner, S.; Rancoita, P. G.; Schopper, H.; Rosmalen, R.; Romero, L.; Read, K.; Redaelli, M.; Paus, C.; Perret-Gallix, D.; Pauss, F.; Paul, T.; Pei, Y. J.; Li, P. J.; Pascale, G.; Patricelli, S.; Merola, L.; Mi, Y.; Merk, M.; Metzger, W. J.; Mazumdar, K.; McBride, P.; Marzano, F.; Linde, F. L.; Liao, J. Y.; Kornadt, O.; Dimitrov, H. R.; Krenz, W.; Koulbardis, A.; Kraemer, R. W.; Jones, Lawrence W.; Jin, B. N.; Innocente, V.; Hoorani, H.; Hu, G.; Gailloud, M.; Gheordanescu, N.; Garcia-Abia, P.; Gentile, S.; Fukushima, M.; Freudenreich, K.; Djambazov, L.; Drago, E.; DeNotaristefani, F.; Asmundis, R.; Degr??, A.; D'Alessandro, R.; Chamizo, M.; Cesaroni, F.; Cavallo, N.; Bourilkov, D.; Bizzarri, R.; Boutigny, D.; Bock, R.; Azemoon, T.; Blaising, J. J.; Baksay, L.; Baba, P. V. K. S.; Bagnaia, P.; Alkhazov, G.; Arefiev, A.; Schmitz, P.; Vivargent, M.; Dai, T. S.; Yang, G.; Willmott, C.; Qi, Z. D.; Koffeman, E.; Fiandrini, E.; Anderson, A. L.; Cruz, B.; Capell, M.; Barill??re, R.; Burger, W. J.; Levtchenko, P.; Yunus, N.; Servoli, L.; Extermann, P.; Mihul, A.; Luminari, L.; Leiste, R.; Schwenke, J.; Marion, F.; Favara, A.; Fabbretti, R.; Sciacca, C.; He, C. F.; Cohn, H. O.; Klimentov, A.; Acciarri, M.; Bouwens, B.; Swain, J. D.; Steuer, M.; Organtini, G.; Sticozzi, F.; You, J. M.; L??belsmeyer, K.; Falciano, S.; Gupta, V. K.; Sudhakar, K.; Susinno, G. F.; Barone, L.; Aguilar-Benitez, M.; Brock, I. C.; Bujak, A.; Chiefari, G.; Lebrun, P.; Ferguson, T.; Guanziroli, M.; Gruenewald, M. W.; Kienzle-Focacci, M. N.; Sarakinos, M. S.; Lecomte, P.; Morand, R.; Moulai, N. E.; Mount, R.; Salicio, J. M.; Sachwitz, M.; Viertel, G.; Ludovici, L.; Ricker, A.; Stickland, D. P.; Nippe, A.; Baschirotto, A.; Hasan, A.; Adriani, O.; Schultze, K.; Pirou??, P. A.; An, Q.; Nagy, E.; Lustermann, W.; Coignet, G.; Cui, X. Y.; Engler, A.; Schulte, R.; Guo, J. K.; Seiler, P. G.; Bykov, A.; Syed, A. A.; Paolucci, P.; Eppling, F. J.; Goujon, D.; Field, J. H.; Coultre, P.; Fisher, P. H.; Starosta, R.; Chung, S.; Wang, Z. M.; Lecoq, P.; Cartacci, A. M.; He, J. T.; K??nig, A. C.; Li, C.; Kinnison, W. W.; Scott, I.; Chen, G. M.; Lu, Y. S.; Cui, X. T.; Marin, A.; Kim, J. K.; Kim, Y. G.; Weber, A.; Liu, Y.; Kirsch, S.; Gratta, G.; Kaur, M.; Berges, P.; Khokhar, S.; Felcini, M.; Yin, Z. W.; Ye, J. B.; Weill, R.; Riemann, S.; White, M.; Plyaskin, V.; Valente, Edward