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Jimenez, V.; Rodriguez, M.; Dominguez, M.; Sans, J.; Diaz, I.; Valente, L.; Guglielmi, V.L.; Quiroga, J.V.; Genovese, R.I.; Sonmez, N.; Palomar, O.; Moreto, M.
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 40(3):36-44 Jun, 2023
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[AR] Genovese, R.I.
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