J.; Malik, R.; Vetlitsky, I.; Sehgal, R.; Rind, O.; Nessi-Tedaldi, F.; Riles, K.; Postema, H.; Hangarter, K.; Bencze, Gy. L.; Civinini, C.; Buytenhuijs, A.; Ambrosi, G.; Alverson, G.; Morganti, S.; Hu, G. Q.; Yeh, S. C.; Ye, Q.; Stone, H.; Weber, J.; Schwering, G.; Plasil, F.; Riemers, B. C.; Sanchez, E.; Niaz, M. A.; Napolitano, M.; Sanders, G. S.; Goff, J. M.; Leedom, I.; Ma, J. M.; Ma, W. G.; Kim, S. C.; Lee, J. S.; Lee, D. M.; Gustafson, H. R.; Burger, J. D.; Becker, U.; Becattini, F.; Choi, M. T.; Alcaraz, J.; Behner, F.; Aloisio, A.; Gu, C.; Ern??, F. C.; Ahlen, S.; Battiston, R.; Fay, J.; Clare, R.; Alviggi, M. G.; Gutay, L. J.; Kirkby, A.; Leggett, C.; MacDermott, M.; Wang, Y. F.; Rizvi, H. A.; Wenninger, J.; Walle, R. T.; Malgeri, L.; Sultanov, G.; Chien, C. Y.; Pojidaev, V.; Newman, H.; Clare, I.; Berdugo, J.; Burgos, C.; Santocchia, A.; Kirkby, D.; Adam, A.; Busenitz, J.; Fan, S. J.; Fabre, M.; Anderhub, H.; Biasini, M.; Costantini, S.; Colino, N.; Fernandez, G.; Kapustinsky, J. S.; Lenti, M.; Hebert, M.; Herv??, A.; Karyotakis, Y.; Shotkin, S.; Marchesini, P.; Qian, J. M.; Pandoulas, D.; Qureshi, K. N.; Reucroft, S.; Ro, S.; Robohm, A.; Rykaczewski, H.; Rossum, W.; Sassowsky, M.; Sartorelli, G.; Spartiotis, C.; Wright, D.; Zwaan, B. C. C.; Zemp, P.; Zhou, J. F.; Arce, P.; Antreasyan, D.; Aziz, T.; Chemarin, M.; Bakken, J. A.; Borgia, B.; B??hm, A.; Bobbink, G. J.; Castello, R.; Bourquin, M.; Casaus, J.; Chaturvedi, U. K.; Cerrada, M.; Chang, Y. H.; Suter, H.; Kunin, A.; D??nes, E.; Dittmar, M.; Ganguli, S. N.; Deiters, K.; DiBitonto, D.; Denes, P.; Dionisi, C.; Diemoz, M.; Dova, M. T.; Fredj, L.; Forconi, G.; Gallo, E.; Friebel, W.; Galaktionov, Yu.; Hofer, H.; Hilgers, K.; Ilyas, M. M.; Hou, S. R.; Ille, B.; Janssen, H.; Koutsenko, V.; Kumar, K. S.; Kramer, T.; Kuijten, H.; Krastev, V. R.; Schmitz, D.; Li, H. T.; Lin, W. T.; Lin, Z. Y.; Lindemann, B.; Lohmann, W.; Lista, L.; McNally, D.; Massaro, G. G. G.; McMahon, T.; Razis, P.; Raven, G.; Meschini, M.; Passaleva, G.; Pauluzzi, M.; Rahal-Callot, G.; Perrier, J.; Pensotti, S.; Sch??fer, C.; Rattaggi, M.; Schegelsky, V.; Roe, B. P.; R??hner, M.; Rosselet, Ph.; Rosier-Lees, S.; Scholz, N.; Shevchenko, S.; Schotanus, D. J.; Shoutko, V.; Shi, X. R.; Soulimov, V.; Vogel, H.; Ting, Samuel C. C.; Tsipolitis, G.; Tonutti, M.; Tsaregorodtsev, A.; Wadhwa, M.; Vorobiev, I.; Vuilleumier, L.; Xu, Z. Z.; Wynhoff, S.; Xu, J. G.; Zhang, Z. P.; Yan, D. S.; Zhang, D. H.; Zhou, G. J.; Pohl, M.; Yang, C. G.; Yang, B. Z.; Zhu, R. Y.; Zichichi, A.; Wang, X. L.; Wang, J. C.; Ulbricht, J.; Wang, C. R.; Tuuva, T.; Tung, K. L.; Tully, C.; Spickermann, T.; Schreiber, H. J.; Spillantini, P.; Shukla, J.; Rubio, J. A.; Rubbia, A.; Roth, S.; Ren, Z.; Pieri, M.; Piccolo, D.; Mir, Y.; Pevsner, A.; Rescigno, M.; Mnich, J.; Mirabelli, G.; Lubbers, J. M.; Lu, W.; Mills, G. B.; Lanske, D.; Lanzano, S.; Landi, G.; Kapinos, P.; Khan, R. A.; Kamyshkov, Yu.; Gonzalez, E.; Kasser, A.; Gougas, A.; Josa-Mutuberria, I.; Gong, Z. F.; Duinker, P.; Goldfarb, S.; Easo, S.; Mamouni, H. El; Chen, C.; Duchesneau, D.; Chen, G.; Branson, J. G.; Chen, A.; Duran, I.; Brambilla, E.; Bao, J.; Banicz, K.; Sun, L. Z.; M??ller, S.; Lee, K. Y.; Banerjee, S.; Cotorobai, F.; Maolinbay, M.; Yzerman, M.; Ball, Robert C.; Contin, A.; Brigljevic, V.; Biland, A.; Fesefeldt, H.; Caria, M.; Giagu, S.; Hebbeker, T.; Uwer, U.; Luckey, D.; Chen, M.; Chen, H. F.; Chen, H. S.; Brooks, M.; Hauschildt, D.; Kittel, W.; Longo, E.; Leonardi, E.; Paoletti, S.; Ma??a, C.; Sauvage, G.; Pinto, J. C.; Sheer, I.; Rodriguez, F. J.; Vikas, U.; Wu, S. X.; Vikas, P.; Lebedev, A.; Bay, A.; Filthaut, F.; Fernandez, D.; Raghavan, R.; Ye, C. H.; M??ller, M.; Coan, T. E.; Strauch, K.; Gurtu, A.; Zaccardelli, C.; Wittgenstein, F.; Urb??n, L.; Sens, J. C.; Ren, D.; Nowak, H.; Luci, C.; Malinin, A.; Ladron de Guevara, P.; Carlino, G.; Cai, X. D.; Betev, B. L.; Andreev, V. P.; Angelescu, T.; Antonov, L.

University of Michigan, 48109, Ann Arbor, MI, USA; Eidgen??ssische Technische Hochschule, ETH Z??rich, CH-8093, Z??rich, Switzerland; World Laboratory, FBLJA Project, CH-1211, Geneva 23, Switzerland; INFN-Sezione di Napoli and University of Naples, I-80125, Naples, Italy; USTC, Chinese University of Science and Technology, 230029, Hefei, Anhui, China; I. Physikalisches Institut, RWTH, W-5100, Aachen, Germany; IHEP, Institute of High Energy Physics, 100039, Beijing, China; Centro de Investigaciones Energeticas, Medioambientales y Tecnologicas, CIEMAT, E-28040, Madrid, Spain; University of Nijmegen and NIKHEF, NL-6525 ED, Nijmegen, The Netherlands; Central Research Institute for Physics of the Hungarian Academy of Sciences, H-1525, Budapest 114, Hungary; INFN-Sezione di Roma and University of Rome, ???La Sapienza???, I-00185, Rome, Italy; California Institute of Technology, 91125, Pasadena, CA, USA; Center of High Energy Physics, Korea Advanced Inst. of Sciences and Technology, 305-701, Taejon, Republic of Korea; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; INFN Sezione di Firenze and University of Florence, I-50125, Florence, Italy; Laboratoire d'Annecy-le-Vieux de Physique des Particules, LAPP, IN2P3-CNRS, BP 110, F-74941, Annecy-le-Vieux Cedex, France; Lawrence Livermore National Laboratory, 94550, Livermore, CA, USA; INFN-Sezione di Perugia and Universit?? Degli Studi di Perugia, I-06100, Perugia, Italy; Shanghai Institute of Ceramics, SIC, Shanghai, China; Howard University, 02139, Cambridge, MA, USA; NIKHEFm, National Institute for High Energy Physics, NL-1009 DB, Amsterdam, The Netherlands; Tata Institute of Fundamental Research, 400005, Bombay, India; NIKHEFm, National Institute for High Energy Physics, NL-1009 DB, Amsterdam, The Netherlands; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; Purdue University, 47907, West Lafayette, IN, USA; DESY-Institut f??r Hochenergiephysik, O-1615, Zeuthen, Germany; Northeastern University, 02115, Boston, MA, USA; Paul Scherrer Institut, PSI, CH-5232, Villigen, Switzerland; Carnegie Mellon University, 15213, Pittsburgh, PA, USA; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; Howard University, 02139, Cambridge, MA, USA; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; DESY-Institut f??r Hochenergiephysik, O-1615, Zeuthen, Germany; University of Lausanne, CH-1015, Lausanne, Switzerland; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; University of Alabama, 35486, Tuscaloosa, AL, USA; High Energy Physics Group, Taiwan, China; Johns Hopkins University, 21218, Baltimore, MD, USA; University of California, 92093, San Diego, CA, USA; Boston University, 02115, Boston, MA, USA; I. Physikalisches Institut, RWTH, W-5100, Aachen, Germany; Tata Institute of Fundamental Research, 400005, Bombay, India; INFN-Sezione di Milano, I-20133, Milan, Italy; Princeton University, 08544, Princeton, NJ, USA; Nuclear Physics Institute, St. Petersburg, Russia; University of Geneva, CH-1211, Geneva 4, Switzerland; Institut de Physique Nucl??aire de Lyon, IN2P3-CNRS, Universit?? Claude Bernard, F-69622, Villeurbanne Cedex, France; Los Alamos National Laboratory, 87544, Los Alamos, NM, USA; Dept. de Fisica de Particulas Elementales, Univ. de Santiago, E-15706, Santiago de Compostela, Spain; USTC, Chinese University of Science and Technology, 230029, Hefei, Anhui, China; World Laboratory, FBLJA Project, CH-1211, Geneva 23, Switzerland; Institute of Mechatronics, Bulgarian Academy of Sciences, BU-1113, Sofia, Bulgaria; Eidgen??ssische Technische Hochschule, ETH Z??rich, CH-8093, Z??rich, Switzerland; INFN-Sezione di Bologna, I-40126, Bologna, Italy; INFN Sezione di Firenze and University of Florence, I-50125, Florence, Italy; Institute of Theoretical and Experimental Physics, ITEP, Moscow, Russia; Institute of Mechatronics, Bulgarian Academy of Sciences, BU-1113, Sofia, Bulgaria; INFN-Sezione di Perugia and Universit?? Degli Studi di Perugia, I-06100, Perugia, Italy; INFN-Sezione di Roma and University of Rome, ???La Sapienza???, I-00185, Rome, Italy; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; Institute of Mechatronics, Bulgarian Academy of Sciences, BU-1113, Sofia, Bulgaria; Oak Ridge National Laboratory, 37831, Oak Ridge, TN, USA; Nuclear Physics Institute, St. Petersburg, Russia; DESY-Institut f??r Hochenergiephysik, O-1615, Zeuthen, Germany; University of Hamburg, W-2000, Hamburg, Germany; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; Eidgen??ssische Technische Hochschule, ETH Z??rich, CH-8093, Z??rich, Switzerland; Tata Institute of Fundamental Research, 400005, Bombay, India; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; INFN Sezione di Firenze and University of Florence, I-50125, Florence, Italy; INFN-Sezione di Perugia and Universit?? Degli Studi di Perugia, I-06100, Perugia, Italy; Department of Natural Sciences, University of Cyprus, Nicosia, Cyprus; INFN-Sezione di Bologna, I-40126, Bologna, Italy; World Laboratory, FBLJA Project, CH-1211, Geneva 23, Switzerland; INFN-Sezione di Bologna, I-40126, Bologna, Italy; European Laboratory for Particle Physics, CERN, CH-1211, Geneva 23, Switzerland; World Laboratory, FBLJA Project, CH-1211, Geneva 23, Switzerland; Laboratoire d'Annecy-le-Vieux de Physique des Particules, LAPP, IN2P3-CNRS, BP 110, F-74941, Annecy-le-Vieux Cedex, France; World Laboratory, FBLJA Project, CH-1211, Geneva 23, Switzerland; Massachusetts Institute of Technology, 02139, Cambridge, MA, USA; INFN-Sezione di Bologna, I-40126, Bologna, Italy; Ann Arbor; Sarakinos, M. S.; Vogel, H.; Zichichi, A.; Xie, Y. Y.; Xu, J. G.; White, M.; Wu, S. X.; Willmott, C.; Schneegans, M.; Vikas, U.; Wright, D.; Valente, Edward J.; Walle, R. T.; Urb??n, L.; Rizvi, H. A.; Tully, C.; Spillantini, P.; Sopczak, A.; Shumilov, E.; McMahon, T.; Krastev, V. R.; Pandoulas, D.; Ma, W. G.; Schegelsky, V.; Schmitz, P.; Guo, J. K.; K??nig, A. C.; Engler, A.; Riemers, W.; Reucroft, S.; Rescigno, M.; Ren, D.; Malhotra, P. K.; Weill, R.; Lu, Y. S.; Paul, T.; Pei, Y. J.; Pauss, F.; Pauluzzi, M.; Passaleva, G.; Pascala, G.; Merola, L.; Mi, Y.; Merk, M.; Luci, C.; Luminari, L.; Ludovici, L.; Chen, M.; Lecoq, P.; Lanske, D.; Lanzano, S.; Kim, S. C.; Kim, Y. G.; Kienzle-Focacci, M. N.; He, C. F.; Karyotakis, Y.; Gurtu, A.; Galaktionov, Yu.; Gustafson, H. R.; Gele, D.; Gallo, E.; DiBitonto, D.; Fukushima, M.; Fackler, O.; Diemoz, M.; Fabbretti, R.; DeNotaristefani, F.; Civinini, C.; Clare, I.; Choi, M. T.; Chen, W. Y.; Martin, J. P.; Brooks, M.; Branson, J. G.; Bujak, A.; Behner, F.; Boutigny, D.; Baschirotto, A.; Barone, L.; Antonov, L.; Andreev, V. P.; Niaz, M. A.; Ahlen, S.; Postema, H.; Mount, R.; Schwering, G.; Alverson, G.; Rosselet, Ph.; Liu, Y.; Gougas, A.; Bao, J.; Sheer, I.; Razis, P.; Yang, L. G.; Lee, D. M.; Gentile, S.; Voroboyov, A. A.; Martinez-Laso, L.; Field, J.; Yeh, S. C.; Nadtochy, A.; Hoorani, H.; Leiste, R.; Koutsenko, V.; Koffeman, E.; Lenti, M.; Linde, F. L.; Ma??a, C.; Pieri, M.; Nowak, H.; Rosier-Lees, S.; Plasil, F.; Schulte, S.; Sajan, E.; Seiler, P. G.; Sudhakar, K.; Wallraff, W.; Vuilleumier, L.; Ye, J. B.; M??ller, S.; Schulte, R.; Schultze, K.; Rosmalen, R.; Pitou??, P. A.; Leonardi, E.; Hilgers, K.; Ginocchiaro, G.; Anderhub, H.; Qureshi, K. N.; Cui, X. Y.; Betev, B. L.; Colino, N.; Hu, G.; Ye, C. H.; Dova, M. T.; Wang, Z. M.; Raven, G.; Zhang, Z. P.; Kornadt, O.; Leytens, X.; Chen, C.; Driever, T.; Romero, L.; Filthaut, F.; Bourilkov, D.; Coignet, G.; Lista, L.; Sanders, G. S.; Tonwar, S. C.; Cerrada, M.; Clare, R.; Ting, Samuel C. C.; Santocchia, A.; Moulai, N. E.; Goff, J. M.; Behrens, J.; Gupta, V. K.; Duran, I.; Schwenke, J.; Yin, Z. W.; Gruenewald, M.; Zeng, M.; Kasser, A.; Drago, E.; Gonzalez, E.; Mazumdar, K.; Ye, Q.; Wang, G. H.; Swain, J. D.; Sachwitz, M.; Sehgal, R.; Scott, I.; Rykaczewski, H.; Yunus, N.; Napolitano, M.; Pohl, M.; Marin, A.; Hu, G. Q.; Gratta, G.; Goujon, D.; Kraemer, R. W.; Easo, S.; Bobbink, G. J.; Bilei, G. M.; Aziz, T.; Nagy, E.; Hofer, H.; Zemp, P.; Wang, C. R.; Terzi, G.; You, J. M.; Wang, C.; Suter, H.; Sun, L. Z.; Sciacca, C.; Rubbia, A.; Neyer, C.; Marion, F.; Li, P. J.; Lin, W. T.; Janssen, H.; Li, C.; Jin, B. N.; Innocente, V.; Ilyas, M. M.; Koulbardis, A.; Fiandrini, E.; Lin, Z. Y.; Mamouni, H.; Ille, B.; Marchesini, P.; Chemarin, M.; Duinker, P.; Chang, Y. H.; Chen, A.; Biasini, M.; Duchesneau, D.; Chaturvedi, U. K.; Biland, A.; Plyaskin, V.; Azemoon, T.; Bagnaia, P.; R??hner, M.; Sticozzi, F.; Bertucci, B.; Bizzarri, R.; Baba, P. V. K. S.; Pojidaev, V.; Zaccardelli, C.; An, Q.; Zhou, B.; Lindemann, B.; Forconi, G.; Coan, T. E.; Bencze, Gy. L.; Qian, J. M.; Syed, A. A.; Kramer, T.; Yzerman, M.; Taylor, L.; Tang, X. W.; Contin, A.; Cui, X. T.; Tsipolitis, G.; Asmundis, R.; Atamanchuk, A.; Berges, P.; Blaising, J. J.; Goldfarb, S.; Dionisi, C.; Cesaroni, F.; Li, H. T.; Liao, J. Y.; Newman, H.; Ball, Robert C.; Baksay, L.; Chen, G. M.; Banerjee, S.; Bock, R.; B??hm, A.; Boseti, M.; Freudenreich, K.; Eppling, F. J.; Guanziroli, M.; Herten, G.; He, J. T.; Kamyshkov, Yu.; Krivshich, A.; Khan, R. A.; Wang, Y. F.; Kapustinsky, J. S.; Kapinos, P.; Kirsch, S.; Organtini, G.; Rattaggi, M.; Paoletti, S.; Paolucci, P.; Shen, D. Z.; Shevchenko, S.; Stone, H.; Steuer, M.; Weber, J.; Tonutti, M.; Ting, S. M.; T??th, J.; Zhou, G. J.; Maolinbay, M.; Fabre, M.; Alviggi, M. G.; Aloisio, A.; Alcaraz, J.; Ambrosi, G.; Busenitz, J.; Anderson, A. L.; Bay, A.; Barill??re, R.; Battiston, R.; Brambilla, E.; Becker, U.; Becattini, F.; Bouwens, B.; Burger, W. J.; Brock, I. C.; Burger, J. D.; Chien, C. Y.; Chen, H. S.; Cai, X. 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Brookes, Matthew; Johnson, Paul; Wadie, A. H. C.; Coop, Raymond; Goff, J. M.; Morjaria, N. M.; Leigh, Howard; Lawman, C. J.; Clark, Alan; Peacock, Graham; Cox, P. R.; Hinder, Leslie; Huggins, Jacquel

Accountancy. Sep95, Vol. 116 Issue 1225, p6-8. 3p.

Frank, J. H.; Lynn, H. C.; Goff, J. M.

The Florida Entomologist, 1985 Sep 01. 68(3), 493-496.